Patents Assigned to Tianjin Sunrise Technologies Development Co., Ltd.
  • Patent number: 11371934
    Abstract: The present disclosure provides a method for correcting a light intensity measurement value is provided. The method includes: emitting detection light into a measured object; measuring a light intensity measurement value at a measurement position, and measuring light intensity of photons at a benchmark position as a light intensity reference value. A sensitivity of the light intensity of photons to a concentration change of a specific substance in the measured object is less than or equal to a preset threshold, and a change rate of the light intensity at the measurement position with a concentration of the specific substance in the measured object is greater than a change rate of the light intensity at the benchmark position with the concentration of the specific substance; correcting the light intensity measurement value by using the light intensity reference value. The present disclosure further provides a concentration measurement device.
    Type: Grant
    Filed: June 28, 2019
    Date of Patent: June 28, 2022
    Assignees: TIANJIN UNIVERSITY, TIANJIN SUNRISE TECHNOLOGIES DEVELOPMENT CO., LTD.
    Inventors: Guang Han, Jun He, Kexin Xu
  • Patent number: 10054594
    Abstract: A method of processing spectral data is disclosed and may include the steps of illuminating a medium to detect an inside particular component with light; obtaining a first spectral data for the medium at a first radial position and a second spectral data for the medium at a second radial position, wherein the first radial position and the second radial position are selected arbitrarily; and performing differential processing on the first spectral data and the second spectral data.
    Type: Grant
    Filed: September 23, 2015
    Date of Patent: August 21, 2018
    Assignee: Tianjin Sunrise Technologies Development Co., Ltd.
    Inventors: Kexin Xu, Jin Liu, Wanjie Zhang
  • Patent number: 9551656
    Abstract: A method of processing diffuse spectrum data may include: obtaining diffuse spectrum data of a medium to be detected at one or more first radial positions; and determining optical information caused by substantially only a variation in scattering characteristic of the medium to be detected and/or optical information caused by substantially only a variation in absorption characteristic of the medium to be detected at one or more second radial positions from the obtained diffuse spectrum data.
    Type: Grant
    Filed: May 6, 2015
    Date of Patent: January 24, 2017
    Assignee: TIANJIN SUNRISE TECHNOLOGIES DEVELOPMENT CO., LTD.
    Inventors: Kexin Xu, Jin Liu
  • Patent number: 8996338
    Abstract: A method of detecting a concentration of a target component by using a reference wavelength includes: defining a wavelength at which a light intensity is insensitive to the variation of the target component concentration as a reference wavelength for the target component; detecting spectra at both the reference wavelength and a further measuring wavelength; processing the spectrum detected at the further measuring wavelength, with the spectrum detected at the reference wavelength as an inner reference, to obtain a characteristic spectrum including specific information of the target component; building a calibration model between the characteristic spectrum and the concentration of the target component; and determining the concentration of the target component based on the calibration model.
    Type: Grant
    Filed: June 3, 2009
    Date of Patent: March 31, 2015
    Assignee: Tianjin Sunrise Technologies Development Co., Ltd.
    Inventors: Kexin Xu, Wenliang Chen