Patents Assigned to Tiptek, LLC
  • Scanning probe and electron microscope probes and their manufacture
    Patent number: 11237188
    Abstract: Methods are described for the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. In this method, multiple wires are mounted on a stage and ion milled simultaneously while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are also described. The method provides sets of highly uniform probe tips having controllable properties for stable and accurate scanning probe and electron microscope (EM) measurements.
    Type: Grant
    Filed: July 20, 2018
    Date of Patent: February 1, 2022
    Assignee: Tiptek, LLC
    Inventors: Joseph W. Lyding, Gregory S. Girolami, Scott P. Lockledge, Jinju Lee
  • Scanning probe and electron microscope probes and their manufacture
    Patent number: 11169177
    Abstract: Methods are described for the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. In this method, multiple wires are mounted on a stage and ion milled simultaneously while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are also described. The method provides sets of highly uniform probe tips having controllable properties for stable and accurate scanning probe and electron microscope (EM) measurements.
    Type: Grant
    Filed: August 9, 2017
    Date of Patent: November 9, 2021
    Assignee: Tiptek, LLC
    Inventors: Joseph W. Lyding, Gregory S. Girolami, Scott P. Lockledge, Jinju Lee
  • Scanning probe and electron microscope probes and their manufacture
    Patent number: 10060948
    Abstract: Methods are described for the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. In this method, multiple wires are mounted on a stage and ion milled simultaneously while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are also described. The method provides sets of highly uniform probe tips having controllable properties for stable and accurate scanning probe and electron microscope (EM) measurements.
    Type: Grant
    Filed: August 12, 2016
    Date of Patent: August 28, 2018
    Assignee: Tiptek, LLC
    Inventors: Joseph W. Lyding, Gregory S. Girolami, Scott P. Lockledge, Jinju Lee