Patents Assigned to Tokyo Cathode Laboratory Co., Ltd.
  • Patent number: 7298155
    Abstract: A probing apparatus includes a mechanism apparatus. The mechanism apparatus includes a base body, a vibration absorber, a shifting mechanism, and a stage connected via the base body to a ground terminal. A probe, positioned over the stage, is connected to a measurement terminal of a measuring apparatus via a signal cable. The signal cable has a connecting terminal connected to the measurement terminal of the measuring apparatus. A shielding cover, positioned over a measured device on a glass substrate held on the stage, has an area not smaller than an area of the measured device and not greater than four times the area of the measured device. The shielding cover is grounded.
    Type: Grant
    Filed: January 11, 2006
    Date of Patent: November 20, 2007
    Assignees: Tokyo Cathode Laboratory, Co., Ltd., Agilent Technologies, Inc.
    Inventors: Seiki Fuchiyama, Noriyasu Kiyota, Akito Kishida
  • Patent number: 6573738
    Abstract: A probe (20) for a probe card that has a multi-layered structure, in which a probe shaft (22) is enclosed by a covering layer (24). The probe shaft (22) is made of conductive metal, and provided with a contact portion (22a) at a tip end for pressing onto a test body to measure electric connection of the test body. The contact portion (22a) is formed having a constant diameter, and retains the constant diameter even after being machined for reuse. The covering layer (24) is made of a material having a high Young's modulus to help counter stresses repeatedly applied to the probe shaft (22), and formed covering the entire external circumferential surface of the probe shaft (22) except for the contact portion (22a). The tip end of the covering layer (24) is tapered in order to deal with a test body with narrower pitches.
    Type: Grant
    Filed: March 24, 2000
    Date of Patent: June 3, 2003
    Assignee: Tokyo Cathode Laboratory Co., Ltd.
    Inventors: Toshihiro Matsuo, Shigezo Kudo
  • Patent number: 5138173
    Abstract: A detecting electrode disposed at a position opposed to an article to be conveyed and an auxiliary electrode shielded from an external electric field are connected to a field effect transistor through switch means. When the article to be conveyed passes the front of the detecting electrode, charge is induced at the detecting electrode, the gate electric field of the field effect transistor is varied according to the quantity of charge to produce an output responsive to the quantity of charge. When the switch means is switched to the auxiliary electrode, a zero potential is detected. Therefore, the charged potential of the article to be conveyed can be accurately measured.
    Type: Grant
    Filed: December 17, 1990
    Date of Patent: August 11, 1992
    Assignee: Tokyo Cathode Laboratory Co., Ltd.
    Inventor: Yasaka Mitsuo