Abstract: A method for analyzing objects depending on their electromagnetic properties. The method including the steps of conveying the objects to be analyzed on a conveyer belt; scanning the electromagnetic properties of the objects and the conveyer belt by an electromagnetic sensor, wherein the electromagnetic properties of the conveyer belt are dependent on metallic contaminants which are stuck in the conveyer belt; generating belt properties data representing the electromagnetic properties of the conveyer belt, and analyzing the objects according to the scanned electromagnetic properties and the belt properties data. This has the benefits that the electromagnetic properties of the conveyer belt are considered when distinguishing between metallic and non-metallic objects which have to be sorted. This way, the objects which got stuck in the conveyer belt over time, may influence a sorting less, which may improve sorting results. Further, an apparatus for executing such a method.

Abstract: A method for analyzing objects depending on their electromagnetic properties. The method including the steps of conveying the objects to be analyzed on a conveyer belt; scanning the electromagnetic properties of the objects and the conveyer belt by an electromagnetic sensor, wherein the electromagnetic properties of the conveyer belt are dependent on metallic contaminants which are stuck in the conveyer belt; generating belt properties data representing the electromagnetic properties of the conveyer belt, and analyzing the objects according to the scanned electromagnetic properties and the belt properties data. This has the benefits that the electromagnetic properties of the conveyer belt are considered when distinguishing between metallic and non-metallic objects which have to be sorted. This way, the objects which got stuck in the conveyer belt over time, may influence a sorting less, which may improve sorting results. Further, an apparatus for executing such a method.

Abstract: The present invention relates to an apparatus (10) for inspecting matter (12), the apparatus comprising: an emitting device (14) adapted to emit radiation; a stop element (20) adapted to block some (16a) of the radiation emitted by the emitting device; a scanning device (26) adapted to project a dark area (24) caused by the stop element on the matter, and to redirect radiation (16b) having passed the stop element towards the matter, wherein at least some of the redirected radiation is scattered within the matter and passes out of the matter as scattered radiation (42); and a detection device (34) adapted to receive or detect the scattered radiation via the scanning device, wherein the detection device's field of view (36) coincides with the projected dark area (24). The present invention also relates to a corresponding method.