Abstract: Described is a touch-sensitive apparatus for sensing the presence of an object relative to a touch-sensitive surface using capacitance measurements.

Abstract: Described is a method for connectivity testing of integrated circuits. The method includes connecting an integrated circuit comprising an internal measurement component and a plurality of connection elements to an automated testing apparatus via a first common test channel connected to a first set of non-neighbouring connection elements of the plurality of connection elements and a second common test channel connected to a second set of non-neighbouring connection elements of the plurality of connection elements, different to the first set of non-neighbouring connection elements. The connection elements of the first set of non-neighbouring connection elements neighbour connection elements of the second set of non-neighbouring connection elements.

Abstract: A resource allocation controller for a touch-sensitive apparatus, comprising: a timing module for obtaining timing information; a timeslot counter configured to output an indication of a current timeslot of a plurality of timeslots based on the obtained timing information; an allocation module configured to allocate a first resource to one of a first function and a second function during a first timeslot of the plurality of timeslots and to allocate the first resource to the other of the first function and the second function during a second timeslot of the plurality of timeslots; and wherein the resource allocation controller is configured to indicate to a function execution module to which of the first function and the second function the first resource is allocated to during the first timeslot, and to indicate to the function execution module a function to which the first resource is allocated.