Abstract: An analysis system includes inference processer circuitry configured to infer a corresponding classification by inputting part of frequency spectrum data corresponding to reference measurement data to a learned model having learned a relation between part of frequency spectrum data corresponding to sample measurement data and a classification related to noise corresponding to the part, causal component identification processer circuitry configured to identify causal component data of noise from a component data list based on the inferred classification, and a presentation information generator configured to generate presentation information for a user based on the causal component data.

Abstract: An analysis system includes inference processer circuitry configured to infer a corresponding classification by inputting part of frequency spectrum data corresponding to reference measurement data to a learned model having learned a relation between part of frequency spectrum data corresponding to sample measurement data and a classification related to noise corresponding to the part, causal component identification processer circuitry configured to identify causal component data of noise from a component data list based on the inferred classification, and a presentation information generator configured to generate presentation information for a user based on the causal component data.

Abstract: A related interference wave presentation device includes a class specifying processer circuitry configured to specify a class to which a reference interference wave, which is a referenced interference wave, belongs, using a learned model generated by machine learning of sample data including interference waves to specify a class to which an interference wave belongs based on feature values of the interference wave, a related interference wave information generator configured to retrieve the sample data based on the class to which the reference interference wave belongs and generate related interference wave information which is information about a related interference wave; and a presentation controller configured to perform control to present the related interference wave information in part or in whole.

Abstract: A packet capture device incudes: a capture unit which captures packets that flow in a communication network at 200 Gbps; a control unit which temporarily holds the packets captured; and an interface which stores the packets temporarily held into a secondary storage device. The control unit includes: a first NUMA node including a first processor and a first memory; and a second NUMA node including a second processor and a second memory. The capture unit includes: a first capture unit which captures packets and stores the packets into a first memory; and a second capture unit which captures packets and stores the packets into a second memory.

Abstract: Provided is a spectrum analysis method including: accumulating n spectrums obtained by consecutively fast Fourier transforming an input signal n times; receiving a threshold; identifying, in the n spectrums accumulated in the accumulating, frequently occurring data that includes data whose number of occurrences exceeds the threshold received in the receiving, the number of occurrences being defined as a total number of items of data at a same frequency point that indicate levels that are close to each other, to within a predetermined range; selecting a maximum level at each of the frequency points from among only the identified frequently occurring data; and outputting a spectrum indicating the maximum levels selected at the frequency points.

Abstract: A radiated emission measurement method includes a prescan measurement step of performing broadband measurement including detection of a peak and detection of a quasi-peak by one fast Fourier transform in a target measurement frequency range; a calculation step of calculating a difference in level between the peak and the quasi-peak obtained for a measurement frequency to be a candidate for a result of measurement; a determination step of determining whether the obtained difference is less than a reference value; and an output step of outputting a result obtained as an interference level of the radiated emission in the broadband measurement when it is determined that the difference is less than reference value, and performing narrowband measurement and outputting the obtained result as the interference level of the radiated emission, when it is determined that the difference is equal to or higher than the reference value.

Abstract: A measuring container for measurement of impurity ions in a liquid includes: a first electrode; a first insulation film formed on the first electrode; a second insulation film formed apart from the first insulation film to create a space into which the liquid is to be sealed; a second electrode on which the second insulation film is formed, the second electrode being arranged to face the first electrode; and a seal material having an inlet through which the liquid is injected into the space, the seal material being configured to seal the space.

Abstract: A data writing device includes secondary storages, an interface circuit which obtains data, and a computer apparatus which writes the data obtained in one of the secondary storages. The computer apparatus includes writing processes corresponding to the secondary storages as an application, respectively; a monitoring process which detects quantities of data whose writing is finished in the secondary storages; and a data distribution process which selects a secondary storage as a target for next writing based on requested data quantities of the secondary storages and the finished data quantities thereof, and instructs a writing process corresponding to the secondary storage as a target for next writing to write.

Abstract: There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.

Abstract: There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.

Abstract: There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.

Abstract: There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.

Abstract: There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.

Abstract: There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.

Abstract: A variable value monitoring system and method acquires and displays data information words having addresses within a certain range. In one mode of operation, data information words having addresses within a predetermined range are selected and stored in a shadow RAM and only changes in that data are presented to a viewer. The viewer can select the display format for a panel of data contained within the predetermined range of addresses. A FIFO memory temporarily stores the variable values of selected data information words. A flag memory stores flag bits at internal addresses corresponding to each address in a predetermined block of external addresses. Status bit are provided for each data word addressed by the predetermined block of addresses and means are provided for logically comparing the flag bits with corresponding status bits and for storing a data information word in the FIFO if the logical comparison is true.