Abstract: Methods and systems are provided for storing and analyzing product history data to determine root causes of performance anomalies and/or field failures. In accordance with some embodiments of the present invention, the life history of an integrated product and its constituent components may be consolidated into a master profile. The master profile may include one or more product profiles and behavior profiles that may be generated from data collected over the product's life history. In response to receiving an indication that an integrated product is defective, the master profile may be analyzed to isolate the component of the integrated product that caused the product to be defective.