Abstract: An instrument for measuring aberration refraction of an eye is provided, having: a lens system defining an instrument optical axis and an alignment device for aligning the visual axis of the eye with the instrument optical axis. A light source (1) produces a probing beam that is projected through the lens system parallel to the instrument optical axis and is selectably positionable partially off-set from the instrument optical axis for entering the eye (15) parallel to the instrument optical axis at a plurality of locations on the cornea of the eye. A photodetector (19) measures the position of probing beam light scattered back from the retina of the eye to measure aberration refraction of the eye at a plurality of locations.
Type:
Grant
Filed:
May 1, 2002
Date of Patent:
August 23, 2005
Assignee:
Tracey Technologies, L.L.C.
Inventors:
Vasyl V. Molebny, Ioannis Pallikaris, Igor Chyzh, Vyacheslav Sokurenko, Leonidas Naoumidis, Youssef Wakil