Patents Assigned to Transat Corporation
  • System for fast piezoelectric-resonator parameter measurements
    Patent number: 6208153
    Abstract: Method and apparatus are described for speeding parameter measurements of piezoelectric-resonators. A large driving voltage is applied to the resonator until the resonator current reaches its desired steady-state value. Then the driving voltage is reduced to a level which will maintain that desired current level. This procedure allows the resonator to reach its steady state conditions faster than if a constant drive voltage were used.
    Type: Grant
    Filed: August 11, 1999
    Date of Patent: March 27, 2001
    Assignee: Transat Corporation
    Inventor: David Flugan
  • Crystal etch monitor
    Patent number: 5942100
    Abstract: The present application describes apparatus and method for monitoring and controlling the etching of quartz crystals to a desired target frequency by means of monitoring the frequency of a monitor blank that is immersed in the etchant simultaneously with the etch load. Since during etching the thickness removal is the same for monitor and etch load, one can predetermine a monitor target frequency in terms of the load target frequency. The process is terminated upon reaching the monitor target.
    Type: Grant
    Filed: August 25, 1997
    Date of Patent: August 24, 1999
    Assignee: Transat Corporation
    Inventor: Franz L. Sauerland