Patents Assigned to TransTech Systems, Inc.
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Patent number: 10739287Abstract: Systems and methods for measuring and monitoring physical properties of a material under test (MUT) from a vehicle, e.g., using complex electromagnetic impedance. Various embodiments include a method including: obtaining displacement data about a position of a sensor array relative to a material under test (MUT); comparing the displacement data with reference displacement data to determine whether the sensor array is at a reference distance relative to the MUT; in response to determining that the sensor array is located at the reference distance, instructing the sensor array to transmit a set of electromagnetic impedance signals into the MUT; obtaining a return electromagnetic impedance signal from the MUT; and calculating at least one physical property of the MUT based upon the transmitted set of electromagnetic impedance signals, the return electromagnetic impedance signals, and the displacement data.Type: GrantFiled: January 14, 2016Date of Patent: August 11, 2020Assignee: TransTech Systems, Inc.Inventors: Donald D. Colosimo, Sarah E. Pluta, John W. Hewitt
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Patent number: 10161893Abstract: Methods of extracting complex impedance from selected subsurface volumes of a material under test (MUT) using various embodiments of electrode sensor pairs are provided. The electrode pairs can penetrate into a subsurface of the MUT, and operate below the surface of the MUT. Configurations of electrode pair sensors provide measured data of complex impedance of selected subsurface volumes of the MUT using electromagnetic spectrographic signals over a frequency range. The complex impedance characteristics of the subsurface volumes may be used to identify variations in the properties of the MUT, or be correlated to physical properties of the MUT.Type: GrantFiled: August 13, 2015Date of Patent: December 25, 2018Assignee: TransTech Systems, Inc.Inventors: Donald D. Colosimo, Sarah E. Pluta, John W. Hewitt
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Patent number: 9863900Abstract: Various embodiments include planar sensor arrays for use in determining characteristics of a material under test (MUT). The planar sensor arrays can include a set of electrodes positioned to enhance a depth and clarity of detection into the material under test. Some embodiments include an electromagnetic sensor array having: a first set of two rectilinear electrodes, positioned opposed to one another across a space; and a second set of two rectilinear electrodes, positioned opposed to one another across the space, the second set being off-set from the first set, wherein the first set and the second set are configured to detect an electromagnetic impedance of the MUT.Type: GrantFiled: January 26, 2015Date of Patent: January 9, 2018Assignee: TransTech Systems, Inc.Inventors: Sarah E. Pluta, Donald D. Colosimo, John W. Hewitt
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Patent number: 9805146Abstract: Apparatuses, systems, methods, and computer program products are presented for electronically emulating the impedance characteristics of materials, e.g., for standardizing and calibrating electromagnetic measuring devices for the measurement of physical properties of materials. The electronic impedance emulation apparatus according to some embodiments includes an electronic material emulation circuit in communication with the electromagnetic measuring device. The electronic material emulation circuit and the electromagnetic measuring device are controlled by a at least one computing device, which can control the frequency of signal(s) generated by the electromagnetic measuring device. The at least one computing device can instruct the electronic emulator to produce signals having complex impedance characteristics of the material under test at the test frequency. The emulation data can be stored and used for the calibration and/or standardization of the electromagnetic measuring device.Type: GrantFiled: March 12, 2014Date of Patent: October 31, 2017Assignee: TransTech Systems, Inc.Inventor: Frank H. Lipowitz
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Patent number: 9804112Abstract: A method of extracting complex impedance from selected volumes of the material under test (MUT) combined with various embodiments of electrode sensor arrays. Configurations of linear and planar electrode arrays provide measured data of complex impedance of selected volumes, or voxels, of the MUT, which then can be used to extract the impedance of selected sub-volumes or sub-voxels of the MUT through application of circuit theory. The complex impedance characteristics of the sub-voxels may be used to identify variations in the properties of the various sub-voxels of the MUT, or be correlated to physical properties of the MUT using electromagnetic impedance tomography and/or spectroscopy.Type: GrantFiled: November 19, 2014Date of Patent: October 31, 2017Assignee: TransTech Systems, Inc.Inventors: Sarah E. Pluta, Donald D. Colosimo, John W. Hewitt
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Patent number: 9465061Abstract: Various embodiments include solutions for in-process material characterization. Various particular embodiments include a computer-implemented method including: providing instructions for transmitting oscillating electromagnetic field signals to a material under test (MUT); obtaining a return signal associated with the transmitted oscillating electromagnetic field signals; comparing the return signal with the oscillating electromagnetic field signals to determine a difference in an aspect of the return signal and the aspect of the oscillating electromagnetic field signals; comparing the difference in the aspect to a predetermined threshold; and determining a characteristic of the MUT based upon the compared difference.Type: GrantFiled: May 14, 2013Date of Patent: October 11, 2016Assignee: TransTech Systems, Inc.Inventors: Donald D. Colosimo, Sarah E. Pluta
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Publication number: 20160161624Abstract: Methods include: providing instructions to a signal generator to transmit a first set of tomographic signals to a surface and a subsurface beneath the surface; obtaining a first return signal about the surface and the subsurface beneath the surface, the first return signal associated with the first set of tomographic signals; comparing the first return signal with the first set of tomographic signals to determine whether an object is present within the subsurface; providing instructions to the signal generator to transmit a set of spectrographic signals to the surface and subsurface in response to determining the object is present within the subsurface; obtaining a second return signal about the surface and subsurface beneath the surface, the second return signal associated with the set of spectrographic signals; and comparing the second return signal with the set of spectrographic signals to determine a characteristic of the object within the subsurface.Type: ApplicationFiled: September 16, 2013Publication date: June 9, 2016Applicant: TransTech Systems, Inc.Inventors: Sarah E. Pluta, Donald D. Colosimo, John W. Hewitt
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Publication number: 20140266268Abstract: Various embodiments of the invention relate generally to the measurement of the impedance of materials, electronic devices, or components over a range of frequencies, with a system for self-adjusting an input transmit signal and/or a reference signal to produce a measured signal within a desired range of the electronic measuring components over the frequency range based upon the value of the measured signal.Type: ApplicationFiled: March 12, 2014Publication date: September 18, 2014Applicant: TransTech Systems, Inc.Inventor: Frank H. Lipowitz
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Publication number: 20140278300Abstract: Apparatuses, systems, methods, and computer program products are presented for electronically emulating the impedance characteristics of materials, e.g., for standardizing and calibrating electromagnetic measuring devices for the measurement of physical properties of materials. The electronic impedance emulation apparatus according to some embodiments includes an electronic material emulation circuit in communication with the electromagnetic measuring device. The electronic material emulation circuit and the electromagnetic measuring device are controlled by a at least one computing device, which can control the frequency of signal(s) generated by the electromagnetic measuring device. The at least one computing device can instruct the electronic emulator to produce signals having complex impedance characteristics of the material under test at the test frequency. The emulation data can be stored and used for the calibration and/or standardization of the electromagnetic measuring device.Type: ApplicationFiled: March 12, 2014Publication date: September 18, 2014Applicant: TransTech Systems, Inc.Inventor: Frank H. Lipowitz
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Publication number: 20130307564Abstract: Various embodiments include solutions for in-process material characterization. Various particular embodiments include a computer-implemented method including: providing instructions for transmitting oscillating electromagnetic field signals to a material under test (MUT); obtaining a return signal associated with the transmitted oscillating electromagnetic field signals; comparing the return signal with the oscillating electromagnetic field signals to determine a difference in an aspect of the return signal and the aspect of the oscillating electromagnetic field signals; comparing the difference in the aspect to a predetermined threshold; and determining a characteristic of the MUT based upon the compared difference.Type: ApplicationFiled: May 14, 2013Publication date: November 21, 2013Applicant: TransTech Systems, Inc.Inventors: Donald D. Colosimo, Sarah E. Pluta
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Patent number: 7219024Abstract: A system, method and program product for determining the in-place engineering properties such as density and moisture content of many varieties of engineering materials, are disclosed. The invention also includes a database, material model and sensor model for use with the above-described aspects. In one embodiment, the invention determines a compaction indication of the material based on an effect of impedance characteristics of the material on an electrical field, and corrects the compaction indication for at least one of a sensor depth-sensitivity inaccuracy and a compaction process inaccuracy. The compaction indication is determined based on a material model, and the corrections are based on mathematical and empirical models of the compaction process and the sensor.Type: GrantFiled: May 12, 2005Date of Patent: May 15, 2007Assignee: TransTech Systems, Inc.Inventors: Ronald W. Gamache, Richard Hosterman, Sarah Pluta
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Patent number: 6988850Abstract: A pavement ramp edge maker, paving machine and related method are provided for generating a pavement edge ramp that is equal to or less than approximately 45° relative to a surface upon which the ramp is formed. The edge maker generates a ramp that is partially compacted using a compaction member that is independently vertically movable against a bias during operation. When the pavement mat is compacted, the resulting ramp has an angle that is equal to or less than approximately 45° relative to a surface upon which the ramp is formed.Type: GrantFiled: November 24, 2003Date of Patent: January 24, 2006Assignee: TransTech Systems, Inc.Inventors: Robert A. Sovik, Gary D. Antonelli, Richard N. Hosterman
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Patent number: 6923594Abstract: A pavement ramp edge maker, paving machine and related method are provided for generating a pavement edge ramp that is equal to or less than approximately 45° relative to a surface upon which the ramp is formed. The edge maker generates a ramp that is partially compacted using a compaction surface that extends upwardly from a bottom edge of an end gate of a paving machine. When the pavement mat is compacted, the resulting ramp has an angle that is equal to or less than approximately 45° relative to a surface upon which the ramp is formed.Type: GrantFiled: April 29, 2003Date of Patent: August 2, 2005Assignee: TransTech Systems, Inc.Inventors: Robert A. Sovik, Richard N. Hosterman
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Patent number: 6884000Abstract: A member, screed and method for realigning material and compacting. A material realigning member is provided including structure for moving at least a first portion of a depth of a quantity of material laterally from an initial position thereof and then at least a second portion of the depth of the quantity of material back towards the initial position. In this fashion, aggregate particles may be moved in three horizontal directions, e.g., a direction of travel by a roller waveform, and both lateral directions by the invention, to realign material and allow for improved compaction.Type: GrantFiled: August 15, 2003Date of Patent: April 26, 2005Assignee: TransTech Systems, Inc.Inventor: Robert A. Sovik
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Patent number: 6803771Abstract: A paving material analyzer system is disclosed that uses paving material impedance to determine paving material density. The invention also includes methods for analyzing paving material, in particular, determining paving material density. The paving material density can also be used to determine a percentage of maximum compaction. A paving material analyzer system is also disclosed that determines paving material density regardless of moisture presence on the paving material or a standoff distance of a sensor to the paving material. Sensor circuits providing for improved accuracy are also provided.Type: GrantFiled: June 28, 2002Date of Patent: October 12, 2004Assignee: TransTech Systems, Inc.Inventors: Robert A. Sovik, Richard N. Hosterman, George G. Moross
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Publication number: 20040032269Abstract: A sensor for a paving material analyzer is disclosed including means for allowing moving, non-dragging contact of an operative component with the paving material. A paving material analyzer system incorporating the sensor is also disclosed. The invention also includes a method for analyzing paving material.Type: ApplicationFiled: August 14, 2002Publication date: February 19, 2004Applicant: TransTech Systems, Inc.Inventors: Robert A. Sovik, Richard N. Hosterman, George G. Moross
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Publication number: 20020175691Abstract: A paving material analyzer system is disclosed that uses paving material impedance to determine paving material density. The invention also includes methods for analyzing paving material, in particular, determining paving material density. The paving material density can also be used to determine a percentage of maximum compaction. A paving material analyzer system is also disclosed that determines paving material density regardless of moisture presence on the paving material or a standoff distance of a sensor to the paving material. Sensor circuits providing for improved accuracy are also provided.Type: ApplicationFiled: June 28, 2002Publication date: November 28, 2002Applicant: TransTech Systems, Inc.Inventors: Robert A. Sovik, Richard N. Hosterman, George G. Moross
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Patent number: 6414497Abstract: A paving material analyzer system is disclosed that uses paving material impedance to determine paving material density. The invention also includes a method for analyzing paving material, in particular, determining paving material density. The paving material density can also be used to determine a percentage of maximum compaction. A paving material analyzer is also disclosed that determines paving material density regardless of moisture presence on the paving material.Type: GrantFiled: May 4, 2000Date of Patent: July 2, 2002Assignee: TransTech Systems, Inc.Inventors: Robert A. Sovik, Richard N. Hosterman, George G. Moross
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Patent number: 6283672Abstract: A paving machine and edger providing precompaction, horizontal shear compaction and primary compaction of a paving material. The edger includes a plurality of adjustment apparatus for vertical and angular adjustment. A plurality of height indicators are provided for measuring the vertical position of the compaction surfaces of the edger. A wedge extender is removably attached to the edger. The edger is capable of creating a stepped tapered ramp having a highly compacted step and a highly compacted upper portion of the tapered portion.Type: GrantFiled: October 1, 1999Date of Patent: September 4, 2001Assignee: Transtech Systems, Inc.Inventor: Robert A. Sovik
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Patent number: 6270284Abstract: A pavement joint and joint making process are provided. A pavement edger used to make the joint is capable of creating a stepped tapered ramp having a highly compacted step and a highly compacted upper portion of the tapered portion. The resulting ramp allows for safety during pavement laying work stoppage and creation of solid pavement joints.Type: GrantFiled: July 16, 1999Date of Patent: August 7, 2001Assignee: Transtech Systems, Inc.Inventor: Robert A. Sovik