Patents Assigned to TriEye Ltd.
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Patent number: 11923815Abstract: An integrator having an offset evaluation circuit and a collected charge reduction circuitry and method for using the integrator. The integrator includes an amplifier, operable to amplify an input signal, an integration capacitor for collecting charge indicative of a level of the input signal and an offset capacitor. The offset evaluation circuit is operable to charge the offset capacitor with charge corresponding to an offset voltage of the amplifier and the collected charge reduction circuitry is operable to collect charge resulting from disconnection of the offset evaluation circuit, thereby reducing an amount of charge and associated noise input to the amplifier.Type: GrantFiled: June 5, 2022Date of Patent: March 5, 2024Assignee: TriEye Ltd.Inventors: Shimon Elkind, Nadav Melamud
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Patent number: 11894480Abstract: Germanium (Ge)-Silicon (Si) structures, optoelectronic devices and method for forming same. A structure comprises a Si substrate, a Ge seed layer and a Ge epitaxial layer separated by respective interfaces that share a common plane normal, wherein the Si substrate and the Ge seed layer have a same first doping type with a first doping level, and a locally doped region formed in the Si layer adjacent to the Ge seed layer and having a second doping type with a second doping level, wherein the locally doped region is designed to reduce leakage currents between the Si substrate and the Ge epitaxial layer when an electrical bias is applied to the structure.Type: GrantFiled: May 4, 2019Date of Patent: February 6, 2024Assignee: TriEye Ltd.Inventors: Eran Katzir, Vincent Immer, Omer Kapach, Avraham Bakal, Uriel Levy
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Patent number: 11849099Abstract: Methods to solve the problem of performing fusion of images acquired with two cameras with different type sensors, for example a visible (VIS) digital camera and an short wave infrared (SWIR) camera, include performing image space equalization on images acquired with the different type sensors before performing rectification and registration of such images in a fusion process.Type: GrantFiled: September 2, 2019Date of Patent: December 19, 2023Assignee: TriEye Ltd.Inventors: Roman Shklyar, Uriel Levy, Roni Dobrinsky, Omer Kapach, Avraham Bakal
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Patent number: 11811194Abstract: Systems and methods for imaging in the short wave infrared (SWIR), photodetectors with low dark current and associated circuits for reducing dark currents and methods for generating image information based on data of a photodetector array. A SWIR imaging system may include a pulsed illumination source operative to emit radiation pulses in the SWIR band towards a target resulting in reflected radiation from the target; (b) an imaging receiver including a plurality of Ge PDs operative to detect the reflected SWIR radiation and a controller, operative to control activation of the receiver for an integration time during which the accumulated dark current noise does not exceed the time independent readout noise.Type: GrantFiled: March 16, 2021Date of Patent: November 7, 2023Assignee: TriEye Ltd.Inventors: Yoni Prosper Shalibo, Ariel Danan, Omer Kapach
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Patent number: 11810990Abstract: Electro-optical (EO) systems comprising a photodetector array (PDA) comprising a plurality of photosites (PSs), each PS operative to output detection signals for different frames, the detection signal output for a frame by the respective PS being indicative of an amount of light impinging on the respective PS during a respective frame exposure time (FET); a usability filtering module operative to first determine for each PS that the PS is unusable based on a first FET, and to later determine that the PS is usable based on a second FET that is shorter than the first FET; and a processor operative to generate images based on frame detection levels of the plurality of PSs.Type: GrantFiled: March 16, 2021Date of Patent: November 7, 2023Assignee: TriEye Ltd.Inventors: Hillel Hillel, Roni Dobrinsky, Omer Kapach, Ariel Danan, Avraham Bakal, Uriel Levy
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Patent number: 11757060Abstract: Short-wave infrared (SWIR) focal plane arrays (FPAs) comprising a Si layer through which light detectable by the FPA reaches photodiodes of the FPA, at least one germanium (Ge) layer including a plurality of distinct photosensitive areas including at least one photosensitive area in each of a plurality of photosensitive photosites, each of the distinct photosensitive areas comprising a plurality of proximate steep structures of Ge having height of at least 0.5 ?m and a height-to-width ratio of at least 2, and methods for forming same.Type: GrantFiled: August 16, 2021Date of Patent: September 12, 2023Assignee: TriEye Ltd.Inventor: Uriel Levy
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Patent number: 11705469Abstract: Light detecting structures comprising a Si base having a pyramidal shape with a wide incoming light-facing pyramid bottom and a narrower pyramid top and a Ge photodiode formed on the Si pyramid top, wherein the Ge photodiode is operable to detect light in the short wavelength infrared range, and methods for forming such structures. A light detecting structure as above may be repeated spatially and fabricated in the form of a focal plane array of Ge photodetectors on silicon.Type: GrantFiled: June 26, 2021Date of Patent: July 18, 2023Assignee: TriEye Ltd.Inventors: Avraham Bakal, Uriel Levy, Omer Kapach
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Patent number: 11665447Abstract: Systems and methods for imaging in the short wave infrared (SWIR), photodetectors with low dark current and associated circuits for reducing dark currents and methods for generating image information based on data of a photodetector array. A SWIR imaging system may include a pulsed illumination source operative to emit radiation pulses in the SWIR band towards a target resulting in reflected radiation from the target; (b) an imaging receiver including a plurality of Ge PDs operative to detect the reflected SWIR radiation and a controller, operative to control activation of the receiver for an integration time during which the accumulated dark current noise does not exceed the time independent readout noise.Type: GrantFiled: March 16, 2021Date of Patent: May 30, 2023Assignee: TriEye Ltd.Inventors: Nadav Melamud, Avraham Bakal, Omer Kapach, Uriel Levy
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Patent number: 11664471Abstract: Systems and methods for imaging in the short wave infrared (SWIR), photodetectors with low dark current and associated circuits for reducing dark currents and methods for generating image information based on data of a photodetector array. A SWIR imaging system may include a pulsed illumination source operative to emit radiation pulses in the SWIR band towards a target resulting in reflected radiation from the target; (b) an imaging receiver including a plurality of Ge PDs operative to detect the reflected SWIR radiation and a controller, operative to control activation of the receiver for an integration time during which the accumulated dark current noise does not exceed the time independent readout noise.Type: GrantFiled: March 16, 2021Date of Patent: May 30, 2023Assignee: TriEye Ltd.Inventors: Roni Dobrinsky, Hillel Hillel, Omer Kapach, Ariel Danan, Avraham Bakal, Uriel Levy
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Patent number: 11606515Abstract: Systems and methods for imaging in the short wave infrared (SWIR), photodetectors with low dark current and associated circuits for reducing dark currents and methods for generating image information based on data of a photodetector array. A SWIR imaging system may include a pulsed illumination source operative to emit radiation pulses in the SWIR band towards a target resulting in reflected radiation from the target; (b) an imaging receiver including a plurality of Ge PDs operative to detect the reflected SWIR radiation and a controller, operative to control activation of the receiver for an integration time during which the accumulated dark current noise does not exceed the time independent readout noise.Type: GrantFiled: October 24, 2020Date of Patent: March 14, 2023Assignee: TriEye LtdInventors: Ariel Danan, Omer Kapach, Uriel Levy, Avraham Bakal
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Patent number: 11438528Abstract: Focal plane arrays (FPAs) of plasmonic enhanced pyramidal silicon Schottky photodetectors (PDs) operative in the short wave infrared (SWIR) regime, and imaging systems combining such FPAs with active illumination sources and readout integrated circuit (ROIC). Such imaging systems enable imaging in the SWIR regime using inexpensive silicon detector arrays, specifically in vehicular environments in which such an imaging system may be mounted on a vehicle and image various moving and stationary targets.Type: GrantFiled: May 7, 2018Date of Patent: September 6, 2022Assignee: TriEye Ltd.Inventors: Uriel Levy, Avraham Bakal, Omer Kapach
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Patent number: 11322640Abstract: Photodetectors comprising a P type Ge region having a first region thickness and a first doping concentration and a N type GaAs region having a second region thickness and a second doping concentration smaller than the first doping concentration by at least one order of magnitude.Type: GrantFiled: March 15, 2020Date of Patent: May 3, 2022Assignee: TriEye Ltd.Inventors: Vincent Immer, Eran Katzir, Uriel Levy, Omer Kapach, Avraham Bakal
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Patent number: 11271028Abstract: Light detecting structures comprising germanium (Ge) photodiodes formed in a device layer of a germanium on-insulator (GeOI) wafer, focal planes arrays based on such Ge photodiodes (PDs) and methods for fabricating such Ge photodiodes and focal plane arrays (FPAs). An FPA includes a Ge-on-GeOI PD array bonded to a ROIC where the handle layer of the GeOI layer is removed. The GeOI insulator properties and thickness can be designed to improve light coupling into the PDs.Type: GrantFiled: February 11, 2019Date of Patent: March 8, 2022Assignee: TriEye Ltd.Inventors: Uriel Levy, Omer Kapach, Avraham Bakal, Assaf Lahav, Edward Preisler
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Patent number: 11063079Abstract: Light detecting structures comprising a Si base having a pyramidal shape with a wide incoming light-facing pyramid bottom and a narrower pyramid top and a Ge photodiode formed on the Si pyramid top, wherein the Ge photodiode is operable to detect light in the short wavelength infrared range, and methods for forming such structures. A light detecting structure as above may be repeated spatially and fabricated in the form of a focal plane array of Ge photodetectors on silicon.Type: GrantFiled: January 2, 2019Date of Patent: July 13, 2021Assignee: TriEye Ltd.Inventors: Avraham Bakal, Uriel Levy, Omer Kapach
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Patent number: 10978600Abstract: An active imaging system comprising an illumination source for emitting a radiation pulse towards a target resulting in radiation reflected from the target, a receiver comprising one or more germanium photodiodes for receiving the reflected radiation, and a method for using same.Type: GrantFiled: October 24, 2019Date of Patent: April 13, 2021Assignee: TriEye Ltd.Inventors: Ariel Danan, Omer Kapach, Uriel Levy, Avraham Bakal