Patents Assigned to Trigon
  • Integrated circuit carrier package test probe
    Patent number: 4340860
    Abstract: An IC carrier package test probe including a test probe head which is formed to penetrate into the IC chip cavity of the carrier package and which includes an elastic base having a thin layer of metal foil affixed to the outer face thereof, which foil is slited for greater elasticity and which is disposed to make simultaneous contact with each interior lead contact point within the cavity to permit rapid electrical testing of the continuity of the carrier package circuitry.
    Type: Grant
    Filed: May 19, 1980
    Date of Patent: July 20, 1982
    Assignee: Trigon
    Inventor: Lawrence R. Teeple, Jr.