Patents Assigned to Trioptics GmbH
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Publication number: 20250067659Abstract: A testing device for testing an optical sample that comprises a radiation source for emitting a plurality of optical beams along an optical axis. In addition, the testing device comprises an optical element designed as a filter element for imprinting a specific polarization-direction onto the plurality of optical beams or filtering light reflected or transmitted by the optical sample. The testing device also comprises a rotation unit designed for rotating the optical sample lying on the optical axis by a rotation angle relatively to the filter element. The testing device also comprises a detection unit for determining a polarization axis of the optical sample from the rotation angle and a reflected light beam, from the plurality of optical beams, reflected by the optical sample or transmitted through the optical sample, as well as a measure for the decentration value of the optical sample.Type: ApplicationFiled: August 21, 2024Publication date: February 27, 2025Applicant: Trioptics GmbHInventor: Aiko RUPRECHT
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Patent number: 11340136Abstract: The invention relates to an apparatus (2) for detecting imaging quality of an optical system (4) with at least one lens (6) or lens group. The apparatus (2) includes an MTF measuring apparatus (10) for measuring a modulation transfer function at a plurality of field points in the field of view of the optical system (4), and a centering measuring apparatus (18) for measuring a centered state of the optical system (4).Type: GrantFiled: February 18, 2021Date of Patent: May 24, 2022Assignee: Trioptics GmbHInventors: Eugen Dumitrescu, Patrik Langehanenberg, Iris Erichsen, Alexander Bai, Simon Zilian, Aiko Ruprecht
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Publication number: 20220099524Abstract: An MTF testing apparatus including a plurality of telescopic cameras each mounted at a fixed predetermined position on a camera holder, each camera receiving an image projected by at least one lens of a single device under test. A processor is coupled to the telescopic cameras. is the processor configured to receive image data from every telescopic camera and perform a plurality of MTF measurements, the telescopic cameras are mounted on the camera holder such that every telescopic camera captures image data resulting in an MTF measurement at a different field position of the lens. The camera holder comprises a holding structure and at least two brackets elongated elements projecting between first and second end portions, the end portions being releasably mounted on the holding structure, and at least two cameras are mounted on every bracket and the brackets are individually detachable from the holding structure.Type: ApplicationFiled: September 24, 2021Publication date: March 31, 2022Applicant: Trioptics GmbHInventor: Ralf POIKAT
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Patent number: 10942087Abstract: The invention relates to an apparatus (2) for detecting imaging quality of an optical system (4) with at least one lens (6) or lens group. The apparatus (2) includes an MTF measuring apparatus (10) for measuring a modulation transfer function at a plurality of field points in the field of view of the optical system (4), and a centering measuring apparatus (18) for measuring a centered state of the optical system (4). Furthermore, the invention relates to a method for detecting imaging quality of an optical system (4) having such a apparatus (2).Type: GrantFiled: May 28, 2018Date of Patent: March 9, 2021Assignee: Trioptics GmbHInventors: Eugen Dumitrescu, Patrik Langehanenberg, Iris Erichsen, Alexander Bai, Simon Zilian, Aiko Ruprecht
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Patent number: 10175141Abstract: The invention relates to a system for determining the position of a test object comprising the following features: an autocollimation telescope having a beam source for emitting a beam; a beam splitter; a detector unit and an objective lens; and an optical element embodied as a focusing device, wherein the test object, the beam source and the focusing device are arranged along a common optical axis (z), and a control device for controlling the focusing device, which is designed in such a way that the beam can be focused onto a center of curvature of a first test surface of the test object with the coordinates (x1, y1) and at least onto a center of curvature of a second test surface of the test object with coordinates (x2, y2).Type: GrantFiled: July 22, 2015Date of Patent: January 8, 2019Assignee: Trioptics GmbHInventor: Stefan Franz
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Patent number: 10154187Abstract: An apparatus (10) and method for adjusting and/or calibrating a multi-camera module (2) having a plurality of cameras (4a, 4b). The apparatus (10) includes an optical arrangement for creating first virtual test structures (22) at an infinite distance and second test structures (26, 32) at a finite distance. Individual images (20a, 20b) captured with the cameras (4a, 4b) of the multi-camera module (2) include respectively the first and the second test structure (22, 26, 32). Based on the deviation of the position of the test structures (22, 26, 32) in the two individual images (20a, 20b), the cameras (4a, 4b) of the multi-camera module (2) are aligned relative to each other.Type: GrantFiled: November 4, 2016Date of Patent: December 11, 2018Assignee: Trioptics GmbHInventors: Aiko Ruprecht, Benjamin Stauss, Johannes Spehling
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Patent number: 8913234Abstract: A method measures the positions of centers of curvature of optical surfaces of a multi-lens optical system. The spacings between the surfaces are measured along a reference axis using an interferometer. Subsequently the centers of curvature of the surfaces are measured using an optical angle-measuring device. In the course of the measurement of the position of the center of curvature of a surface situated within the optical system, the measured positions of the centers of curvature of the surfaces situated between this surface and the angle-measuring device and the previously measured spacings between the surfaces are taken into consideration computationally. In this way, a particularly high accuracy of measurement is achieved, because desired spacings do not have to be fallen back upon.Type: GrantFiled: November 22, 2011Date of Patent: December 16, 2014Assignee: Trioptics GmbHInventors: Josef Heinisch, Stefan Krey, Eugen Dumitrescu, Aiko Ruprecht, Patrik Langehanenberg
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Patent number: 8760666Abstract: A method for measuring spacings between optical surfaces of a multi-lens optical system includes detecting the centring state of the optical system by taking into consideration all optical surfaces of the optical system. Then the optical system is adjusted in such a way, taking the centring state into consideration, that the optical axis of the optical system is aligned as far as possible with a reference axis. In a next step the spacings between the optical surfaces are determined with the aid of a short-coherence interferometer. The measuring-light ray directed onto the optical system for this purpose runs likewise along the reference axis.Type: GrantFiled: November 22, 2011Date of Patent: June 24, 2014Assignee: Trioptics GmbHInventors: Josef Heinisch, Stefan Krey, Eugen Dumitrescu, Aiko Ruprecht, Patrik Langehanenberg
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Publication number: 20120133924Abstract: A method measures the positions of centres of curvature of optical surfaces of a multi-lens optical system. The spacings between the surfaces are measured along a reference axis using an interferometer. Subsequently the centres of curvature of the surfaces are measured using an optical angle-measuring device. In the course of the measurement of the position of the centre of curvature of a surface situated within the optical system, the measured positions of the centres of curvature of the surfaces situated between this surface and the angle-measuring device and the previously measured spacings between the surfaces are taken into consideration computationally. In this way, a particularly high accuracy of measurement is achieved, because desired spacings do not have to be fallen back upon.Type: ApplicationFiled: November 22, 2011Publication date: May 31, 2012Applicant: Trioptics GmbHInventors: Josef Heinisch, Stefan Krey, Eugen Dumitrescu, Aiko Ruprecht, Patrik Langehanenberg