Patents Assigned to Trioptics GmbH
  • Publication number: 20250067659
    Abstract: A testing device for testing an optical sample that comprises a radiation source for emitting a plurality of optical beams along an optical axis. In addition, the testing device comprises an optical element designed as a filter element for imprinting a specific polarization-direction onto the plurality of optical beams or filtering light reflected or transmitted by the optical sample. The testing device also comprises a rotation unit designed for rotating the optical sample lying on the optical axis by a rotation angle relatively to the filter element. The testing device also comprises a detection unit for determining a polarization axis of the optical sample from the rotation angle and a reflected light beam, from the plurality of optical beams, reflected by the optical sample or transmitted through the optical sample, as well as a measure for the decentration value of the optical sample.
    Type: Application
    Filed: August 21, 2024
    Publication date: February 27, 2025
    Applicant: Trioptics GmbH
    Inventor: Aiko RUPRECHT
  • Patent number: 11340136
    Abstract: The invention relates to an apparatus (2) for detecting imaging quality of an optical system (4) with at least one lens (6) or lens group. The apparatus (2) includes an MTF measuring apparatus (10) for measuring a modulation transfer function at a plurality of field points in the field of view of the optical system (4), and a centering measuring apparatus (18) for measuring a centered state of the optical system (4).
    Type: Grant
    Filed: February 18, 2021
    Date of Patent: May 24, 2022
    Assignee: Trioptics GmbH
    Inventors: Eugen Dumitrescu, Patrik Langehanenberg, Iris Erichsen, Alexander Bai, Simon Zilian, Aiko Ruprecht
  • Publication number: 20220099524
    Abstract: An MTF testing apparatus including a plurality of telescopic cameras each mounted at a fixed predetermined position on a camera holder, each camera receiving an image projected by at least one lens of a single device under test. A processor is coupled to the telescopic cameras. is the processor configured to receive image data from every telescopic camera and perform a plurality of MTF measurements, the telescopic cameras are mounted on the camera holder such that every telescopic camera captures image data resulting in an MTF measurement at a different field position of the lens. The camera holder comprises a holding structure and at least two brackets elongated elements projecting between first and second end portions, the end portions being releasably mounted on the holding structure, and at least two cameras are mounted on every bracket and the brackets are individually detachable from the holding structure.
    Type: Application
    Filed: September 24, 2021
    Publication date: March 31, 2022
    Applicant: Trioptics GmbH
    Inventor: Ralf POIKAT
  • Patent number: 10942087
    Abstract: The invention relates to an apparatus (2) for detecting imaging quality of an optical system (4) with at least one lens (6) or lens group. The apparatus (2) includes an MTF measuring apparatus (10) for measuring a modulation transfer function at a plurality of field points in the field of view of the optical system (4), and a centering measuring apparatus (18) for measuring a centered state of the optical system (4). Furthermore, the invention relates to a method for detecting imaging quality of an optical system (4) having such a apparatus (2).
    Type: Grant
    Filed: May 28, 2018
    Date of Patent: March 9, 2021
    Assignee: Trioptics GmbH
    Inventors: Eugen Dumitrescu, Patrik Langehanenberg, Iris Erichsen, Alexander Bai, Simon Zilian, Aiko Ruprecht
  • Patent number: 10175141
    Abstract: The invention relates to a system for determining the position of a test object comprising the following features: an autocollimation telescope having a beam source for emitting a beam; a beam splitter; a detector unit and an objective lens; and an optical element embodied as a focusing device, wherein the test object, the beam source and the focusing device are arranged along a common optical axis (z), and a control device for controlling the focusing device, which is designed in such a way that the beam can be focused onto a center of curvature of a first test surface of the test object with the coordinates (x1, y1) and at least onto a center of curvature of a second test surface of the test object with coordinates (x2, y2).
    Type: Grant
    Filed: July 22, 2015
    Date of Patent: January 8, 2019
    Assignee: Trioptics GmbH
    Inventor: Stefan Franz
  • Patent number: 10154187
    Abstract: An apparatus (10) and method for adjusting and/or calibrating a multi-camera module (2) having a plurality of cameras (4a, 4b). The apparatus (10) includes an optical arrangement for creating first virtual test structures (22) at an infinite distance and second test structures (26, 32) at a finite distance. Individual images (20a, 20b) captured with the cameras (4a, 4b) of the multi-camera module (2) include respectively the first and the second test structure (22, 26, 32). Based on the deviation of the position of the test structures (22, 26, 32) in the two individual images (20a, 20b), the cameras (4a, 4b) of the multi-camera module (2) are aligned relative to each other.
    Type: Grant
    Filed: November 4, 2016
    Date of Patent: December 11, 2018
    Assignee: Trioptics GmbH
    Inventors: Aiko Ruprecht, Benjamin Stauss, Johannes Spehling
  • Patent number: 8913234
    Abstract: A method measures the positions of centers of curvature of optical surfaces of a multi-lens optical system. The spacings between the surfaces are measured along a reference axis using an interferometer. Subsequently the centers of curvature of the surfaces are measured using an optical angle-measuring device. In the course of the measurement of the position of the center of curvature of a surface situated within the optical system, the measured positions of the centers of curvature of the surfaces situated between this surface and the angle-measuring device and the previously measured spacings between the surfaces are taken into consideration computationally. In this way, a particularly high accuracy of measurement is achieved, because desired spacings do not have to be fallen back upon.
    Type: Grant
    Filed: November 22, 2011
    Date of Patent: December 16, 2014
    Assignee: Trioptics GmbH
    Inventors: Josef Heinisch, Stefan Krey, Eugen Dumitrescu, Aiko Ruprecht, Patrik Langehanenberg
  • Patent number: 8760666
    Abstract: A method for measuring spacings between optical surfaces of a multi-lens optical system includes detecting the centring state of the optical system by taking into consideration all optical surfaces of the optical system. Then the optical system is adjusted in such a way, taking the centring state into consideration, that the optical axis of the optical system is aligned as far as possible with a reference axis. In a next step the spacings between the optical surfaces are determined with the aid of a short-coherence interferometer. The measuring-light ray directed onto the optical system for this purpose runs likewise along the reference axis.
    Type: Grant
    Filed: November 22, 2011
    Date of Patent: June 24, 2014
    Assignee: Trioptics GmbH
    Inventors: Josef Heinisch, Stefan Krey, Eugen Dumitrescu, Aiko Ruprecht, Patrik Langehanenberg
  • Publication number: 20120133924
    Abstract: A method measures the positions of centres of curvature of optical surfaces of a multi-lens optical system. The spacings between the surfaces are measured along a reference axis using an interferometer. Subsequently the centres of curvature of the surfaces are measured using an optical angle-measuring device. In the course of the measurement of the position of the centre of curvature of a surface situated within the optical system, the measured positions of the centres of curvature of the surfaces situated between this surface and the angle-measuring device and the previously measured spacings between the surfaces are taken into consideration computationally. In this way, a particularly high accuracy of measurement is achieved, because desired spacings do not have to be fallen back upon.
    Type: Application
    Filed: November 22, 2011
    Publication date: May 31, 2012
    Applicant: Trioptics GmbH
    Inventors: Josef Heinisch, Stefan Krey, Eugen Dumitrescu, Aiko Ruprecht, Patrik Langehanenberg