Abstract: A method for calibrating a digital imager using a sequence of P input images, to which images a calibrating image is applied to obtain a sequence of P output images is provided. The calibration is performed by updating the calibrating image by estimating, in an iteration n, n being an integer higher than or equal to 1, an image representative of the calibrating image.

Abstract: A method for processing signals collected by pixels of a detector, each pixel being able to collect a signal under the effect of radiation to which the detector is subjected comprises: identifying a pixel, termed the affected pixel, generating a signal greater than a threshold, defining at least one adjacent pixel of the affected pixel, and, for each adjacent pixel: selecting a first comparison group associated with the affected pixel and a second comparison group associated with the adjacent pixel, the first and second comparison groups not comprising any pixel in common, comparing signals collected by each comparison group so as to determine the comparison group that has accumulated the most significant amount of signal.

Abstract: A method for reading an imaging device intended for capturing images in a detector including a large number of photosensitive points called pixels organized into a matrix. The pixels of the same column are linked to a column conductor enabling the successive reading of the photosignals acquired by the pixels of the column, the method consisting for each of the pixels in carrying out a correlated double sampling read phase, the read phase comprising an operation of resetting the pixel followed by two read operations, the first without the photosignal, and the second with the photosignal. Three steps are concatenated in succession for the pixels of the same column: 1. a first of the operations of reading the pixel of a first row, 2. one of the operations of reading a second row, 3. a second of the operations of reading the pixel of the first row.

Abstract: A solid-state radiation detector comprising a photosensitive sensor comprises photosensitive elements that are organized in a matrix, and a light generator whose purpose is to optically wipe the photosensitive elements. The light generator comprises: an electroluminescent layer that is distributed over the surface of the sensor; at least one electrode that continuously covers the electroluminescent layer and in which electrons may flow, the light emitted by the electroluminescent layer being capable of passing through the electrode; and additional electrical conductors that are in electrical contact with the electrode, the additional electrical conductors forming branches that extend over the surface of the electrode, and being spatially distributed across the surface of the electrode.

Abstract: An imaging device comprising comprises a matrix of pixels, at least one data conductor connected to several pixels of the matrix, organized row-wise and successively transporting signals delivered by respectively the pixels of the row and an electronic current generator supplying several pixels, each of the pixels comprising: a transistor delivering at the node of the pixel, the signal delivered by the pixel considered and wherein can flow a bias current from the current generator, and a first electronic switch connecting the node of the pixel to the data conductor associated with this pixel as a function of a selection signal of the pixel. Each of the pixels comprises a second electronic switch, distinct from the first electronic switch, joined to the node of the pixel, the current arising from the generator to be made to flow in the transistor as a function of the selection signal for the pixel.

Abstract: An integrated circuit comprising N adjacent identical blocks indexed by index j, a current block connected to preceding and following blocks, each comprising identification circuits comprises: N ordered inputs indexed i, connected to N outputs of the preceding block of same index; and N ordered outputs indexed i, connected to N inputs of the following block of same index; each input for i?N of the current block connected by routing line indexed to output i+1 of the current block; last input N of the current block not connected to output of the current block; and first output 1 of the current block not connected to input of the current block; each block comprising: a connection pad; and N logic gates indexed i, each gate comprising first and second inputs and an output, N buses indexed i comprising a line through N blocks, and connected to output of a logic gate.

Abstract: An electromagnetic radiation detector used for imaging comprises a plurality of pixels, each of which converts the electromagnetic radiation to which it is subjected into an electrical signal. Each pixel comprises a plurality of photosensitive elements each converting the radiation received by the photosensitive element into an elementary electrical signal and selection means that select from the elementary electrical signals generated by the photosensitive elements so as to form the electrical output signal of the pixel depending on a gain range chosen for the detector.

Abstract: An image detector comprises a sensor produced on a first monolithic substrate comprising a set of pixels organized in a matrix on rows and columns and configured to generate signals as a function of a radiation striking the detector, column conductors, each linking the pixels of a same column and intended to convey the signals generated by the pixels, at least one bump contact situated at the periphery of the first substrate and outside of the matrix of pixels and linked to the column conductors. At least two column conductors are connected together on the first substrate outside of the matrix of pixels and the column conductors connected together converge toward the at least one bump contact.

Abstract: An imaging device comprises a sensor of surface area of at least 10 cm2 and comprising: an image zone produced on a single substrate and comprising a group of pixels disposed in rows and columns, the number of pixels per column not being uniform for all the columns of pixels, each pixel collecting electric charges generated by a photosensitive element, row conductors linking the pixels row by row, column conductors linking the pixels column by column, row addressing blocks linked to the row conductors to address each row of pixels individually, and column reading blocks linked to the column conductors to read the electric charges collected by the pixels of the row selected by the row addressing blocks, the column reading blocks being situated at the periphery of the image zone; the row addressing blocks and the column reading blocks being produced on the same substrate as the image zone.

Abstract: In the field of imaging devices comprising a detector generating electric charges in response to incident photon radiation, and an analog-to-digital conversion circuit forming means for reading the quantity of electric charges generated, an analog-to-digital conversion circuit comprises: a comparator which can switch depending on the comparison between a potential on an integration node and a predetermined threshold potential, a counter incrementing with each switch of the comparator, a counter-charge injection circuit injecting a quantity Qc of counter-charges on the integration node with each switch of the comparator, and control means which determine the quantity Qc of counter-charges injected. The analog-to-digital conversion circuit is characterized in that the control means determine the quantity Qc of counter-charges injected as a function of a value of the counter.

Abstract: An electronic read circuit for a radiation detector comprises: a comparator receiving a threshold potential and the potential from an integration node, said node being able to store electrical charges that are generated by a photosensitive element; a counter connected to the output of the comparator; and a counter-charge injection circuit comprising: a capacitor that stores counter-charges, a transfer transistor that can be turned on in order to transfer counter-charges from a terminal of the capacitor to the integration node whenever the comparator toggles, the transfer of the counter-charges bringing about a variation of potential at said terminal of the capacitor, and a regulation circuit for controlling the transfer transistor, said circuit comprising means for turning on the transfer transistor when the potential of the terminal of the capacitor is between two predetermined potentials that are independent of the transfer transistor.

Abstract: Enhancement of the reliability of an imaging device comprising several pixels is provided, each of the pixels comprising several first blocks of electronic components organized as a matrix and joined by links to row buses and column buses of the matrix allowing the powering and control of each of the first blocks for its nominal operation. Each of the pixels moreover comprises, associated with the first block, programmable means for disconnection of the first block from the at least one of the buses. Locating of a fault in a device is also provided, the fault occurring in one of the first blocks and leading to a generalized fault in several first blocks.

Abstract: A method is provided for controlling a light-sensitive device, for example, a digital X-ray detector including an array of light-sensitive points. The light-sensitive device includes a column conductor, line conductors, and light-sensitive points. Each light-sensitive point is connected between the column conductor and one of the line conductors, and includes a light-sensitive element converting a photon flux into electrical charges, and a transistor transferring the electrical charges to the column conductor based on control of a signal received by the corresponding line conductor. The method depends on the presence of a capacitor for cross-coupling between the drain and source of each transistor in the off state. The capacitor provides a potential variation to the column conductor upon receiving photons. The method comprises comparing the potential variation with a threshold, and reading the light-sensitive points in the event that the result of the comparison is positive.

Abstract: A processing circuit for an X-ray sensor for collecting at least a first pixel information of a first pixel and a second pixel information of a second pixel is provided. The processing circuit comprises an amplifier (112), a feedback loop (113) and a first collecting device (111). It is provided a compensation for a non-linearity in the pixels or in the pixel circuits (100, 200) by applying an inverse non-linearity (125) in the periphery of the X-ray sensor. A processing circuit (110) may provide a copy of a pixel voltage and/or of a pixel charge. In the case of pixel charge a non-linear characteristic of a pixel capacitance may be compensated.

Abstract: A device is provided for addressing the rows of an active detection matrix for imaging by ionizing radiations comprising a plurality N of rows n of pixels, the addressing device being produced on a substrate on which the matrix is also producing and mainly comprising thin film transistors of single N or P type. The row addressing device can comprise a plurality of stages suitable for delivering at their respective outputs switching signals for switching the high and low levels of a signal applied to switching devices at the output on a corresponding row of the matrix and being characterized in that each stage comprises an input stage and an output stage, the input stage delivering an activation signal for the output stage, the output stage delivering, in case of activation, said switching signal for the corresponding row n.

Abstract: An electronic read circuit for a radiation detector comprises: a comparator receiving a threshold potential and the potential from an integration node, said node being able to store electrical charges that are generated by a photosensitive element; a counter connected to the output of the comparator; and a counter-charge injection circuit comprising: a capacitor that stores counter-charges, a transfer transistor that can be turned on in order to transfer counter-charges from a terminal of the capacitor to the integration node whenever the comparator toggles, the transfer of the counter-charges bringing about a variation of potential at said terminal of the capacitor, and a regulation circuit for controlling the transfer transistor, said circuit comprising means for turning on the transfer transistor when the potential of the terminal of the capacitor is between two predetermined potentials that are independent of the transfer transistor.

Abstract: A method is provided for controlling a light-sensitive device, for example, a digital X-ray detector including an array of light-sensitive points. The light-sensitive device includes a column conductor, line conductors, and light-sensitive points. Each light-sensitive point is connected between the column conductor and one of the line conductors, and includes a light-sensitive element converting a photon flux into electrical charges, and a transistor transferring the electrical charges to the column conductor based on control of a signal received by the corresponding line conductor. The method depends on the presence of a capacitor for cross-coupling between the drain and source of each transistor in the off state. The capacitor provides a potential variation to the column conductor upon receiving photons. The method comprises comparing the potential variation with a threshold, and reading the light-sensitive points in the event that the result of the comparison is positive.

Abstract: Enhancement of the reliability of an imaging device comprising several pixels is provided, each of the pixels comprising several first blocks of electronic components organized as a matrix and joined by links to row buses and column buses of the matrix allowing the powering and control of each of the first blocks for its nominal operation. Each of the pixels moreover comprises, associated with the first block, programmable means for disconnection of the first block from the at least one of the buses. Locating of a fault in a device is also provided, the fault occurring in one of the first blocks and leading to a generalized fault in several first blocks.

Abstract: A device is provided for addressing the rows of an active detection matrix for imaging by ionizing radiations comprising a plurality N of rows n of pixels, the addressing device being produced on a substrate on which the matrix is also producing and mainly comprising thin film transistors of single N or P type. The row addressing device can comprise a plurality of stages suitable for delivering at their respective outputs switching signals for switching the high and low levels of a signal applied to switching devices at the output on a corresponding row of the matrix and being characterized in that each stage comprises an input stage and an output stage, the input stage delivering an activation signal for the output stage, the output stage delivering, in case of activation, said switching signal for the corresponding row n.

Abstract: An imaging device comprising a matrix (10; 20; 30) of pixels (P(i,j); Q(i,j); R(i,j); X(i,j); Y(i,j)) organized in rows and columns, and a method for implementing said device. Each current pixel (P(i,j); Q(i,j); R(i,j); X(i,j); Y(i,j)) comprises: a row grouping switch (B(i,j)) making it possible to group the current pixel (P(i,j); Q(i,j); R(i,j); X(i,j); Y(i,j)) with the following pixel (P(i,j+1); Q(i,j+1); R(i,j+1); X(i,j+1); Y(i,j+1)) of the same row; a column grouping switch (A(i,j)) making it possible to group the current pixel (P(i,j); Q(i,j); R(i,j); X(i,j); Y(i,j)) with the following pixel (P(i+1,j); Q(i+1,j); R(i+1,j); X(i+1,j); Y(i+1,j)) of the same column; and storage means (M(i,j); U(i,j); V(i,j)) making it possible to define the state, on or off, of the two grouping switches (A(i,j), B(i,j)).