Patents Assigned to TSI Sensor Incorporated
  • Patent number: 5481916
    Abstract: An apparatus, for non-destructively testing for flaws in materials, having a housing assembly with a rotor and a stator for passing over the testing material, an ultrasonic probe fixed to the stator, and an eddy current probe mounted on the rotor. In operation the rotor rotates the eddy current probe about the ultrasonic probe and an indexing coil on the ultrasonic probe monitors the relative position of the eddy current probe. The rotating eddy current probe generates eddy currents in the testing material such that internal flaws effect the normal feed back to the probe. Changes in this feed back are monitored to determine, in conjunction with the indexing coil, the existence and location of flaws in the testing material. In the preferred embodiment a rotary transformer electromagnetically bonds the rotating eddy current probe to the housing stator.
    Type: Grant
    Filed: July 22, 1994
    Date of Patent: January 9, 1996
    Assignee: TSI Sensor Incorporated
    Inventors: Mirek Macecek, Alec Florei, William R. Sturrock