Abstract: The invention is related to a photovoltaic element evaluation method, comprising a time-controlled measurement of a current-voltage characteristic of a photovoltaic element, said photovoltaic element being arranged in a measuring circuit for measuring at least an electrical current and/or an electrical voltage of said current-voltage characteristic. The invention relates furthermore to a measuring system configuration for performing time-controlled measurements of current-voltage characteristics of replaceable photovoltaic elements.
Abstract: The invention is related to a photovoltaic element evaluation method, comprising a time-controlled measurement of a current-voltage characteristic of a photovoltaic element, said photovoltaic element being arranged in a measuring circuit for measuring at least an electrical current and/or an electrical voltage of said current-voltage characteristic. The invention relates furthermore to a measuring system configuration for performing time-controlled measurements of current-voltage characteristics of replaceable photovoltaic elements.