Patents Assigned to UC Tech
  • Publication number: 20060018524
    Abstract: A system, method, and computer program product for classifying a target structure in an image into abnormality types. The system has a scanning mechanism that scans a local window across sub-regions of the target structure by moving the local window across the image to obtain sub-region pixel sets. A mechanism inputs the sub-region pixel sets into a classifier to provide output pixel values based on the sub-region pixel sets, each output pixel value representing a likelihood that respective image pixels have a predetermined abnormality, the output pixel values collectively determining a likelihood distribution output image map. A mechanism scores the likelihood distribution map to classify the target structure into abnormality types. The classifier can be, e.g., a single-output or multiple-output massive training artificial neural network (MTANN).
    Type: Application
    Filed: July 15, 2005
    Publication date: January 26, 2006
    Applicant: UC Tech
    Inventors: Kenji Suzuki, Kunio Doi