Abstract: A computing system includes a processor configured to: generate a first artificial intelligence (AI) model for S.M.A.R.T. diagnostic information for a storage enclosure; generate a second artificial intelligence (AI) model for device temperature information for the storage enclosure; generate a third artificial intelligence (AI) model for device self-test information for the storage enclosure; generate a fourth artificial intelligence (AI) model for device-detected issues for the storage enclosure; generate a fifth artificial intelligence (AI) model for host-detected issues for the storage enclosure; generate an event prediction artificial intelligence (AI) model from the aggregation of a feature selection from the first AI model, the second AI model, the third AI model, the fourth AI model, and the fifth AI model; and operate the event prediction AI model to generate an event prediction for communicating an upcoming negative operational status for the storage enclosure.