Abstract: The present invention is a system and method to quickly and accurately measure the luminance and luminance distribution of a light on the surface of an object so that the position of the lamp can be adjusted relative to the projector optics to obtain the best luminance available for that object. A scanning light receiver, which produces an optical image of the object whose luminance is to be tested, is set up so that it may view a substantial portion of the surface of the object. The light receiver is connected to a analyzer and control unit ("ACU") to which it sends an electronic image representing the reflected luminance of the surface during each scan. The reflected light that is detected by the light receiver is then analyzed by the ACU to determine the luminance levels and distribution across a substantial portion of the surface by measuring the voltage of each pixel detected by the light receiver measured against the voltage produced by a black level.

Abstract: The present invention is a system and method to expeditiously and accurately measure the luminance, weave, jump and flicker of an object so that the best luminance available for that object may be achieved by making adjustments to the light source, the reflecting surface and the like. A scanning light receiver which produces a two dimensional optical image of the object whose luminance is to be tested, is set up so that it may view a substantial portion of the object. The light receiver is connected to a analyzer and interface unit ("AIU") to which it sends an electronic image representing the reflected luminance of the object during each scan. The reflected light that is detected by the light receiver is then analyzed by the AIU to determine the luminance levels, weave, jump and flicker of the luminance across a substantial portion of the object by measuring the voltage of each pixel detected by the light receiver measured against the voltage produced by a black level.