Patents Assigned to United States as represented by the Administrator of NASA
  • Patent number: 11946883
    Abstract: A method includes determining a predicted contrast-to-noise ratio sensitivity function (CNR SF) for crack detection of a predetermined target flaw size with the radiographic inspection system in the selected set-up. The method also includes qualifying an inspection image quality indicator (IQI) for the predetermined target flaw size for use in the radiographic inspection system in the selected set-up. The method also includes performing an inspection process. The inspection process includes selecting the qualified inspection IQI for the predetermined target flaw size. The inspection process also includes performing an inspection test on the qualified inspection IQI using the radiographic inspection system in the selected set-up. The inspection process also includes determining one or more inspection output parameters.
    Type: Grant
    Filed: November 15, 2021
    Date of Patent: April 2, 2024
    Assignee: United States as represented by the Administrator of NASA
    Inventor: Ajay M Koshti