Patents Assigned to UNITED TEST AND ASSEMBLY CENTER
  • Patent number: 10403592
    Abstract: Semiconductor packages and methods for forming a semiconductor package are disclosed. The method includes providing a package substrate having first and second major surfaces. The package substrate includes a base substrate having a mold material and a plurality of interconnect structures including via contacts extending through the first to the second major surface of the package substrate. A die having conductive contacts on its first or second surface is provided. The conductive contacts of the die are electrically coupled to the interconnect structures. A cap is formed over the package substrate to encapsulate the die.
    Type: Grant
    Filed: October 6, 2017
    Date of Patent: September 3, 2019
    Assignee: UNITED TEST AND ASSEMBLY CENTER LTD.
    Inventors: Yongbo Yang, Antonio Jr. Bambalan Dimaano, Chun Hong Wo
  • Patent number: 9786625
    Abstract: Semiconductor packages and methods for forming a semiconductor package are disclosed. The method includes providing a package substrate having first and second major surfaces. The package substrate includes a base substrate having a mold material and a plurality of interconnect structures including via contacts extending through the first to the second major surface of the package substrate. A die having conductive contacts on its first or second surface is provided. The conductive contacts of the die are electrically coupled to the interconnect structures. A cap is formed over the package substrate to encapsulate the die.
    Type: Grant
    Filed: July 20, 2015
    Date of Patent: October 10, 2017
    Assignee: UNITED TEST AND ASSEMBLY CENTER LTD.
    Inventors: Yongbo Yang, Antonio Jr. Bambalan Dimaano, Chun Hong Wo
  • Publication number: 20160211196
    Abstract: A method of manufacturing a lead frame includes providing an electrically conductive layer having a plurality of holes at a top surface. The plurality of holes form a structure of leads and a die pad on the electrically conductive layer. The plurality of holes are filled with a non-conductive material. Next; an electrically conductive foil is attached on the top surface of the electrically conductive layer and the non-conductive epoxy material. The, the electrically conductive foil is etched to create a network of leads, die pad, bus lines, dam bars and tie lines, wherein the bus lines connect the leads to the dam bar, the dam bar is connected to the tie line and the tie line is connected to the die pad.
    Type: Application
    Filed: January 27, 2016
    Publication date: July 21, 2016
    Applicant: UNITED TEST AND ASSEMBLY CENTER LTD.
    Inventors: Danny RETUTA, Hien Boon TAN, Anthony Yi Sheng SUN, Mary Annie CHEONG
  • Patent number: 9281218
    Abstract: A method of manufacturing a lead frame includes providing an electrically conductive layer having a plurality of holes at a top surface. The plurality of holes form a structure of leads and a die pad on the electrically conductive layer. The plurality of holes are filled with a non-conductive material. Next; an electrically conductive foil is attached on the top surface of the electrically conductive layer and the non-conductive epoxy material. Then, the electrically conductive foil is etched to create a network of leads, die pad, bus lines, dam bars and tie lines, wherein the bus lines connect the leads to the dam bar, the dam bar is connected to the tie line and the tie line is connected to the die pad.
    Type: Grant
    Filed: August 29, 2007
    Date of Patent: March 8, 2016
    Assignee: UNITED TEST AND ASSEMBLY CENTER LTD.
    Inventors: Danny Retuta, Hien Boon Tan, Anthony Yi Sheng Sun, Mary Annie Cheong
  • Patent number: 9165878
    Abstract: Semiconductor packages and methods for forming a semiconductor package are presented. The method includes providing a package substrate having first and second major surfaces. The package substrate includes at least one substrate layer having at least one cavity. Interconnect structure is formed. At least one conductive stud is formed within the cavity and a conductive trace and a connection pad are formed over the first major surface of the package substrate and are coupled to top surface of the conductive stud. A package pad is formed and is directly coupled to the conductive stud. A die having conductive contacts on its first or second surface is provided. The conductive contacts of the die are electrically coupled to the interconnect structure. A cap is formed over the package substrate to encapsulate the die.
    Type: Grant
    Filed: December 2, 2013
    Date of Patent: October 20, 2015
    Assignee: UNITED TEST AND ASSEMBLY CENTER LTD.
    Inventors: Yong Bo Yang, Chun Hong Wo
  • Patent number: 9142487
    Abstract: A structural member for use in semiconductor packaging is disclosed. The structural member includes a plurality of packaging regions to facilitate packaging dies in, for example, a wafer format. A packaging region has a die attach region surrounded by a peripheral region. A die is attached to the die attach region. In one aspect, the die attach region has opening through the surfaces of the structural member for accommodating a die. Through-vias disposed are in the peripheral regions. The structural member reduces warpage that can occur during curing of the mold compound used in encapsulating the dies. In another aspect, the die attach region does not have an opening. In such cases, the structural member serves as an interposer between the die and a substrate.
    Type: Grant
    Filed: January 9, 2013
    Date of Patent: September 22, 2015
    Assignee: UNITED TEST AND ASSEMBLY CENTER LTD.
    Inventors: Chin Hock Toh, Yi Sheng Anthony Sun, Xue Ren Zhang, Ravi Kanth Kolan
  • Patent number: 9136142
    Abstract: A device is disclosed. The device includes a carrier substrate having first and second major surfaces. The first surface includes a die region and contact pads and the second surface includes package contacts. The carrier substrate includes a patterned lead frame which defines a line level with conductive traces and a via level with via contacts. The patterned lead frame provides interconnections between the contact pads and package contacts. The carrier substrate further includes a dielectric layer isolating the conductive traces and via contacts. The device includes a die mounted on the die region of the first surface.
    Type: Grant
    Filed: April 21, 2014
    Date of Patent: September 15, 2015
    Assignee: UNITED TEST AND ASSEMBLY CENTER LTD.
    Inventors: Chuen Khiang Wang, Nathapong Suthiwongsunthorn, Kriangsak Sae Le, Antonio Jr B Dimaano, Catherine Bee Liang Ng, Richard Te Gan, Kian Teng Eng
  • Patent number: 9117808
    Abstract: A method of forming semiconductor assemblies is disclosed. The method includes providing an interposer with through interposer vias. The interposer includes a first surface and a second surface. The through interposer vias extend from the first surface to the second surface of the interposer. A first die is mounted on the first surface of the interposer. The first die comprises a first surface with first conductive contacts thereon. The interposer comprises material with coefficient of thermal expansion (CTE) similar to that of the first die. The first conductive contacts of the first die are coupled to the through interposer vias on the first surface of the interposer.
    Type: Grant
    Filed: April 21, 2014
    Date of Patent: August 25, 2015
    Assignee: UNITED TEST AND ASSEMBLY CENTER LTD.
    Inventors: Chin Hock Toh, Kriangsak Sae Le
  • Patent number: 9087777
    Abstract: Semiconductor packages and methods for forming a semiconductor package are disclosed. The method includes providing a package substrate having first and second major surfaces. The package substrate includes a base substrate having a mold material and a plurality of interconnect structures including via contacts extending through the first to the second major surface of the package substrate. A die having conductive contacts on its first or second surface is provided. The conductive contacts of the die are electrically coupled to the interconnect structures. A cap is formed over the package substrate to encapsulate the die.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: July 21, 2015
    Assignee: UNITED TEST AND ASSEMBLY CENTER LTD.
    Inventors: Yongbo Yang, Antonio Jr. Bambalan Dimaano, Chun Hong Wo
  • Patent number: 9023690
    Abstract: Embodiments of the present invention are directed to leadframe area array packaging technology for fabricating an area array of I/O contacts. A manufactured package includes a polymer material substrate, an interconnect layer positioned on top of the polymer material substrate, a die coupled to the interconnect layer via wire bonds or conductive pillars, and a molding compound encapsulating the die, the interconnect layer and the wire bonds or conductive pillars. The polymer material is typically formed on a carrier before assembly and is not removed to act as the substrate of the manufactured package. The polymer material substrate has a plurality of through holes that exposes the interconnect layer at predetermined locations and enables solder ball mounting or solder printing directly to the interconnect layer. In some embodiments, the semiconductor package includes a relief channel in the polymer material substrate to improve the reliability performance of the manufactured package.
    Type: Grant
    Filed: November 19, 2012
    Date of Patent: May 5, 2015
    Assignee: United Test and Assembly Center
    Inventors: Antonio Bambalan Dimaano, Jr., Nathapong Suthiwongsunthorn, Yong Bo Yang
  • Publication number: 20150102478
    Abstract: Semiconductor packages and methods for forming a semiconductor package are presented. The semiconductor package includes a package substrate having a die region on a first surface thereof. The package includes a die having a sensing element. The die is disposed in the die region and is electrically coupled to contact pads disposed on the first surface of the package substrate by insulated wire bonds. A cap is disposed over the first surface of the package substrate. The cap and the first surface of the package substrate define an inner cavity which accommodates the die and the insulated wire bonds. The insulated wire bonds are directly exposed to an environment through at least one access port of the package.
    Type: Application
    Filed: October 10, 2013
    Publication date: April 16, 2015
    Applicant: United Test and Assembly Center Ltd.
    Inventors: Nathapong SUTHIWONGSUNTHORN, John Ducyao BELERAN, Serafin Padilla PEDRON, JR.
  • Patent number: 8916422
    Abstract: Package substrate, semiconductor packages and methods for forming a semiconductor package are presented. The package substrate includes a base substrate having first and second major surfaces and a plurality of via contacts extending through the first to the second major surfaces of the base substrate. A first conductive layer having a plurality of openings is disposed over the first surface of the base substrate and via contacts. The openings are configured to match conductive trace layout of the package substrate. Conductive traces are disposed over the first conductive layer. The conductive traces are directly coupled to the via contacts through some of the openings of the first conductive layer.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: December 23, 2014
    Assignee: United Test and Assembly Center Ltd.
    Inventor: Chuen Khiang Wang
  • Patent number: 8860079
    Abstract: Semiconductor packages and methods of forming a semiconductor package are disclosed. The method includes providing at least one die having first and second surfaces. The second surface of the die includes a plurality of conductive pads. A permanent carrier is provided and the at least one die is attached to the permanent carrier. The first surface of the at least one die is facing the permanent carrier. A cap having first and second surfaces is formed to encapsulate the at least one die. The first surface of the cap contacts the permanent carrier and the second surface of the cap is disposed at a different plane than the second surface of the die.
    Type: Grant
    Filed: May 9, 2012
    Date of Patent: October 14, 2014
    Assignee: United Test and Assembly Center Ltd.
    Inventors: Catherine Bee Liang Ng, Kriangsak Sae Le, Chuen Khiang Wang, Nathapong Suthiwongsunthorn
  • Publication number: 20140264835
    Abstract: Package substrate, semiconductor packages and methods for forming a semiconductor package are presented. The package substrate includes a base substrate having first and second major surfaces and a plurality of via contacts extending through the first to the second major surfaces of the base substrate. A first conductive layer having a plurality of openings is disposed over the first surface of the base substrate and via contacts. The openings are configured to match conductive trace layout of the package substrate. Conductive traces are disposed over the first conductive layer. The conductive traces are directly coupled to the via contacts through some of the openings of the first conductive layer.
    Type: Application
    Filed: March 15, 2013
    Publication date: September 18, 2014
    Applicant: UNITED TEST AND ASSEMBLY CENTER LTD.
    Inventor: Chuen Khiang WANG
  • Publication number: 20140264789
    Abstract: Semiconductor packages and methods for forming a semiconductor package are disclosed. The method includes providing a package substrate having first and second major surfaces. The package substrate includes a base substrate having a mold material and a plurality of interconnect structures including via contacts extending through the first to the second major surface of the package substrate. A die having conductive contacts on its first or second surface is provided. The conductive contacts of the die are electrically coupled to the interconnect structures. A cap is formed over the package substrate to encapsulate the die.
    Type: Application
    Filed: March 14, 2013
    Publication date: September 18, 2014
    Applicant: UNITED TEST AND ASSEMBLY CENTER LTD.
    Inventors: Yongbo Yang, Antonio Jr. Bambalan Dimaano, Chun Hong Wo
  • Publication number: 20140264792
    Abstract: Semiconductor packages and methods for forming a semiconductor package are presented. The method includes providing a package substrate having first and second major surfaces. The package substrate includes at least one substrate layer having at least one cavity. Interconnect structure is formed. At least one conductive stud is formed within the cavity and a conductive trace and a connection pad are formed over the first major surface of the package substrate and are coupled to top surface of the conductive stud. A package pad is formed and is directly coupled to the conductive stud. A die having conductive contacts on its first or second surface is provided. The conductive contacts of the die are electrically coupled to the interconnect structure. A cap is formed over the package substrate to encapsulate the die.
    Type: Application
    Filed: December 2, 2013
    Publication date: September 18, 2014
    Applicant: United Test and Assembly Center Ltd.
    Inventors: Yong Bo YANG, Chun Hong WO
  • Patent number: 8829666
    Abstract: Semiconductor packages and methods of forming a semiconductor package are disclosed. The method includes providing at least one die having first and second surfaces. The second surface of the die includes a plurality of conductive pads. A support carrier is provided and the at least one die is attached to the support carrier. The first surface of the at least one die is facing the support carrier. A cap having first and second surfaces is formed to encapsulate the at least one die. The second surface of the cap is disposed at a different plane than the second surface of the die.
    Type: Grant
    Filed: November 14, 2011
    Date of Patent: September 9, 2014
    Assignee: United Test and Assembly Center Ltd.
    Inventors: Catherine Bee Liang Ng, Kriangsak Sae Le, Chuen Khiang Wang, Nathapong Suthiwongsunthorn
  • Patent number: 8816482
    Abstract: A flip-chip leadframe semiconductor package designed to improve mold flow around the leadframe and semiconductor die. An embodiment of the semiconductor package includes a leadframe, a semiconductor die attached to the leadframe, and an encapsulant covering the leadframe and semiconductor die, wherein a portion of the leadframe that is attached to the semiconductor die is below a portion of the leadframe that enters the encapsulant.
    Type: Grant
    Filed: December 9, 2008
    Date of Patent: August 26, 2014
    Assignee: United Test and Assembly Center Ltd.
    Inventors: Saravuth Sirinorakul, Kasemsan Kongthaworn
  • Publication number: 20140227832
    Abstract: A device is disclosed. The device includes a carrier substrate having first and second major surfaces. The first surface includes a die region and contact pads and the second surface includes package contacts. The carrier substrate includes a patterned lead frame which defines a line level with conductive traces and a via level with via contacts. The patterned lead frame provides interconnections between the contact pads and package contacts. The carrier substrate further includes a dielectric layer isolating the conductive traces and via contacts. The device includes a die mounted on the die region of the first surface.
    Type: Application
    Filed: April 21, 2014
    Publication date: August 14, 2014
    Applicant: United Test and Assembly Center Ltd.
    Inventors: Chuen Khiang WANG, Nathapong SUTHIWONGSUNTHORN, Kriangsak SAE LE, Antonio Jr B DIMAANO, Catherine Bee Liang NG, Richard Te GAN, Kian Teng ENG
  • Publication number: 20140225242
    Abstract: A method of forming semiconductor assemblies is disclosed. The method includes providing an interposer with through interposer vias. The interposer includes a first surface and a second surface. The through interposer vias extend from the first surface to the second surface of the interposer. A first die is mounted on the first surface of the interposer. The first die comprises a first surface with first conductive contacts thereon. The interposer comprises material with coefficient of thermal expansion (CTE) similar to that of the first die. The first conductive contacts of the first die are coupled to the through interposer vias on the first surface of the interposer.
    Type: Application
    Filed: April 21, 2014
    Publication date: August 14, 2014
    Applicant: United Test and Assembly Center Ltd.
    Inventors: Chin Hock TOH, Kriangsak Sae LE