Patents Assigned to United Test and Assembly Test Center Ltd.
  • Patent number: 8129222
    Abstract: An integrated circuit package having a die pad with a first face and a second face, a plurality of inner leads, and a plurality of sides between the first face and the second face. The plurality of inner leads is disposed substantially co-planer with and substantially around the die pad. The package also comprises a plurality of outer leads disposed substantially co-planar with and substantially around the plurality of inner leads and the die pad, so that the sides of each of the plurality of outer leads are offset from the sides of each of the plurality of inner leads. A first adhesive layer disposed on the first face of the die pad and a second adhesive layer disposed on the first faces of each of the plurality of inner leads. An IC chip is coupled to the first face of the die pad through the first adhesive layer and to the plurality of inner leads through the second adhesive layer. The package further comprises wires linking the inner leads and outer leads to the IC chip.
    Type: Grant
    Filed: November 26, 2003
    Date of Patent: March 6, 2012
    Assignee: United Test and Assembly Test Center Ltd.
    Inventors: Hien Boon Tan, Anthony Yi Sheng Sun
  • Patent number: 7851899
    Abstract: A BGA package is disclosed including a base IC structure having a base substrate, with an opening running length-wise there through. A first semiconductor chip is mounted face-down on the base substrate so the bond pads thereof are accessible through the opening. The package also includes a secondary IC structure including a secondary substrate, having an opening running there through, and a second semiconductor chip. The second chip is mounted face-down on the secondary substrate so that the bond pads thereof are accessible through the opening in the secondary substrate. An encapsulant fills the opening in the secondary substrate and forms a substantially planar surface over the underside of the secondary substrate. The substantially planar surface is mounted to the first chip of the base IC structure through an adhesive. Wires connect a conductive portion of the secondary IC structure to a conductive portion of the base IC structure.
    Type: Grant
    Filed: April 2, 2004
    Date of Patent: December 14, 2010
    Assignees: UTAC - United Test and Assembly Test Center Ltd., Infineon Technologies
    Inventors: Fung Leng Chen, Seong Kwang Brandon Kim, Wee Lim Cha, Yi-Sheng Anthony Sun, Wolfgang Hetzel, Jochen Thomas
  • Patent number: 7678610
    Abstract: A semiconductor chip package and method of making the same. A first chip unit includes a first substrate and a first IC chip electrically connected to the first substrate. A second chip unit includes a second substrate and a second IC chip electronically connected to the second substrate. An adhesive material is provided on a surface of the first IC chip and the second chip unit is mounted onto the surface of the first chip unit including the adhesive material so that at least a portion of the second structure is encapsulated by the adhesive material, thereby providing some encapsulation in the same step as mounting. The first chip unit and the second chip unit may be separated by a spacer which may also provide an electrical connection.
    Type: Grant
    Filed: October 28, 2005
    Date of Patent: March 16, 2010
    Assignee: UTAC-United Test and Assembly Test Center Ltd.
    Inventors: Chuen Khiang Wang, Hien Boon Tan, Anthony Yi Sheng Sun, Sin Nee Song, Steven Yu Feng Yao, Hua Hong Tan
  • Publication number: 20090266807
    Abstract: An oven control system and methods of operating the same are disclosed. The oven control system provides various automated tracking and control functions to reduce errors and defects in oven cure operations.
    Type: Application
    Filed: April 27, 2009
    Publication date: October 29, 2009
    Applicant: United Test and Assembly Test Center Ltd.
    Inventor: Venkatachalam VALLIAPPAN
  • Publication number: 20090194871
    Abstract: A method of mounting a semiconductor die on a substrate with a solder mask on a first surface includes placing a die on the solder mask, and mounting the die to the substrate by applying pressure and heat. The applied pressure ranges from a bond force of approximately 5 to 10 Kg, the heat has a temperature range from approximately 150 to 200° C. and the pressure is applied for a range of approximately 1 to 10 seconds.
    Type: Application
    Filed: December 24, 2008
    Publication date: August 6, 2009
    Applicant: UTAC - United Test and Assembly Test Center, Ltd.
    Inventors: Denver Paul C. Castillo, Soon Hua Bryan Tan, Rodel Manalac, Kian Teng Eng, Pang Hup Ong, Soo Pin Chow, Wolfgang Johannes Hetzel, Werner Josef Reiss, Florian Ammer
  • Patent number: 7361995
    Abstract: A thermally enhanced ball grid array package is disclosed. The package includes a base layer element and a flip chip die mounted on the base layer element. The die has a first surface electrically coupled to the base layer element, a second surface opposite to the first surface, and lateral sides. A molding compound encapsulates the base layer element and the lateral sides of the die. A surface is formed of the second surface of the die and an upper surface of the molding compound. A material is disposed on the surface, and a heat spreader is mounted on the material.
    Type: Grant
    Filed: February 3, 2004
    Date of Patent: April 22, 2008
    Assignees: Xilinx, Inc., UTAC - United Test and Assembly Test Center Ltd.
    Inventors: Kim Yong Goh, Rahul Kapoor, Anthony Yi-Sheng Sun, Desmond Yok Rue Chong, Lan H. Hoang
  • Patent number: 7109570
    Abstract: An integrated circuit package having a die pad and a plurality of leads is disclosed. At least one of the plurality of leads has a recess formed in a first face thereof. The package also has an integrated circuit chip coupled to the die pad through an adhesive layer. A plurality of wires each link a first face of the integrated circuit chip to one of the plurality of leads. An encapsulant encloses the integrated circuit chip, the plurality of wires, the die pad, and a portion of each of the plurality of leads. The encapsulant forms a plurality of side walls which slant downward and outward. At least one of the side walls intersects with the first face of the at least one lead within the side walls of the recess formed therein.
    Type: Grant
    Filed: March 30, 2004
    Date of Patent: September 19, 2006
    Assignee: United Test and Assembly Test Center Ltd.
    Inventors: Rodel Manalac, Hien Boon Tan, Francis Poh, Jaime Siat, Roland Cordero
  • Publication number: 20040124508
    Abstract: An integrated circuit package is disclosed. The package comprises a plurality of leads, each lead having a first face and a second face opposite to the first face. The package also comprises a die pad having a first face and a second face opposite to the first face. The second face of the die pad is orthogonally offset from the second face of the leads so that the second face of the die pad and the second face of the leads are not coplanar. The package also comprises an integrated circuit chip substantially laterally disposed between the plurality of leads, and having a first face and a second face opposite to the first face. The first face of the integrated circuit chip is proximate to the second face of the die pad and the first face of the integrated circuit chip is coupled to the second face of the die pad. The package further comprises a plurality of wires that link the plurality of leads to the integrated circuit chip.
    Type: Application
    Filed: November 26, 2003
    Publication date: July 1, 2004
    Applicant: UNITED TEST AND ASSEMBLY TEST CENTER LTD.
    Inventors: Hien Boon Tan, Anthony Yi Sheng Sun, Francis Koon Seong Poh
  • Publication number: 20040104457
    Abstract: An integrated circuit package having a die pad with a first face and a second face, a plurality of inner leads, and a plurality of sides between the first face and the second face. The plurality of inner leads is disposed substantially co-planer with and substantially around the die pad. The package also comprises a plurality of outer leads disposed substantially co-planar with and substantially around the plurality of inner leads and the die pad, so that the sides of each of the plurality of outer leads are offset from the sides of each of the plurality of inner leads. A first adhesive layer disposed on the first face of the die pad and a second adhesive layer disposed on the first faces of each of the plurality of inner leads. An IC chip is coupled to the first face of the die pad through the first adhesive layer and to the plurality of inner leads through the second adhesive layer. The package further comprises wires linking the inner leads and outer leads to the IC chip.
    Type: Application
    Filed: November 26, 2003
    Publication date: June 3, 2004
    Applicant: UNITED TEST AND ASSEMBLY TEST CENTER LTD.
    Inventors: Hien Boon Tan, Anthony Yi Sheng Sun