Patents Assigned to UniTest Incorporation
  • Patent number: 7327151
    Abstract: Disclosed is a memory application tester for testing a semiconductor memory device. A plurality of motherboards of the tester are vertically mounted and connected to memory devices to be tested mounted on an interface board via a HiFix board so that a memory application tester may test more memory device simultaneously, and a limit in the trace length due to the integration of the motherboards is effectively solved.
    Type: Grant
    Filed: December 7, 2005
    Date of Patent: February 5, 2008
    Assignee: UniTest Incorporation
    Inventor: Jong Koo Kang
  • Patent number: 6883128
    Abstract: The present invention relates to a test equipment of a chip memory device. A memory pattern test is implemented using a pattern generation substrate in which a processor is designed in an EPLD for thereby implementing a PC test and pattern programming, so that a test evaluated under a PC environment formed of a CPU and chip sets. Two processes of a chip device test and automatic test are performed in one equipment using a generated test pattern. The PC test and automatic test are separated using a high speed switching device which is capable of implementing a conversion without a signal distortion between the signal lines extended from the chip sets and the pattern generation substrate. Therefore, in the present invention, it is possible to enhance a test performance and decrease the test time and error ratio and cost of the products.
    Type: Grant
    Filed: August 8, 2002
    Date of Patent: April 19, 2005
    Assignee: UniTest Incorporation
    Inventors: Jong-Gu Kang, Jong-Hyun Kim