Patents Assigned to UnitX, Inc.
  • Patent number: 12267925
    Abstract: In an example embodiment, the controller is designed with a single current sensing circuit that is able to measure the current on multiple LED channels, eliminating the need for each LED channel to have its own current sensing circuit. The current sensing circuit may further be utilized with a control unit, which has an LED control model selection multiplexor (MUX) that switches between real-time closed-loop control and open-loop control.
    Type: Grant
    Filed: November 8, 2022
    Date of Patent: April 1, 2025
    Assignee: UnitX, Inc.
    Inventors: Yen-Chia Chu, Boyun Wang
  • Patent number: 12135123
    Abstract: A feature inspection lighting system includes an outer cover having a mounting structure at a first end thereof and defining an outer periphery at a second end thereof. The cover includes an inner surface between the first end and the second end. The inner surface has raised surfaces defined thereon. A plurality of light sources is coupled to the raised surfaces of the inner surface of the cover, and cables to provide electrical power to the light sources is routed between the raised surfaces of the outer cover. The outer periphery of the cover may have a cutout defined therein through which all or part of an object to be inspected can pass.
    Type: Grant
    Filed: October 24, 2022
    Date of Patent: November 5, 2024
    Assignee: UnitX, Inc.
    Inventors: Boyun Wang, Roman Balak, Paul Lee Briel, Yen-Chia Chu
  • Publication number: 20240062358
    Abstract: The present disclosure provides a dimensional measurement method and device based on deep learning. The method includes capturing a target image of a target object, obtaining measurement data for the target image, and determining whether or not the target object is within a preset tolerance.
    Type: Application
    Filed: October 27, 2023
    Publication date: February 22, 2024
    Applicant: UNITX, INC.
    Inventor: Kedao Wang
  • Patent number: 11854182
    Abstract: The present disclosure provides a dimensional measurement method and device based on deep learning. The method includes capturing a target image of a target object, obtaining measurement data for the target image, and determining whether or not the target object is within a preset tolerance.
    Type: Grant
    Filed: August 25, 2021
    Date of Patent: December 26, 2023
    Assignee: UNITX, Inc.
    Inventor: Kedao Wang
  • Patent number: 11763442
    Abstract: A fused imaging device and method are disclosed. The device comprises a light source component, an image capture component, and a control component. The control component may be configured to control the light source component to illuminate a target object based on a preset plurality of first optimal lighting configurations. The control component may further control the image capture component to capture images of the target object to obtain multiple first images, under the illumination of the light source component and generate a target image of the target object, based on the first images. The control component may further adjust the incidence angle, pattern, and wavelength of the light source in the light source component, as well as the exposure, lens focus, and polarization of the image capture component, to detect target object defects in captured images of the target object.
    Type: Grant
    Filed: March 18, 2021
    Date of Patent: September 19, 2023
    Assignee: UNITX, INC.
    Inventor: Kedao Wang
  • Patent number: 11734812
    Abstract: A fused imaging device and method are disclosed. The device comprises a light source component, an image capture component, and a control component. The control component may be configured to control the light source component to illuminate a target object based on a preset plurality of first optimal lighting configurations. The control component may further control the image capture component to capture images of the target object to obtain multiple first images, under the illumination of the light source component and generate a target image of the target object, based on the first images. The control component may further adjust the incidence angle, pattern, and wavelength of the light source in the light source component, as well as the exposure, lens focus, and polarization of the image capture component, to detect target object defects in captured images of the target object.
    Type: Grant
    Filed: March 18, 2021
    Date of Patent: August 22, 2023
    Assignee: UNITX, INC.
    Inventor: Kedao Wang
  • Publication number: 20230061004
    Abstract: The present disclosure provides a dimensional measurement method and device based on deep learning. The method includes capturing a target image of a target object, obtaining measurement data for the target image, and determining whether or not the target object is within a preset tolerance.
    Type: Application
    Filed: August 25, 2021
    Publication date: March 2, 2023
    Applicant: UnitX, Inc.
    Inventor: Kedao Wang
  • Publication number: 20220301144
    Abstract: A fused imaging device and method are disclosed. The device comprises a light source component, an image capture component, and a control component. The control component may be configured to control the light source component to illuminate a target object based on a preset plurality of first optimal lighting configurations. The control component may further control the image capture component to capture images of the target object to obtain multiple first images, under the illumination of the light source component and generate a target image of the target object, based on the first images. The control component may further adjust the incidence angle, pattern, and wavelength of the light source in the light source component, as well as the exposure, lens focus, and polarization of the image capture component, to detect target object defects in captured images of the target object.
    Type: Application
    Filed: March 18, 2021
    Publication date: September 22, 2022
    Applicant: UnitX, Inc.
    Inventor: Kedao Wang
  • Publication number: 20220301145
    Abstract: A fused imaging device and method are disclosed. The device comprises a light source component, an image capture component, and a control component. The control component may be configured to control the light source component to illuminate a target object based on a preset plurality of first optimal lighting configurations. The control component may further control the image capture component to capture images of the target object to obtain multiple first images, under the illumination of the light source component and generate a target image of the target object, based on the first images. The control component may further adjust the incidence angle, pattern, and wavelength of the light source in the light source component, as well as the exposure, lens focus, and polarization of the image capture component, to detect target object defects in captured images of the target object.
    Type: Application
    Filed: March 18, 2021
    Publication date: September 22, 2022
    Applicant: UnitX, Inc.
    Inventor: Kedao Wang
  • Publication number: 20210342688
    Abstract: The present disclosure relates to a method, devices, and storage medium for training neural networks based on memory scores. The said method comprises: establishing the memory scores of a plurality of first-sample images in the library, from their training ages and training indicators, and a preset discount rate; determining a plurality of second-sample images from these memory scores and a preset first count, and using them to establish the first training set; training the neural network by using the first training set, with the said neural network is used for defect detection. The neural network training method in the disclosed embodiment reduces the size of the training set and shortens the time to converge, thereby improving training efficiency.
    Type: Application
    Filed: April 9, 2021
    Publication date: November 4, 2021
    Applicant: UnitX, Inc.
    Inventor: Kedao Wang
  • Publication number: 20210150700
    Abstract: A defect detection device includes an image capturing component for capturing one or more images of an object to be inspected; a motion component configured to grasp or manipulate the object or the image capturing component; and a computing device configured to perform a defect detection method, including determining a plurality of first image capturing poses of the object to be inspected; determining a first defect probability for each particular first image capturing pose; establishing a probability matrix based on the first defect probabilities; subdividing the probability matrix into a plurality of submatrices according to preset dimensions for each submatrix; determining a second defect probability for each of the plurality of submatrices; setting a maximum value of the second defect probabilities as a third defect probability of the object to be inspected; and comparing the third defect probability to a threshold to determine whether the object is defective.
    Type: Application
    Filed: November 20, 2020
    Publication date: May 20, 2021
    Applicant: UnitX, Inc.
    Inventor: Kedao Wang