Abstract: The invention relates to a method for staging metastatic potential of a primary tumour sample or related lymph node by nanomechanical measurement and/or for determing the reoccurrence or incidence potential.

Abstract: The invention relates to a measuring device and a method for determining mass and/or mechanical properties of a biological system.

Abstract: Atomic force microscope measuring device comprising a micro-cantilever and an intensity modulated laser exciting the cantilever, wherein the measuring device comprises an optical microscope, in particular a fluorescence microscope, a confocal microscope, a fluorescence energy transfer (FRET) microscope, a DIC and/or phase contrast microscope, all of those in particular construed as an inverted microscope.

Abstract: A method of controlling a surgical intervention to a bone (31) comprises: obtaining a three-dimensional image or multiplanar reconstruction of the bone (31), defining a position and an axis of intervention on the three-dimensional image or multi-planar reconstruction of the bone (31), and controlling the orientation of an intervention instrument (1) equipped with an orientation sensor (2) during the surgical intervention by evaluating a signal provided by the orientation sensor (2). The method further comprises referencing the intervention instrument (1) with respect to the bone (31) before the surgical intervention by arranging the intervention instrument (1) along an anatomic landmark (32) being an edge of the bone (31) and rotating the orientation sensor (2) into a predefined position, or by arranging the intervention instrument (1) essentially perpendicular to an anatomic landmark (32) being an essentially flat surface of the bone (31) and rotating the orientation sensor (2) into a predefined position.

Abstract: The present invention relates to a method for controlling a scanning probe microscope having a probe (2) with a tip (21) for interacting with a sample (4), and a nanoscanner (1) for retaining the sample (4) or the probe (2), comprising the steps of monitoring the extension of the piezo element (1) along a first direction (R) along which the tip (21) is moved towards the sample (4), and adjusting the level of the probe (2) along the first direction (R) by means of an additional actuator (3), when the nanoscanner (1) exhibits an extension below or above a threshold value. The invention further relates to a device (100) for controlling a scanning probe microscope.

Abstract: The present invention relates to sample holders for holding a sample, particularly for an atomic force microscope. Such a sample holder comprising a sample dish (1) comprising a bottom (2), and an opening (3) arranged in said bottom (2) for receiving and holding the sample (15). Furthermore the present invention relates to a sample holder system and to a method for transferring an e.g. biological sample (15) from a biopsy tool (18) to a sample holder.

Abstract: The present invention relates to a method for controlling a scanning probe microscope having a probe (2) with a tip (21) for interacting with a sample (4), and a nanoscanner (1) for retaining the sample (4) or the probe (2), comprising the steps of monitoring the extension of the piezo element (1) along a first direction (R) along which the tip (21) is moved towards the sample (4), and adjusting the level of the probe (2) along the first direction (R) by means of an additional actuator (3), when the nanoscanner (1) exhibits an extension below or above a threshold value. The invention further relates to a device (100) for controlling a scanning probe microscope.

Abstract: The present invention relates to a method for controlling a scanning probe microscope having a probe (2) with a tip (21) for interacting with a sample (4), and a nanoscanner (1) for retaining the sample (4) or the probe (2), comprising the steps of monitoring the extension of the piezo element (1) along a first direction (R) along which the tip (21) is moved towards the sample (4), and adjusting the level of the probe (2) along the first direction (R) by means of an additional actuator (3), when the nanoscanner (1) exhibits an extension below or above a threshold value. The invention further relates to a device (100) for controlling a scanning probe microscope.

Abstract: The invention relates to a combination of syrosingopine and a mitochondrial inhibitor, e.g. metformin or oligomycin, and the use of the combination of syrosingopine and a mitochondrial inhibitor for the treatment of cancer and for achieving immunosuppression. The invention also relates to a fluorescence-based method for predicting syrosingopine sensitivity of a cancer cell.

Abstract: The invention relates to a device for sensing a microwave magnetic field polarization component (B?, B?, B+,) of a microwave relative to a static magnetic field B0, comprising: a preparation means being designed to prepare an atomic vapor (10) comprising a plurality of thermal atoms in a first hyperfine state, particularly a dark state to applied laser light, which first hyperfine state is split from at least one other hyperfine state due to the zero-field hyperfine splitting and/or due to a static magnetic field (B0) generated by said preparation means, at least one cell (1) enclosing said plurality of thermal atoms (10), wherein said microwave is adapted to drive Rabi oscillations of said plurality of thermal atoms between said first hyperfine state and a second hyperfine state, the Rabi frequency of said Rabi oscillations being proportional to said magnetic field polarization component (B?, B?, B+) of said microwave, and an imaging means being designed to capture a state image of said plurality of atoms re

Abstract: The present invention relates to a method for controlling a scanning probe microscope having a probe (2) with a tip (21) for interacting with a sample (4), and a nanoscanner (1) for retaining the sample (4) or the probe (2), comprising the steps of monitoring the extension of the piezo element (1) along a first direction (R) along which the tip (21) is moved towards the sample (4), and adjusting the level of the probe (2) along the first direction (R) by means of an additional actuator (3), when the nanoscanner (1) exhibits an extension below or above a threshold value. The invention further relates to a device (100) for controlling a scanning probe microscope.

Abstract: The present invention relates to a method for classifying a tissue biopsy sample obtained from a tumor, comprising determining a plurality of stiffness values for said sample by measuring a plurality of points on the sample with a spatial resolution of at least 100 ?m and assigning the sample to a probability of malignancy. A sample showing a unimodal stiffness distribution is assigned to a high probability of being non-malignant, and a sample showing an at least bimodal stiffness distribution is assigned to a high probability of being malignant, wherein said stiffness distribution is characterized by a first peak exhibiting an at least two-fold higher stiffness value than a second peak. The present invention further relates to a system for classifying a tumor tissue biopsy sample.

Abstract: The present invention relates to a method for classifying a tissue biopsy sample obtained from a tumour, comprising determining a plurality of stiffness values for said sample by measuring a plurality of points on the sample with a spatial resolution of at least 100 ?m and assigning the sample to a probability of malignancy. A sample showing a unimodal stiffness distribution is assigned to a high probability of being non-malignant, and a sample showing an at least bimodal stiffness distribution is assigned to a high probability of being malignant, wherein said stiffness distribution is characterized by a first peak exhibiting an at least two-fold higher stiffness value than a second peak. The present invention further relates to a system for classifying a tumour tissue biopsy sample.

Abstract: Sensor system (70) for detecting a target substance in a reference liquid, comprising a measurement cantilever (71) being functionalized by application of a first coating to one of the measurement cantilever's surfaces, whereby this first coating is sensitive to the target substance. In addition, the system (70) comprises a reference cantilever (72) with a reference coating on one of the reference cantilever's surfaces, whereby this reference coating is less sensitive to the target substance than the first coating. Both cantilevers are arranged such that they can be exposed in a reference step to the reference liquid and in a detection step to the reference liquid with the target substance. A detector unit (73, 74, 83) is employed for determining the difference in the deflection of the measurement cantilever (71) and the reference cantilever (72) during the reference step and the detection step.

Abstract: The present invention relates to the fast detection of microorganisms, i.e. of bacteria, fungi, cells and other organisms, making use of methods and apparatuses coming from nanotechnology. According to the present invention, such organisms are detected using micromechanical sensor means known from many physical and chemical applications. One or more micromechanical cantilever sensors are either coated with a nutritive medium or at least partially built from a nutritive medium. By depositing a microorganism on the cantilever surface, preferably in a targeted way and in a controlled dosage, a “biological reaction” is started. This reaction results in a change of the mechanical and/or electrical properties of the sensor, i.e. the cantilever. These changes are determined, preferably at certain points in time, and thus allow the detection and detailed observation of the applied microorganism.