Abstract: A calibration standard for determining an intensity decay related to an evanescent field generated close to the interface between a sample to be tested and a substrate on which the sample is to be deposited, preparation and analysis methods and use thereof.
Type:
Grant
Filed:
September 12, 2019
Date of Patent:
May 9, 2023
Assignees:
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS), UNIVERSITE DE PARIS, UNIVERSITE BAR-ILAN
Abstract: A calibration standard for determining an intensity decay related to an evanescent field generated close to the interface between a sample to be tested and a substrate on which the sample is to be deposited, preparation and analysis methods and use thereof.
Type:
Application
Filed:
September 12, 2019
Publication date:
June 9, 2022
Applicants:
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS), UNIVERSITE DE PARIS, UNIVERSITE BAR-ILAN