Abstract: The invention concerns an electronic method for extracting the amplitude ES and the phase ?S of an electrical signal in a synchronous detector, the signal containing a modulated part Imod of the form Imod ? ES f(t)*cos(?S??R(t)), where ?R(t) and f(t) are two known temporal modulation functions. The method comprises the following steps: multiplying the signal by two reference signals C(t) and S(t) constructed from ?R(t) and f(t); integrating the resulting signals over a time tint; determining the amplitude and phase of said signal from the quantities X and Y resulting from the previous integrations. The method is characterised in that: said electrical signal is multiplied by C(t) and S(t) that can be decomposed on the same set of frequencies as those present in Imod. The invention also concerns the application of the above method in interferometric circuits and the use and execution of the above method.
Type:
Grant
Filed:
June 24, 2014
Date of Patent:
December 13, 2016
Assignee:
UNIVERSITE DE TECHNOLOGIES DE TROYES
Inventors:
Aurelien Pierre Bruyant, Julien Vaillant, Abeer Al Mohtar
Abstract: An imaging system for analyzing fluorescent molecules in a sample, including a confocal microscope device, has a support in contact with at least a portion of the sample. In the system, the support surface in contact with the sample is functionalized so as to reduce the observation volume of the microscope on the surface in the axial direction. The present disclosure also relates to various uses of such a system as well as to a method for analyzing fluorescent molecules in a sample, the method being implemented by such a system.
Abstract: An imaging system for analyzing fluorescent molecules in a sample, including a confocal microscope device, has a support in contact with at least a portion of the sample. In the system, the support surface in contact with the sample is functionalized so as to reduce the observation volume of the microscope on the surface in the axial direction. The present disclosure also relates to various uses of such a system as well as to a method for analyzing fluorescent molecules in a sample, the method being implemented by such a system.
Abstract: The present invention concerns a method for generating nanostructures in order to obtain in an area on the surface of a metal piece (10) a nanostructured layer of defined thickness, characterized in that it comprises: a step for projecting onto an impact point in the area of the surface of the piece (10) to be treated, for a given duration, at a given speed and at variable incidences at the same impact point, a given quantity of perfectly spherical balls (22) of given dimensions, reused continuously during the projection; repetition of the preceding step with a shift of the impact point so that the impact points as a group cover the entire surface of the piece to be treated; a step for treatment by diffusion of chemical compounds into the nanostructured layer generated during the step for implementing the method for generating nanostructures.
Type:
Grant
Filed:
September 15, 2006
Date of Patent:
November 27, 2007
Assignees:
Universite de Technologies de Troyes, The Institute of Metal Research