Abstract: A resistive device includes at least one strain gauge (12, 14) comprising silicon nanowires, a power supply (16) that has at least one current source (22, 24) able to generate a current (Ibias) for biasing the strain gauge; and acquisition means (18) able to deliver a measurement signal which can be used to determine the variation in the electrical resistance of the gauge. The power supply includes a chopper (26) allowing the biasing current generated by each current source to flow through each gauge only during a fraction of an operating cycle of the device.