Patents Assigned to University Corporation National Nara Institute of Science and Technology
  • Variable reduction ratio spherical aberration correction electrostatic lens, wide angle energy analyzer, and two-dimensional electron spectrometer
    Patent number: 11791148
    Abstract: Provided is a compact two-dimensional electron spectrometer that is capable of variably adjusting the deceleration ratio over a wide range, and performing simultaneous measurement of the two-dimensional emission angle distribution with a high energy resolution over a wide solid angle of acquisition. The two-dimensional electron spectrometer is configured from: a variable deceleration ratio spherical aberration correction electrostatic lens; a cylindrical mirror type energy analyzer or a wide angle energy analyzer; and a projection lens.
    Type: Grant
    Filed: August 5, 2019
    Date of Patent: October 17, 2023
    Assignee: University Corporation National Nara Institute of Science and Technology
    Inventors: Hiroyuki Matsuda, Hiroshi Daimon, Laszlo Toth