Abstract: A test fixture for an integrated circuit (IC) device under test (DUT) includes: a metallic casing; and first and second antennas secured respectively in first and second RF anechoic chambers in the metallic casing and coupled to a programmable attenuator. The IC DUT is positioned on or in the metallic casing so that an integrated millimeter wave (MMW) antenna thereof is aligned with the first antenna to radiate an MMW signal toward the first antenna through the first RF anechoic chamber. A predetermined MMW signal, which is radiated from an MMW source secured in the second RF anechoic chamber toward the second antenna, is received by the second antenna, is attenuated by the attenuator, and is radiated by the first antenna toward the MMW antenna of the IC DUT.