Abstract: An electromagnetic vector sensor (EMVS) system, having a plurality of EMVS devices consisting of a plurality of loop antenna elements spatiatally orthogonally integrated with and electrically isolated from a plurality of dipole antenna elements, mounted on a rotatably adjustable platform having a true north orientation, including active circuitry residing in antenna housings, and external executing software programs causing the active circuitry in cooperation with the EMVS device and receivers to determine angle of arrival and resolution of incoming wave vectors and polarization of incoming signals and to perform accurate high frequency geolocation signal processing; the programs which perform calibration and antenna element placement determination operations, also cause the system to collect data of known transmitted high frequency skywave signals, and estimate direction of arrival of unknown signals by detecting, resolving and measuring components of an electric field and a magnetic field at a single point.

Abstract: This invention provides an extremely accurate way to characterize the Young's modulus of thin film materials with thicknesses in the nanometer range. It takes advantage of a recently developed high Q silicon Young's modulus resonator (YMR), which has a record high quality factor of about fifty million in operation at temperatures below 10 degrees Kelvin (10K). Because of the high Q of the YMR, the temperature stability of the YMR's resonance frequency below 1K, and the extremely high degree of vibration isolation inherent in the inventive design, the relative resolution of the resonant frequency is typically in 2×10?7. This is enough to resolve a resonant frequency shift after a deposition of a thin film onto the sensitive part of the resonator, and to compute the Young's modulus of thin film materials of even a few monolayers thickness.