Patents Assigned to UTI Instrument Co.
  • Electron impact ion source for trace analysis
    Patent number: 4689574
    Abstract: An apparatus is disclosed for analyzing trace elements in a gas sample. A unique feedback system is provided for accurately regulating and sensing the pressure supplied to the ion chamber of the device. The feedback system is capable of compensating for a wide range of input gas pressures. The apparatus also includes an improved closed ion source which is resistant to corrosion and aids in the reduction of noise. In addition, a method is disclosed to calibrate the detector for accurately scaling the measurements of trace elements.
    Type: Grant
    Filed: November 14, 1985
    Date of Patent: August 25, 1987
    Assignee: UTI Instrument Co.
    Inventors: Kuo-Chin Lin, Frederick P. Pickett