Patents Assigned to UTI Instrument Company
  • Electron impact ion source for trace analysis
    Patent number: 4579144
    Abstract: An apparatus is disclosed for analyzing trace elements in a gas sample. An unique feedback system is provided for accurately regulating and sensing the pressure supplied to the ion chamber of the device. The feedback system is capable of compensating for a wide range of input gas pressures. The apparatus also includes an improved closed ion source which is resistant to corrosion and aids in the reduction of noise. In addition, a method is disclosed to calibrate the detector for accurately scaling the measurements of trace elements.
    Type: Grant
    Filed: March 4, 1983
    Date of Patent: April 1, 1986
    Assignee: UTI Instrument Company
    Inventors: Kuo-Chin Lin, Fredrick P. Pickett