Abstract: A system for remotely controlling microscopic machinery and a method thereof are provided. The system includes at least one local device and a remote host for sending a control command thereto. A microslide is placed on a microscopic camera device in the local device, and the microscopic camera device captures an image of the microslide according to a capture command in the control command. The local device transmits the image to the remote host in a video format. A motorized stage moves to a next preset position according to a movement command in the control command to capture another image of the microslide. The steps of capturing and transmitting the image and the step of moving are repeated until the microslide is captured completely. The invention can solve the problem of time delay when the image captured by the remote control microscopic camera device is displayed.

Abstract: A system and a method for determining characteristic cells based on image recognition. In the method, a scanning device capturing a full image of the microslide; a host selecting images that comprise stained blocks from the full image; the host sequentially performing image recognition to recognize stained cells of the images, and determining whether the stained cells comprise the characteristic cells with an AI model; and selecting interested images from the images that comprise the characteristic cells, transforming the coordinate system of the interested images into the original coordinate system of the full image, and employing the scanning device to capture the interested images along the Z axis of the original coordinate system of the full image, thereby obtaining and outputting sets of pictures. The present invention can quickly determine whether there are characteristic cells in the tissue under test, so as to provide a diagnostic reference for doctors.

Abstract: A system and a method for cell statistics based on image recognition is disclosed. A microscope captures the full image of a microslide, selects an interest region from the full image, and divides the region into sub-regions. A camera scans and transits the sub-regions to a host. The host performs image recognition on the scanned images to recognize various cells, and accumulates the number of the various cells in each of the scanned images to obtain a cell ratio of each type of the cells. When the number is accumulated and a difference among the cell ratios of the N consecutive scanned images is less than a preset value, the host stops scanning the remains of the sub-regions and outputs the cell ratio of each type of the presently-accumulated cells. The method can obtain various cell ratios of tissue samples for diagnosis.

Abstract: A system for facilitating medical image interpretation includes a processing unit and a display control unit. The processing unit includes a location information module generating a reference location indicator, and a feature marking module generating indication markers. The display control unit is in signal connection with the processing unit and a display device. The display control unit includes an image displaying module controlling the display device to display tissue images, and an auxiliary information displaying module controlling the display device to display, for each of the tissue images displayed by the display device, the reference location indicator and the indication markers together on the tissue image.

Abstract: An image stitching method is proposed to include: A) acquiring a plurality of segment images for a target scene, each of the segment images containing a part of a target scene; B) for two adjacent segment images, which are two of the segment images that have overlapping fields of view, comparing the two adjacent segment images to determine a stitching position for the two adjacent segment images from a common part of the overlapping fields of view; and C) stitching the two adjacent images together based on the stitching position thus determined.

Abstract: A method for determining wire regions of a circuit includes steps of: obtaining an original image containing multiple stick regions; processing the original image to obtain a first processed image containing multiple line segments; grouping the line segments into multiple groups corresponding respectively to the stick regions; generating a second processed image including multiple complete lines corresponding respectively to the groups; and generating a third processed image including multiple extended lines by extending the complete lines; and determining, for each of the extended lines in the third processed image, a rectangular region based on a stick region in the original image corresponding thereto.

Abstract: A method for constructing an image includes: defining a foreground area associated with an object in an original image; identifying a plurality of contour points defining a contour of the object; for each of the contour points, obtaining a reference contour point set that includes at least one reference contour point on each of two sides of the contour point; obtaining a plurality of characteristic lines, each associated with the reference contour point set and defined by an end point obtained from the contour points; and aligning the end points on one side to form a straight edge and making the characteristic lines adjoin each other side by side, so as to construct a reconstructed image.

Abstract: A method for inspecting a semiconductor element includes steps of: a) providing an inspection apparatus including a supporting unit that includes a central seat and a plurality of positioning plates, and a camera unit that includes a first image capture device; b) positioning the semiconductor element onto the positioning plates; c) capturing a first bottom image of the semiconductor element; d) generating relative movement between the semiconductor element and the positioning plates; e) capturing a second bottom image of the semiconductor element; and f) synthesizing the first bottom image and the second bottom image to obtain a complete bottom image of the semiconductor element.