Abstract: A data center testing device provides field technicians with resources to support multiple aspects of data center testing. The data center testing device includes multiple, integrated and removably connectable modules such as a base module, a user interface module, a testing module, and a battery module. The data center testing device may include a processor, a memory to store machine readable instructions executable by the processor to perform data center testing, an input/output (I/O) device comprising a display, a first connector port assembly comprising a first connection port and a second connection port, and a second connector port assembly comprising a third connection port and a fourth connection port.

Abstract: A composition includes magnetic particles having a median particle size ranging from about 10 to about 30 microns; and reflective particles having a median particle size ranging from about 1 to about 9 microns, wherein the reflective particles have a lightness at least 10 points higher than the lightness of the magnetic particles. A method of making the composition is also disclosed.

Abstract: In some implementations, a device may selectively illuminate, via a lighting module of the device, one or more fibers in a fiber optic cable using an illumination pattern. The device may detect, via a detection module of the device, illuminated fibers associated with the fiber optic cable based on the illumination pattern. The device may output, via the detection module of the device, information regarding the illuminated fibers. The device may generate, via one or more processors of the device, a report, based on the information, indicating a fiber mapping between the one or more fibers that were selectively illuminated via the lighting module and the illuminated fibers detected via the detection module.

Abstract: A composition including a dual cavity color shirting pigment and a single cavity color shifting pigment is disclosed. A method of making the composition is also disclosed.

Abstract: A testing device may receive, from a phase shift matrix (PSM), a signal pattern associated with a plurality of antenna ports of a base station. The testing device may obtain data associated with the signal pattern and may identify, based on the data, a plurality of null directions associated with the signal pattern. The testing device may, for each null direction of the plurality of null directions: identify, based on the data, a measured amplitude associated with the null direction; determine, based on the measured amplitude, an estimated phase associated with the null direction; and determine, based on the measured amplitude and the estimated phase, an estimated in-phase amplitude associated with the null direction. The testing device may thereby determine error correction information associated with the plurality of null directions. The testing device may provide the error correction information, such as to enable calibration of the PSM.

Abstract: A method of printing a toner, including: rotating a cylinder having a printing plate with a fixed pattern; transferring a toner from a vessel onto the fixed pattern of the printing plate, in which the toner includes a pigment with a metallic reflective layer; and transferring the toner onto a substrate; in which the fixed pattern defines select portions of an image; and in which the toner correlates to the selected portions of the image is disclosed.

Abstract: A test instrument connectable to a cable television (CATV) network to provide a high resolution time domain reflectometry (TDR) in a fault location measurement is disclosed. The test instrument may have a port connectable to a test point in the CATV network. The test instrument may also have a processing circuit to perform a calibration measurement and a fault location measurement by, for the calibration measurement, transmitting frequency-chirped probe pulses into a closed calibration circuit within the test instrument, and receiving return signals at an analog-digital converter in the test instrument. The processing circuit may also resample the calibration measurement and the fault location measurement at a high sampling rate, cross-correlate the fault location with the calibration measurement to generate a cross-correlation TDR waveform, and generate a new TDR waveform using a refinement processing technique to remove echoes from the cross-correlation TDR waveform.

Abstract: An optical device may include a light shaping optical element. The light shaping optical element may include a substrate having a shear modulus greater than 15 GPa. The light shaping optical element may include a film chemically bonded to the substrate by a chemical bonding layer having a thickness in a range of 0.1 µm and 20 µm. The film may include a polymer having a refractive index greater than 1.5. A surface, of the film, may include a plurality of features configured to interact with light. The film may have a thickness of greater than 15 µm.

Abstract: A method may include cutting a plurality of grooves partially through a thickness of a wafer substrate, where the plurality of grooves have a first width. The method may include applying an optical coating layer on the wafer substrate and over the plurality of grooves to obtain a wafer structure, where dicing streets for the wafer structure align with the plurality of grooves. The method may include dicing the wafer structure along the dicing streets using dicing cuts having a second width less than the first width.

Abstract: An optical device may include a substrate having a first surface, a second surface opposite the first surface, and a stepped edge extending between the first surface and the second surface, where the stepped edge defines a step surface. The optical device may include a niobium-based optical coating layer disposed on the first surface of the substrate. The niobium-based optical coating layer may extend over the step surface of the stepped edge.

Abstract: According to examples, a test instrument may include a radio frequency (RF) receiver to receive RF signals across a range of frequencies, a persistent spectrum analyzer to determine signal strengths of the RF signals across the range of frequencies, and a processing circuit. The processing circuit may determine respective hit rates of the RF signals from the determined signal strengths of the RF signals, detect that a certain RF signal of the RF signals is an interference signal based on the respective hit rates of the RF signals, and output the frequency of the detected interference signal. The use of the hit rates may enable identification of interference signals have relatively low signal power levels.

Abstract: The technology disclosed teaches a system and methods for end-to-end self-calibration of a channel emulator, wherein the channel emulator includes at least one channel emulator signal chain and at least one integrated parallel calibration signal chain. The channel emulator signal chain further includes an input signal, a first signal conditioner, a first analog-to-digital converter, a baseband processor, second signal conditioner, and an output. The integrated parallel calibration signal chain further includes a sequence generator, wherein the sequence generator is configured to generate a pseudo-random sequence upon which a calibration analysis signal is overlayed. On the supplying side, the sequence generator is coupled to a second digital-to-analog converter for supplying the calibration analysis signal to be processed by the channel emulator signal chain. On the evaluating side, the sequence generator is coupled to a comparator for evaluating results of the processed calibration analysis signal.

Abstract: An device edge may receive a machine learning model, and may receive data from an edge device associated with a RAN. The device edge may process the data, with the machine learning model, to generate edge analytic data associated with the edge device, and may process the edge analytic data, with the machine learning model, to detect a problem or to predict an issue associated with the edge device or a RAN device associated with the edge device. The device edge may provide particular edge analytic data associated with the problem or the issue to a cloud-computing system, and may perform one or more actions based on the problem or the issue associated with the edge device or the RAN device.

Abstract: A device may receive a geolocation estimation model and geolocation input data identifying geolocations. The device may process one or more sets of the geolocation input data, with a quality evaluator model, to generate one or more quality evaluation metrics. The device may modify the geolocation estimation model based on the one or more quality evaluation metrics.

Abstract: In some implementations, a device may obtain information associated with one or more targets, wherein the information associated with the one or more targets includes sensing information and a communication performance control parameter. The device may determine a sensing beampattern based at least in part on the information associated with the one or more targets. The device may determine a target sensing autocorrelation matrix for the sensing beampattern. The device may identify a candidate sensing autocorrelation matrix for a joint communication and sensing transmission based at least in part on the target sensing autocorrelation matrix. The device may determine a target sensing precoder based at least in part on the candidate sensing autocorrelation matrix. The device may generate a joint communication and sensing precoder based at least in part on the target sensing precoder and the communication performance control parameter.

Abstract: Methods and systems for over the air channel analysis through artificial intelligence (AI)/machine learning (ML) aided pattern recognition are provided. A shape of a signal (e.g., control signal) may be detected through image analysis using AI/ML and technology of signal in a channel of interest may be determined from the shape. Next, the control channel (SSB, SIB1) may be determined based on period. A user (e.g., a technician) may be provided with center frequency and bandwidth for LTE or SSB, SIB1 for NR to assist with diagnosis and maintenance of the corresponding channel. Furthermore, channel analysis (e.g., EVM, SNR, time error) may be performed without demodulation and provided to the user. Moreover, massive MIMO performance may also be measured based on power difference between broadcast beam and user beam for data throughput evaluation.

Abstract: An optical assembly includes a housing, and an optical filter and an optical compensator disposed within the housing. The optical filter is oriented at a first non-zero angle in a first tilt direction with respect to an optical axis of the optical assembly. The optical compensator is oriented at a second non-zero angle in a second tilt direction with respect to the normal of the optical axis of the optical assembly. The optical filter is configured to pass, to the optical compensator, a portion of an optical beam that impinges on the optical filter along an optical axis of the optical assembly, such that the portion of the optical beam is offset from the optical axis. The optical compensator is configured to cause the portion of the optical beam to propagate out of the optical assembly along the optical axis of the optical assembly (or with a minimized offset).

Abstract: An optical device may comprise an array of sensor elements that includes a plurality of pixels and a multispectral filter disposed on the array of sensor elements. The multispectral filter may be configured to pass a first transmission percentage of light of a particular spectral range to a first set of pixels of the plurality of pixels and pass a second transmission percentage of light of the particular spectral range to a second set of pixels of the plurality of pixels.

Abstract: According to examples, an optical system may include optical components including an objective lens, an imager, and a controller. The controller may cause a first conjugate plane to be formed at a first location within the optical components, in which the imager is to capture an image of the first location at the first conjugate plane, and may receive the captured image of the first location at the first conjugate plane from the imager. The controller may also cause a second conjugate plane to be formed at a second location within the optical components, in which the imager is to capture an image of the second location at the second conjugate plane, and receive the captured image of the second optical component at the conjugate plane from the imager. The controller may inspect the images to determine whether there are any potential issues with the optical components.

Abstract: An article includes a first organic layer and a second organic layer each with an interior embossed surface; and an embossed reflector layer adjacent to the interior embossed surface of the first organic layer and adjacent to the interior embossed surface of the second organic layer. A method of making an article is also disclosed.