Patents Assigned to Virtek Vision International Inc.
  • Publication number: 20250093275
    Abstract: An inspection system includes an inspection controller that is electronically connected to a first camera and a second camera, each of which is aligned to cooperatively examine a surface of an object. The first camera defines the first field of view of the object and the second camera defines a second field of view of the object with the first field of view and the second field of view encompassing different areas of the surface of the object. The first camera includes a first clock, and the second camera includes a second clock. The first camera generates a plurality of first images of the object defined by the first field of view and the second camera generates a plurality of second images of the object defined by the second field of view.
    Type: Application
    Filed: September 19, 2024
    Publication date: March 20, 2025
    Applicant: VIRTEK VISION INTERNATIONAL INC.
    Inventors: Ahmed Elhossini, Mehrdad Bakhtiari, Daljit Josh
  • Publication number: 20250095196
    Abstract: A system for determining geometric disposition of an object within a coordinate system includes a processor and a sensor array. The sensor array includes a plurality of sensors oriented to scan a first edge and a second edge of an object for identifying a disposition of the first edge and the second edge within a coordinate system. The sensor array is electronically connected to the processor for signaling the identified disposition of the first edge and the second edge of the object within the coordinate system. The processor is programmed to calculate a location of an intersecting point of the first edge and the second edge. The processor calculates disposition of the object within the coordinate system from the calculated location of the of the intersecting point.
    Type: Application
    Filed: September 19, 2024
    Publication date: March 20, 2025
    Applicant: VIRTEK VISION INTERNATIONAL INC
    Inventors: Ahmed Elhossini, Mehrdad Bakhtiari
  • Patent number: 12025442
    Abstract: A method and system for controlling projection of optical indicators on a worksurface is disclosed. A projection device for projecting a first optical indicator and a second optical indicator onto a worksurface is provided. A measurement system monitors a work area in which the worksurface is disposed. The measurement system locates a control object within the work area and identifies a marker disposed on the control object. The measurement system monitors a first disposition and a second disposition of the control object. The projection device projects the first optical indicator onto the worksurface and the projection device projects the second optical indicator onto the worksurface in response to manipulation of the control object between the first disposition and the second disposition as detected by said measurement system.
    Type: Grant
    Filed: February 15, 2023
    Date of Patent: July 2, 2024
    Assignee: Virtek Vision International Inc.
    Inventor: Kurt D. Rueb
  • Patent number: 12028504
    Abstract: A first projection device includes a first laser projector and a first measurement system. A second projection device includes a second laser projector and a second measurement system. The first projection device and the second projection device is interconnected with a controller. The controller is programmed with computer aided design data representative of a large scale work area and coordinates electronic interaction between the first projection device and the second projection device. The first projection device projects a first indicia that is detectable by the second measurement system and the second projection device projects a second indicia that is detectable by the first measurement system. The controller is adapted for determining relative position within three-dimensional coordinate system of the first projection device to the second projection device from the first indicia detected by the second measurement system and the second indicia detected by the first measurement system.
    Type: Grant
    Filed: February 18, 2022
    Date of Patent: July 2, 2024
    Assignee: Virtek Vision International, Inc.
    Inventor: Kurt D. Rueb
  • Patent number: 11828711
    Abstract: A method of identifying an item on a surface of a workpiece is disclosed. An optical device identifies an item on the surface of a workpiece. An item identification system includes a light projector and a photogrammetry system. One of the light projector and the photogrammetry system generates a three-dimensional coordinate system within the work cell. One of the light projector and the photogrammetry system identifies a location of the surface of the workpiece within the three-dimensional coordinates system. The controller calculates geometric location of the item on the surface of the work piece in the three-dimensional coordinate system as identified by the optical device. The controller signals the light projector to project a beam of light onto the surface of the workpiece identifying a disposition of the item disposed upon the surface of the workpiece.
    Type: Grant
    Filed: October 8, 2021
    Date of Patent: November 28, 2023
    Assignee: VIRTEK VISION INTERNATIONAL INC
    Inventors: Kurt D. Rueb, Jeff Erbrecht, Beth McAndless, Vincent Tran
  • Patent number: 11828596
    Abstract: A system and method for aligning projection of an optical indicia on a surface of a large object is disclosed. A reference is disposed in proximity to the object. The reference includes a plurality of markers spaced at intermittent locations. A projection system projects optical indicia onto the surface of the object. A detection system detects the markers disposed upon the reference and signals an image of the markers to a processor for the processor to register a location of the projection system relative to the reference. The reference is aligned with a feature disposed upon the object enabling registration of the markers to the object. A location of the projection system relative to the object is established enabling the projection system to project the optical indicia onto the object to a predetermined location.
    Type: Grant
    Filed: May 2, 2022
    Date of Patent: November 28, 2023
    Assignee: VIRTEK VISION INTERNATIONAL INC
    Inventors: Kurt D. Rueb, Jeff Erbrecht, Marc Cameron, Elizabeth McAndless
  • Publication number: 20230334653
    Abstract: A system for identifying accurate assembly of a component to a workpiece is disclosed. The system includes a light source for projecting light indicia onto the component assembled to the workpiece. A controller includes an artificial intelligence (AI) element defining a machine learning model that establishes a convoluted neural network trained by stored images of light indicia projected onto the component assembled to the workpiece. An imager includes an image sensor system for imaging the workpiece and signaling a current image of the workpiece to the controller. The machine learning model directs inspection of the workpiece to the light indicia imaged by said imager. The AI element determines disposition of the component disposed upon the workpiece through the neural network identifying distortions of the light indicia in the current image.
    Type: Application
    Filed: April 12, 2023
    Publication date: October 19, 2023
    Applicant: VIRTEK VISION INTERNATIONAL INC
    Inventors: AHMED ELHOSSINI, DAVID PAUL SMITH, MEHRDAD BAKHTIARI
  • Publication number: 20230333028
    Abstract: A system identifying an area of interest of an inspection surface is disclosed. A controller includes a machine learning model trained using stored images defining an area of interest on the inspection surface. A laser projector for projecting laser indicia onto the inspection surface is spatially located relative to the inspection surface enabling the laser projector to project the laser indicia onto the area of interest. An imager includes an image sensor system generates a current image of the inspection surface and signals the current image to the controller. The machine learning model is directed to the area of interest of the current image as identified by the laser indicia and the machine learning model implementing the neural network to inspect the current image of the area of interest as defined by the laser indicia enabling localized inspection of the inspection surface.
    Type: Application
    Filed: December 22, 2022
    Publication date: October 19, 2023
    Applicant: VIRTEK VISION INTERNATIONAL INC
    Inventors: AHMED ELHOSSINI, DAVID PAUL SMITH
  • Publication number: 20230194259
    Abstract: A method and system for controlling projection of optical indicators on a worksurface is disclosed. A projection device for projecting a first optical indicator and a second optical indicator onto a worksurface is provided. A measurement system monitors a work area in which the worksurface is disposed. The measurement system locates a control object within the work area and identifies a marker disposed on the control object. The measurement system monitors a first disposition and a second disposition of the control object. The projection device projects the first optical indicator onto the worksurface and the projection device projects the second optical indicator onto the worksurface in response to manipulation of the control object between the first disposition and the second disposition as detected by said measurement system.
    Type: Application
    Filed: February 15, 2023
    Publication date: June 22, 2023
    Applicant: VIRTEK VISION INTERNATIONAL INC
    Inventor: Kurt D. Rueb
  • Patent number: 11656072
    Abstract: A method for validating the placement of pieces in an assembly task by scanning a coherent light source, such as a laser, over a surface and characterizing the detected interference speckle pattern to discriminate the position of the placed piece from the surface on which the piece is placed. This discrimination is possible even if the characteristic features of the piece and background are smaller than the resolution of the scanning system. In addition, characteristics of the piece, such as the orientation of fibers in the material, may be sensed by classification of the associated speckle response.
    Type: Grant
    Filed: July 1, 2021
    Date of Patent: May 23, 2023
    Assignee: VIRTEK VISION INTERNATIONAL INC.
    Inventor: Kurt D Rueb
  • Publication number: 20220349709
    Abstract: A system and method for aligning projection of an optical indicia on a surface of a large object is disclosed. A reference is disposed in proximity to the object. The reference includes a plurality of markers spaced at intermittent locations. A projection system projects optical indicia onto the surface of the object. A detection system detects the markers disposed upon the reference and signals an image of the markers to a processor for the processor to register a location of the projection system relative to the reference. The reference is aligned with a feature disposed upon the object enabling registration of the markers to the object. A location of the projection system relative to the object is established enabling the projection system to project the optical indicia onto the object to a predetermined location.
    Type: Application
    Filed: May 2, 2022
    Publication date: November 3, 2022
    Applicant: VIRTEK VISION INTERNATIONAL INC.
    Inventors: Kurt D. Rueb, Jeff Erbrecht, Marc Cameron, Elizabeth McAndless
  • Publication number: 20220272314
    Abstract: A first projection device includes a first laser projector and a first measurement system. A second projection device includes a second laser projector and a second measurement system. The first projection device and the second projection device is interconnected with a controller. The controller is programmed with computer aided design data representative of a large scale work area and coordinates electronic interaction between the first projection device and the second projection device. The first projection device projects a first indicia that is detectable by the second measurement system and the second projection device projects a second indicia that is detectable by the first measurement system. The controller is adapted for determining relative position within three-dimensional coordinate system of the first projection device to the second projection device from the first indicia detected by the second measurement system and the second indicia detected by the first measurement system.
    Type: Application
    Filed: February 18, 2022
    Publication date: August 25, 2022
    Applicant: VIRTEK VISION INTERNATIONAL, INC.
    Inventor: Kurt D. Rueb
  • Patent number: 11402627
    Abstract: A laser projection system for projecting laser image onto a work surface providing optimized laser energy includes laser source and an electronic circuit for modulating an output power level. A galvanometer assembly includes a scanning mirror operated a mirror control circuit for redirecting the laser beam onto the work surface along a scanning path for generating the laser image. The galvanometer assembly is electronically connected to the electronic circuit for signaling an angular velocity of the scanning mirror to the electronic circuit. A controller includes a scanning path input module for generating a simulation of the angular velocity of the scanning mirror along the scanning path for estimating a concentration of laser energy along areas of the scanning path of the laser beam. The electronic circuit modulates energy concentration of the laser beam in response to the estimated concentration of laser energy and the angular velocity of the scanning mirror.
    Type: Grant
    Filed: November 15, 2019
    Date of Patent: August 2, 2022
    Assignee: VIRTEK VISION INTERNATIONAL INC.
    Inventor: Kurt D. Rueb
  • Patent number: 11345014
    Abstract: A method of verifying placement of a piece on a work surface is disclosed. An imaging device and an illumination system are electronically interconnected with a computer. The illumination system projects indicia onto a work surface for indicating a location for placement of a piece on the work surface. An indicator is provided to the piece that includes light emission displaying fluorescent wavelengths when illuminated for distinguishing the piece form the work surface. The piece is placed upon the work surface at a location indicated by the laser indicia. The illumination system illuminates the piece presenting a visible contrast between the piece and the work surface enabling the imaging device to distinguish the piece from the work surface. The imaging device signals the controller a location of the piece for the controller to verify accurate placement of the piece.
    Type: Grant
    Filed: February 14, 2020
    Date of Patent: May 31, 2022
    Assignee: VIRTEK VISION INTERNATIONAL INC
    Inventor: Kurt D. Rueb
  • Patent number: 9442075
    Abstract: A camera assembly for generating a high resolution image of an area of interest on a workpiece includes a sensor array and an optical lens that focuses light reflected from the workpiece onto the sensor array. The sensor array is inclined relative to an optical axis defined by the optical lens disposed in a fixed position relative to the optical lens. A galvanometer driven mirror assembly directs a field of view of the optical lens toward the area of interest on the workpiece translating light reflected from the area of interest of the workpiece onto the sensor array. The inclination of the sensor array provides varying degrees of resolution relative to a distance of the workpiece area of interest from the camera assembly enabling the camera assembly to generate high resolution images at varying distances from the camera assembly without adjusting the optical lens relative to the sensor array.
    Type: Grant
    Filed: March 7, 2014
    Date of Patent: September 13, 2016
    Assignee: VIRTEK VISION INTERNATIONAL INC.
    Inventor: Kurt D. Rueb
  • Patent number: 9245062
    Abstract: A method of projecting a template on a workpiece provides a measurement system for determining a location of a workpiece and a laser projector for projecting a laser template. A feature on the workpiece having geometric significance is identified. A physical location of the feature in a three dimensional coordinate system is determined and compared to a theoretical location of the feature on computer model of the workpiece. A template correlated to the feature is selected. The projection of the template onto the workpiece relative to the feature is optimized by correlating alignment of the physical location of the feature with the computer model of the feature. The template is projected onto the workpiece based upon the optimized projection for directing work to be performed on the workpiece.
    Type: Grant
    Filed: December 19, 2012
    Date of Patent: January 26, 2016
    Assignee: Virtek Vision International Inc.
    Inventor: Kurt D. Rueb
  • Patent number: 9200899
    Abstract: A laser projection system for projecting an image on a workpiece includes a photogrammetry assembly and a laser projector, each communicating with a computer. The photogrammetry assembly includes a first camera for scanning the workpiece, and the laser projector projects a laser image to arbitrary locations. Light is conveyed from the direction of the workpiece to the photogrammetry assembly. The photogrammetry assembly signals the coordinates light conveyed toward the photogrammetry assembly to the computer with the computer being programmable for determining a geometric location of the laser image. The computer establishes a geometric correlation between the photogrammetry assembly, the laser projector, and the workpiece for realigning the laser image to a corrected geometric location relative to the workpiece.
    Type: Grant
    Filed: October 16, 2012
    Date of Patent: December 1, 2015
    Assignee: Virtek Vision International, Inc.
    Inventor: Kurt D. Rueb
  • Publication number: 20140253719
    Abstract: A camera assembly for generating a high resolution image of an area of interest on a workpiece includes a sensor array and an optical lens that focuses light reflected from the workpiece onto the sensor array. The sensor array is inclined relative to an optical axis defined by the optical lens disposed in a fixed position relative to the optical lens. A galvanometer driven minor assembly directs a field of view of the optical lens toward the area of interest on the workpiece translating light reflected from the area of interest of the workpiece onto the sensor array. The inclination of the sensor array provides varying degrees of resolution relative to a distance of the workpiece area of interest from the camera assembly enabling the camera assembly to generate high resolution images at varying distances from the camera assembly without adjusting the optical lens relative to the sensor array.
    Type: Application
    Filed: March 7, 2014
    Publication date: September 11, 2014
    Applicant: Virtek Vision International Inc.
    Inventor: Kurt D. Rueb
  • Publication number: 20140210996
    Abstract: A method of accurately projecting a laser image pattern on a work surface and continuously compensating for relative dynamic movement between the laser and the work surface, including establishing a position of the camera in three dimensions relative to the work surface by locating the targets in the camera image, establishing a position of the laser relative to the work surface utilizing the fixed position of the laser relative to the camera, and using a computer to continuously adjust the rotation of the laser projector mirrors in response to dynamic movement of the laser projector relative to the work surface as determined by the camera. In one embodiment, the computer continuously tracks at least two prior locations of the laser projector relative to the work surface and predicts the next location of the laser, compensating for movement of the laser relative to the work surface.
    Type: Application
    Filed: January 22, 2014
    Publication date: July 31, 2014
    Applicant: VIRTEK VISION INTERNATIONAL INC.
    Inventor: Kurt D. Rueb
  • Publication number: 20130253682
    Abstract: A method of projecting a template on a workpiece provides a measurement system for determining a location of a workpiece and a laser projector for projecting a laser template. A feature on the workpiece having geometric significance is identified. A physical location of the feature in a three dimensional coordinate system is determined and compared to a theoretical location of the feature on computer model of the workpiece. A template correlated to the feature is selected. The projection of the template onto the workpiece relative to the feature is optimized by correlating alignment of the physical location of the feature with the computer model of the feature. The template is projected onto the workpiece based upon the optimized projection for directing work to be performed on the workpiece.
    Type: Application
    Filed: December 19, 2012
    Publication date: September 26, 2013
    Applicant: VIRTEK VISION INTERNATIONAL, INC.
    Inventor: Kurt D. Rueb