Patents Assigned to VisiTech International, Ltd.
  • Patent number: 7221503
    Abstract: According to a first embodiment the invention provides, for achieving fast multi-wavelength scanning in an acousto-optical deflector based confocal scanning microscope, dynamically adjusting an optical path of said an acousto-optical deflector based confocal microscope by mechanical means in accordance with a selected wavelength of a laser light beam, to compensate for astigmatism and collimation changes due to the change in input beam wavelength and modifying detected images of an object by electronic means to maintain alignment of the scan lines of the image at all wavelengths. According to a second embodiment the invention provides, for achieving fast multi-wavelength scanning in an acousto-optical deflector based laser confocal scanning microscope, dynamically adjusting drive parameters of the acousto-optical deflector in accordance with the selected wavelength of the input laser light beams, to maintain alignment of the scan lines of the image at all wavelengths.
    Type: Grant
    Filed: April 8, 2004
    Date of Patent: May 22, 2007
    Assignee: VisiTech International, Ltd.
    Inventors: Colin Eberhardt, Jafer Sheblee, Ken Bell
  • Patent number: 6631029
    Abstract: An optical image separation system, connected to a confocal image output port of a Nipkow disk type confocal scanner, wherein light returned from a sample and emitted from the confocal image output port is separated into a plurality of different wavelen regions, respectively, so that a plurality of samples emitting different wavelenghts are concurrently detected.
    Type: Grant
    Filed: March 5, 2001
    Date of Patent: October 7, 2003
    Assignees: Yokogawa Electric Corporation, Visitech International, Ltd.
    Inventors: Shinichirou Kawamura, Hideomi Negishi, Nobuhiro Tomosada, Shinya Ootsuki, Jafer Shelbee, Kenneth Bell