Abstract: A system and a method for measuring the profile of a part. The measurement system includes a sensor with a probe having at least one degree of freedom, and a first reference element fastened to the probe. The sensor is arranged so that the probe is able to follow the internal or external contour of the part while the first reference element is outside the part. An imaging device is adapted to capture an image representing at least a portion of the outside of the part and the first reference element. Thus, the first reference element serves as a reference element for the position of the probe relative to the reference system that is the part.