Patents Assigned to Wavecrest Corporation
-
Publication number: 20090045863Abstract: A method of preparing a signal for measurement includes receiving the signal and selecting a first edge and a second edge within the signal. The method also includes delivering the first edge to a time interval measurement system after expiration of a first delay period and delivering the second edge to a time interval measurement system after expiration of a second delay period.Type: ApplicationFiled: August 17, 2007Publication date: February 19, 2009Applicant: Wavecrest CorporationInventors: Steve McCoy, John David Hamre
-
Publication number: 20080043583Abstract: A system, method, and apparatus for obtaining a record of logic level transitions within a signal, and for accurately determining a voltage-time pair exhibited by the signal. To achieve these ends, a front-end device may be mated to a real-time sampling system, such as an oscilloscope. The front-end device effectively permits the oscilloscope to observe signals exhibiting greater data rates than otherwise possible without the front-end device.Type: ApplicationFiled: October 23, 2007Publication date: February 21, 2008Applicant: Wavecrest CorporationInventors: John HAMRE, Peng Li, Steven Fraasch
-
Patent number: 7305312Abstract: A system, method, and apparatus for obtaining a record of logic level transitions within a signal, and for accurately determining a voltage-time pair exhibited by the signal. To achieve these ends, a front-end device may be mated to a real-time sampling system, such as an oscilloscope. The front-end device effectively permits the oscilloscope to observe signals exhibiting greater data rates than otherwise possible without the front-end device.Type: GrantFiled: January 10, 2006Date of Patent: December 4, 2007Assignee: Wavecrest CorporationInventors: John David Hamre, Peng Li, Steven J. Fraasch
-
Patent number: 7016805Abstract: A method, apparatus, and article of manufacture for analyzing a measurable distribution having random components and deterministic components. The method includes the steps of collecting data, constructing a probability density function based on the data such that the probability density function is a convolution of deterministic functions and random functions, constructing a probability density function based on a deterministic and random convolution model having three or more parameters wherein at least one of the parameters are unknown, and determining unknown parameters by using a deconvolution process.Type: GrantFiled: December 14, 2001Date of Patent: March 21, 2006Assignee: Wavecrest CorporationInventors: Jie Sun, Peng Li, Jan Brian Wilstrup
-
Publication number: 20050027477Abstract: A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.Type: ApplicationFiled: August 25, 2004Publication date: February 3, 2005Applicant: Wavecrest CorporationInventors: Peng Li, Ross Jessen, Jan Wilstrup, Dennis Petrich
-
Patent number: 6813589Abstract: A system for determining a response characteristic of an nth order linear system, such as a phase locked loop, is disclosed. An input signal is supplied to the linear system, and the system measures an output signal produced by the linear system. A variance record is constructed for a measurable quantity, such as jitter, extracted from the output signal. The response characteristic of the linear system is then obtained from the variance record. The response characteristic, such as the transfer function, noise processes, and/or power spectral density (PSD), may be found through a numerical or analytical solution to a mathematical relationship between a response function of the nth order linear system and the variance record.Type: GrantFiled: November 29, 2001Date of Patent: November 2, 2004Assignee: Wavecrest CorporationInventors: Mike Peng Li, Jan Brian Wilstrup
-
Patent number: 6799144Abstract: A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.Type: GrantFiled: June 27, 2001Date of Patent: September 28, 2004Assignee: Wavecrest CorporationInventors: Peng Li, Ross Adam Jessen, Jan Brian Wilstrup, Dennis Petrich
-
Publication number: 20040001194Abstract: A method and apparatus for measuring characteristics in an electromagnetic or optical system. A modulation signal is provided to a device under test to provide a first signal and to a reference device which provides a second signal, and a tine domain optical analyzer measures the transitions of the first signal and the transitions of the second signal to determine characteristics of the device under test. In one embodiment, the characteristics of the reference device are determined with a modulated light source having two or more known wavelengths that provides a first signal, and a second signal is provided to a reference device to create a third signal. A time domain optical analyzer measures the transitions of the first signal and the transitions of the third signal for two or more wavelengths to determine reference device signal delay time characteristics as a function of wavelength.Type: ApplicationFiled: October 21, 2002Publication date: January 1, 2004Applicant: Wavecrest CorporationInventors: Jan Brian Wilstrup, Peng Li
-
Publication number: 20030098696Abstract: A system for determining a response characteristic of an nth order linear system, such as a phase locked loop, is disclosed. An input signal is supplied to the linear system, and the system measures an output signal produced by the linear system. A variance record is constructed for a measurable quantity, such as jitter, extracted from the output signal. The response characteristic of the linear system is then obtained from the variance record. The response characteristic, such as the transfer function, noise processes, and/or power spectral density (PSD), may be found through a numerical or analytical solution to a mathematical relationship between a response function of the nth order linear system and the variance record.Type: ApplicationFiled: November 29, 2001Publication date: May 29, 2003Applicant: Wavecrest CorporationInventors: Mike Peng Li, Jan Brian Wilstrup
-
Patent number: 6449570Abstract: A system is disclosed for precisely measuring time intervals, used to either characterize or diminish noise components in repetitive waveforms. An interval timer generates a whole number count of cycles in combination with beginning and ending ramps capable of resolving fractions of a cycle, to accurately register the time interval. Selection logic can be implemented to time either single periods or spans of multiple consecutive periods of the waveforms. Multiple time measurements are arranged in sets, each set corresponding to a different span of “N” consecutive periods over a range of values for N. A variance of each set is generated, and an array of variance vs N provides a function having properties of an auto-correlation function. Instrument jitter can be reduced based on measurements of period spans rather than individual periods, and is reduced in proportion to the increasing size of the measured span.Type: GrantFiled: November 21, 2000Date of Patent: September 10, 2002Assignee: Wavecrest CorporationInventors: Jan B. Wilstrup, Dennis M. Petrich, Steven H. Ulsund, Christopher Kimsal, Mark J. Emineth
-
Publication number: 20020120420Abstract: A method, apparatus, and article of manufacture for separating the components of a jitter signal. The method includes the steps of obtaining measurements of the spans of a signal, generating variation measurements for each of the spans, transforming the variation estimates from a time domain to a frequency domain, and determining the random component and the periodic component of the jitter signal.Type: ApplicationFiled: October 25, 2001Publication date: August 29, 2002Applicant: WAVECREST CORPORATIONInventors: Jan B. Wilstrup, Dennis M. Petrich
-
Patent number: 6393088Abstract: An event counter circuit including an input signal coupled to a frequency divider circuit that can be cleared by an external signal, a multiplexer coupled to the divider circuit driven by an output edge and its inverse, and a counter circuit coupled to the multiplexer driven by outputs of the multiplexer.Type: GrantFiled: January 16, 2001Date of Patent: May 21, 2002Assignee: Wavecrest CorporationInventors: Mark J. Emineth, Steve McCoy, Jan Wilstrup, Chris Kimsal
-
Patent number: 6356850Abstract: A method, apparatus, and article of manufacture for separating the components of a jitter signal. The method includes the steps of obtaining measurements of the spans of a signal, generating variation measurements for each of the spans, transforming the variation estimates from a time domain to a frequency domain, and determining the random component and the periodic component of the jitter signal.Type: GrantFiled: January 29, 1999Date of Patent: March 12, 2002Assignee: Wavecrest CorporationInventors: Jan B. Wilstrup, Dennis M. Petrich
-
Publication number: 20010044704Abstract: A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.Type: ApplicationFiled: June 27, 2001Publication date: November 22, 2001Applicant: Wavecrest CorporationInventors: Peng Li, Ross Adam Jessen, Jan Brian Wilstrup, Dennis Petrich
-
Publication number: 20010028262Abstract: A linear ramp generating and control circuit finding particular applicability in a time interval measurement system. The linear ramp circuit includes a hold capacitor which may be linearly discharged during one operating mode of the circuit by coupling a constant current source to the capacitor. The voltage on the hold capacitor is linearly discharged away from a baseline voltage level to a data voltage level which is subsequently passed to an analog-to-digital converter of the time interval measurement system for further processing. The hold capacitor voltage is returned to the baseline voltage level during a recovery mode of circuit operation by a recovery or recharge network. The recharge network may include an active-feedback circuit which implements an approximately second-order voltage response to the hold capacitor during the recovery mode of operation.Type: ApplicationFiled: December 22, 2000Publication date: October 11, 2001Applicant: Wavecrest CorporationInventors: Christopher Kimsal, Jan B. Wilstrup
-
Patent number: 6298315Abstract: A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.Type: GrantFiled: December 11, 1998Date of Patent: October 2, 2001Assignee: Wavecrest CorporationInventors: Peng Li, Ross Adam Jessen, Jan Brian Wilstrup, Dennis Petrich
-
Patent number: 6194925Abstract: A linear ramp generating and control circuit finding particular applicability in a time interval measurement system. The linear ramp circuit includes a hold capacitor which may be linearly discharged during one operating mode of the circuit by coupling a constant current source to the capacitor. The voltage on the hold capacitor is linearly discharged away from a baseline voltage level to a data voltage level which is subsequently passed to an analog-to-digital converter of the time interval measurement system for further processing. The hold capacitor voltage is returned to the baseline voltage level during a recovery mode of circuit operation by a recovery or recharge network. The recharge network may include an active-feedback circuit which implements an approximately second-order voltage response to the hold capacitor during the recovery mode of operation.Type: GrantFiled: March 13, 1998Date of Patent: February 27, 2001Assignee: Wavecrest CorporationInventors: Christopher Kimsal, Jan B. Wilstrup
-
Patent number: 6185509Abstract: A system is disclosed for precisely measuring time intervals, used to either characterize or diminish noise components in repetitive waveforms. An interval timer generates a whole number count of cycles in combination with beginning and ending ramps capable of resolving fractions of a cycle, to accurately register the time interval. Selection logic can be implemented to time either single periods or spans of multiple consecutive periods of the waveforms. Multiple time measurements are arranged in sets, each set corresponding to a different span of “N” consecutive periods over a range of values for N. A variance of each set is generated, and an array of variance vs N provides a function having properties of an auto-correlation function. Instrument jitter can be reduced based on measurements of period spans rather than individual periods, and is reduced in proportion to the increasing size of the measured span.Type: GrantFiled: March 13, 1998Date of Patent: February 6, 2001Assignee: Wavecrest CorporationInventors: Jan B. Wilstrup, Dennis M. Petrich, Steven H. Ulsund, Christopher Kimsal, Mark J. Emineth