Abstract: A system and method for generating reflective dark field illumination in an imaging system that includes a set of elementary illuminators, each of the set of elementary illuminators including a light source, a lens assembly and an illuminator aperture; and a bright field/dark field (BD) lens. The set of elementary illuminators are positioned in a ring-like shape to direct light towards a port of the BD lens. Depending on an application of the imaging system, a lens assembly focal distance and a distance between a light source and a lens assembly are determined based on the application.
Abstract: A method and system for automated in-line inspection of optically transparent material is disclosed herein. The method includes illuminating a top and bottom surface of the optically transparent material with at least one sheet of light and then generating an image based on light that is received by an imaging device. The image that is generated may either be a bright field image or a dark field image.
Abstract: A method and apparatus for autofocussing an imaging device, such as an optical microscope, and dynamic focus tracking of the imaging device is disclosed herein. The apparatus includes a electrically tunable lens that is located within the apparatus such that auto-focussing can be achieved without disrupting or corrupting the image being generated or registered on the imaging device.
Abstract: The invention is directed at a method and system of detecting defects in a transparent media such as a piece of glass. The method comprises the steps of transmitting light from a light source towards the transparent media and then detecting defects in the transparent media by scanning the light as it is reflected or passes through the transparent media. The method and system may operate in any one of a dark field mode, a bright field mode for scanning or a bright field mode for inspecting.
Abstract: The invention is directed at a method and apparatus for auto-focusing an infinity corrected microscope. Light beams are directed and then converged towards a specimen of interest and at least one image is formed from the reflected light. The image, or images, are then reviewed and calibration measurements are retrieved from the image. These calibration measurement are then used to determine focusing measurements which are used to auto-focus the microscope.
Type:
Grant
Filed:
June 11, 2007
Date of Patent:
April 20, 2010
Assignee:
WDI Wise Device Inc.
Inventors:
Adam Weiss, Alexandre Obotnine, Andrew Lasinski