Patents Assigned to William R. W. Wick
  • Patent number: 5617645
    Abstract: The invention is a non-contact precision measurement system and a method of measuring using the system. The surface contour of an object is measured,utilizing non-contact components, such as lasers. A measurement unit traverses a linear positioner which is parallel to the object to be measured. Then deviations are measured from a baseline reference to determine any deviations in the positioner. The measurement unit also measures the distance between the positioner and the object to produce a distance profile which is adjusted in accordance with the deviations to determine a true surface profile. This system can also be used to measure both an upper and lower surface profile to determine a thickness or to align a plurality of objects in parallel.
    Type: Grant
    Filed: May 2, 1995
    Date of Patent: April 8, 1997
    Assignee: William R. W. Wick
    Inventors: William R. W. Wick, Pamela G. Wood