Abstract: A device for the contactless and nondestructive testing of a surface by measuring the infrared radiation thereof has one or more incoherent electromagnetic radiation sources (1) and a detector (14) arranged on a detection axis (9), wherein the radiation sources (1) are arranged at a radial distance from the detection axis (9), at a distance from a testing area (7). In this arrangement, a pulsed or intensity-modulated excitation radiation (2) can be generated by these radiation sources (1) and applied to the surface (6) to be tested in the testing area (7) at an inclination to the detection axis (9) in the testing area (7). The detection radiation emitted by a measuring area (8) of the surface (6) to be tested can be fed to the detector (14), wherein the detector (14) is arranged on the detection axis (9) further away spatially from the testing area (7) than the radiation sources (1).

Abstract: A device for the contactless and nondestructive testing of a surface by measuring the infrared radiation thereof has one or more incoherent electromagnetic radiation sources (1) and a detector (14) arranged on a detection axis (9), wherein the radiation sources (1) are arranged at a radial distance from the detection axis (9), at a distance from a testing area (7). In this arrangement, a pulsed or intensity-modulated excitation radiation (2) can be generated by these radiation sources (1) and applied to the surface (6) to be tested in the testing area (7) at an inclination to the detection axis (9) in the testing area (7). The detection radiation emitted by a measuring area (8) of the surface (6) to be tested can be fed to the detector (14), wherein the detector (14) is arranged on the detection axis (9) further away spatially from the testing area (7) than the radiation sources (1).

Abstract: A device for the contactless and nondestructive testing of a surface by measuring the infrared radiation thereof has one or more incoherent electromagnetic radiation sources (1) and a detector (14) arranged on a detection axis (9), wherein the radiation sources (1) are arranged at a radial distance from the detection axis (9), at a distance from a testing area (7). In this arrangement, a pulsed or intensity-modulated excitation radiation (2) can be generated by these radiation sources (1) and applied to the surface (6) to be tested in the testing area (7) at an inclination to the detection axis (9) in the testing area (7). The detection radiation emitted by a measuring area (8) of the surface (6) to be tested can be fed to the detector (14), wherein the detector (14) is arranged on the detection axis (9) further away spatially from the testing area (7) than the radiation sources (1).

Abstract: A device for the contactless and nondestructive testing of a surface by measuring the infrared radiation thereof has one or more incoherent electromagnetic radiation sources (1) and a detector (14) arranged on a detection axis (9), wherein the radiation sources (1) are arranged at a radial distance from the detection axis (9), at a distance from a testing area (7). In this arrangement, a pulsed or intensity-modulated excitation radiation (2) can be generated by these radiation sources (1) and applied to the surface (6) to be tested in the testing area (7) at an inclination to the detection axis (9) in the testing area (7). The detection radiation emitted by a measuring area (8) of the surface (6) to be tested can be fed to the detector (14), wherein the detector (14) is arranged on the detection axis (9) further away spatially from the testing area (7) than the radiation sources (1).