Patents Assigned to Wire Technologies, Inc.
  • Patent number: 5533382
    Abstract: An abrasion tester using an abrasive non-conductive strip moved along the first surface of a non-conductive material to be tested at a point of abrasion to abrade the material to be tested. The dielectric strength of the material to be tested and the abrasive strip at the point of abrasion between a first and second electrode is measured. The abrading process is stopped when a predetermined dielectric strength is measured. Determination is then made of acceptable abrasion resistance of the material to be tested as a function of the initiation and termination of abrading.
    Type: Grant
    Filed: June 6, 1995
    Date of Patent: July 9, 1996
    Assignee: Wire Technologies, Inc.
    Inventor: Thomas Clerkin