Patents Assigned to WITec GmbH
  • Publication number: 20150279616
    Abstract: A system uses number of analytical devices such as an electron microscope a Raman microscope, an ion beam column and a scanning probe microscope for sample analysis concurrent, consecutive or with the mutual correlation of the analysis performed by the different devices in the same sample area using the connection of the Raman microscope optical objective lens and objective manipulator, that significantly reduces time needed for analyzing by Raman microscope together with other devices and maintains high quality of the sensed signals comparable to stand alone analytical devices.
    Type: Application
    Filed: March 24, 2015
    Publication date: October 1, 2015
    Applicants: WITec GmbH, TESCAN ORSAY HOLDING, a.s.
    Inventors: Jaroslav Jiruse, Olaf Hollricher, Martin Hanicinec