Abstract: A method and a device are provided which enables a simple and fast Raman and/or fluorescence measurement even on uneven specimen surfaces; additionally, the invention should make it possible to confocally image a plane or a surface, in particular a surface of a specimen, i.e. with the aid of confocal microscopy.
Type:
Grant
Filed:
November 20, 2020
Date of Patent:
July 12, 2022
Assignee:
Witec Wissenschaftliche Instrumente und Technologie GmbH
Inventors:
Peter Spizig, Olaf Hollricher, Wolfram Ibach
Abstract: A method and a device are provided which enables a simple and fast Raman and/or fluorescence measurement even on uneven specimen surfaces; additionally, the invention should make it possible to confocally image a plane or a surface, in particular a surface of a specimen, i.e. with the aid of confocal microscopy.
Type:
Grant
Filed:
February 22, 2018
Date of Patent:
December 29, 2020
Assignee:
Witec Wissenschaftliche Instrumente und Technologie GmbH
Inventors:
Peter Spizig, Olaf Hollricher, Wolfram Ibach
Abstract: A device for imaging the surfaces of a sample having topography with the aid of confocal microscopy, in particular confocal Raman and/or fluorescence microscopy, comprising a first light source, in particular a laser light source for generating excitation radiation, in particular Raman radiation and/or fluorescence radiation and a second light source, wherein the first laser light source emits radiation in a first wavelength range and the second light source emits radiation in a second wavelength range, wherein the first wavelength range and the second wavelength range do not overlap.
Type:
Grant
Filed:
January 17, 2018
Date of Patent:
May 12, 2020
Assignee:
WITEC Wissenschaftliche Instrumente Und Technologie GMBH
Inventors:
Olaf Hollricher, Wolfram Ibach, Peter Spizig, Detlef Sanchen, Gerhard Volswinkler
Abstract: The invention relates to an apparatus and a method for imaging surface area of a sample having a surface topography with the aid of confocal microscopy, such as confocal Raman and/or fluorescence microscopy. The apparatus comprises a surface topography sensor that provides values for the surface topography. The surface topography values allow for the surface to be maintained in the confocal plane during scanning.
Type:
Grant
Filed:
April 13, 2011
Date of Patent:
February 13, 2018
Assignee:
WITEC Wissenschaftliche Instrumente Und Technologie GMBH
Inventors:
Peter Spizig, Wofram Ibach, Detlef Sanchen, Gerhard Volswinkler, Olaf Hollricher
Abstract: The invention relates to a method for creating the image of a sample surface to be analyzed, with a resolution which is better than 1 ?m laterally in relation to the sample surface and better than 100 nm vertically in relation to said surface. According to the invention, the surface is scanned on a point-by-point basis by a scanning probe, the distance between the scanning probe and the sample surface at each scanning point being periodically modulated, in such a way that a force-time curve of the probe is produced for this point. The force-time curve is recorded at each scanning point, digitized using an A/D converter, evaluated online in real-time and stored, together with the entire data stream, in a first area of a memory device.
Type:
Grant
Filed:
December 12, 2001
Date of Patent:
October 31, 2006
Assignee:
Witec Wissenschaftliche Instrumente und Technologie GmbH
Inventors:
Peter Spizig, Detlef Sanchen, Jörg Förstner, Joachim Koenen, Othmar Marti
Abstract: A process for the location-resolved simultaneous detection of the adhesion and friction as well as possibly of other material properties of a sample surface to be examined by means of a raster probe microscope comprising a raster probe. The raster probe and/or the sample with sample surface are moved until at a point of the sample surface to be examined the raster probe interacts in a determined manner with this surface. The raster probe and/or the sample are subjected to a vertical oscillation, and a first measuring signal characterized by the deformation of the raster probe is recorded. A second measuring signal characterizing the deformation of the raster probe is recorded, wherein the raster probe and/or the sample are subjected to a horizontal and/or vertical oscillation. From these two measuring signals the desired material properties are determined.
Type:
Grant
Filed:
January 4, 2000
Date of Patent:
April 19, 2005
Assignee:
Witec Wissenschaftliche Instrumente und Technologie GmbH
Inventors:
Hans-Ulrich Krotil, Thomas Stifter, Othmar Marti