Abstract: Provided is a contaminant analysis apparatus including a pretreatment sampler configured to collect and filter an effluent discharged through a discharge pipe to provide an analysis target sample, a sample introduction unit configured to receive the analysis target sample from the pretreatment sampler, a sample injection unit configured to selectively supply the analysis target sample supplied from the sample introduction unit, a sample analysis unit including an integrated analyzer configured to analyze ion components and heavy metal components of the analysis target sample which is supplied from the sample injection unit, and an analysis controller configured to control the sample introduction unit, the sample injection unit, and the sample analysis unit, wherein the sample introduction unit includes a first sample introduction unit including two or more first sample introduction unit syringe pumps and a second sample introduction unit including one or more second sample introduction unit syringe pumps.
Inventors:
Yeontae Kim, Jinhee Park, Joengseok Kim, Jinseop Lee, Bongkyun Jin, Eunju Park, Eungsun Lee, Hyekyoung Moon, Hyangbong Lee, Hyunyul Park, Seoungkyo Yoo
Abstract: Provided is a liquid chromatography apparatus for fast measuring, and more particularly, a liquid chromatography apparatus which includes a first column and a second column having different component separations for an interest component within a sample and makes components primarily separated in the first column be secondarily separated in the second column of a first channel unit before a switching valve is switched, makes the components primarily separated in the first column be continuously discharged through a second channel unit after the switching valve is switched, thereby improving the component separation and achieving the fast measuring.
Type:
Grant
Filed:
July 10, 2014
Date of Patent:
August 28, 2018
Assignee:
WITHTECH INC
Inventors:
Seoung-Kyo Yoo, Eung Sun Lee, Jin Yong Lee, Dae Hee Kim
Abstract: Provided are a multi sampling port monitoring apparatus for measuring a pollution level in a predetermined space and a monitoring method using the same. More particularly, provided are a multi sampling port monitoring apparatus capable of effectively monitoring a pollution level in a wide space by including a plurality of sampling ports so that air is sucked at several points in a space to be measured, measuring an average pollution level of the air sucked from the plurality of sampling ports, and allowing pollution levels of the air sucked from the sampling ports to be individually measured in the case in which the average pollution level is out of a predetermined range, and a monitoring method using the same.
Type:
Grant
Filed:
October 23, 2014
Date of Patent:
January 30, 2018
Assignee:
WITHTECH INC
Inventors:
Seoung-Kyo Yoo, Eung Sun Lee, Hyun Wook Lee
Abstract: Provided are a multi sampling port monitoring apparatus for measuring a pollution level in a predetermined space and a monitoring method using the same. More particularly, provided are a multi sampling port monitoring apparatus capable of effectively monitoring a pollution level in a wide space by including a plurality of sampling ports so that air is sucked at several points in a space to be measured, measuring an average pollution level of the air sucked from the plurality of sampling ports, and allowing pollution levels of the air sucked from the sampling ports to be individually measured in the case in which the average pollution level is out of a predetermined range, and a monitoring method using the same.
Type:
Application
Filed:
October 23, 2014
Publication date:
September 29, 2016
Applicant:
WITHTECH Inc.
Inventors:
Seoung-Kyo Yoo, Eung Sun Lee, Hyun Wook Lee