Patents Assigned to WITHTECH Inc.
  • Publication number: 20160282235
    Abstract: Provided are a multi sampling port monitoring apparatus for measuring a pollution level in a predetermined space and a monitoring method using the same. More particularly, provided are a multi sampling port monitoring apparatus capable of effectively monitoring a pollution level in a wide space by including a plurality of sampling ports so that air is sucked at several points in a space to be measured, measuring an average pollution level of the air sucked from the plurality of sampling ports, and allowing pollution levels of the air sucked from the sampling ports to be individually measured in the case in which the average pollution level is out of a predetermined range, and a monitoring method using the same.
    Type: Application
    Filed: October 23, 2014
    Publication date: September 29, 2016
    Applicant: WITHTECH Inc.
    Inventors: Seoung-Kyo Yoo, Eung Sun Lee, Hyun Wook Lee