Patents Assigned to WITHTECH Inc.
  • Patent number: 10060885
    Abstract: Provided is a liquid chromatography apparatus for fast measuring, and more particularly, a liquid chromatography apparatus which includes a first column and a second column having different component separations for an interest component within a sample and makes components primarily separated in the first column be secondarily separated in the second column of a first channel unit before a switching valve is switched, makes the components primarily separated in the first column be continuously discharged through a second channel unit after the switching valve is switched, thereby improving the component separation and achieving the fast measuring.
    Type: Grant
    Filed: July 10, 2014
    Date of Patent: August 28, 2018
    Assignee: WITHTECH INC
    Inventors: Seoung-Kyo Yoo, Eung Sun Lee, Jin Yong Lee, Dae Hee Kim
  • Patent number: 9880077
    Abstract: Provided are a multi sampling port monitoring apparatus for measuring a pollution level in a predetermined space and a monitoring method using the same. More particularly, provided are a multi sampling port monitoring apparatus capable of effectively monitoring a pollution level in a wide space by including a plurality of sampling ports so that air is sucked at several points in a space to be measured, measuring an average pollution level of the air sucked from the plurality of sampling ports, and allowing pollution levels of the air sucked from the sampling ports to be individually measured in the case in which the average pollution level is out of a predetermined range, and a monitoring method using the same.
    Type: Grant
    Filed: October 23, 2014
    Date of Patent: January 30, 2018
    Assignee: WITHTECH INC
    Inventors: Seoung-Kyo Yoo, Eung Sun Lee, Hyun Wook Lee
  • Publication number: 20160282235
    Abstract: Provided are a multi sampling port monitoring apparatus for measuring a pollution level in a predetermined space and a monitoring method using the same. More particularly, provided are a multi sampling port monitoring apparatus capable of effectively monitoring a pollution level in a wide space by including a plurality of sampling ports so that air is sucked at several points in a space to be measured, measuring an average pollution level of the air sucked from the plurality of sampling ports, and allowing pollution levels of the air sucked from the sampling ports to be individually measured in the case in which the average pollution level is out of a predetermined range, and a monitoring method using the same.
    Type: Application
    Filed: October 23, 2014
    Publication date: September 29, 2016
    Applicant: WITHTECH Inc.
    Inventors: Seoung-Kyo Yoo, Eung Sun Lee, Hyun Wook Lee