Abstract: Computing device and method using machine learning to optimize operations of a processing chain of a food factory. The computing device collects data representative of characteristics of a product processed by the processing chain. At least some of the collected data are received from one or more sensor monitoring operations of the processing chain. The computing device determines at least one product characteristic value based on the collected data. The computing device executes the machine learning inference engine, which uses a predictive model for inferring command(s) for controlling processing appliance(s) of the processing chain based on inputs. The inputs comprise the at least one product characteristic value. The computing device transmits the command(s) to the processing appliance(s) of the processing chain. Examples of product characteristic values comprise: a product temperature, a product humidity level, a product geometric characteristic, a product weight, and a product defect measurement.
Abstract: Computing device and method using machine learning to optimize operations of a processing chain of a food factory. The computing device collects data representative of characteristics of a product processed by the processing chain. At least some of the collected data are received from one or more sensor monitoring operations of the processing chain. The computing device determines at least one product characteristic value based on the collected data. The computing device executes the machine learning inference engine, which uses a predictive model for inferring command(s) for controlling processing appliance(s) of the processing chain based on inputs. The inputs comprise the at least one product characteristic value. The computing device transmits the command(s) to the processing appliance(s) of the processing chain. Examples of product characteristic values comprise: a product temperature, a product humidity level, a product geometric characteristic, a product weight, and a product defect measurement.
Abstract: Computing device and method using machine learning to optimize operations of a processing chain of a food factory. The computing device collects data representative of characteristics of a product processed by the processing chain. At least some of the collected data are received from one or more sensor monitoring operations of the processing chain. The computing device determines at least one product characteristic value based on the collected data. The computing device executes the machine learning inference engine, which uses a predictive model for inferring command(s) for controlling processing appliance(s) of the processing chain based on inputs. The inputs comprise the at least one product characteristic value. The computing device transmits the command(s) to the processing appliance(s) of the processing chain. Examples of product characteristic values comprise: a product temperature, a product humidity level, a product geometric characteristic, a product weight, and a product defect measurement.
Abstract: Computing device and method using machine learning to optimize operations of a processing chain of a food factory. The computing device collects data representative of characteristics of a product processed by the processing chain. At least some of the collected data are received from one or more sensor monitoring operations of the processing chain. The computing device determines at least one product characteristic value based on the collected data. The computing device executes the machine learning inference engine, which uses a predictive model for inferring command(s) for controlling processing appliance(s) of the processing chain based on inputs. The inputs comprise the at least one product characteristic value. The computing device transmits the command(s) to the processing appliance(s) of the processing chain. Examples of product characteristic values comprise: a product temperature, a product humidity level, a product geometric characteristic, a product weight, and a product defect measurement.