Abstract: An apparatus and process are described for the characterization and/or identification of suspensions of microparticles based upon the measurement of certain optical observables produced as the suspension is illuminated by a beam of light, or other electromagnetic radiation. Selected observables calculated from the scattered radiation detected by a plurality of detectors surrounding the thus-illuminated suspension are then used to recall specific maps, from a computer memory means, one for each observable. The common overlap region of said map yields characterizing or identifying particle suspension physical parameters.