Abstract: A method of combining height profiles of adjacent sections of a test surface to produce a composite profile of the surface consists of taking successive measurements of adjacent sections of the surface of the test sample by sequentially placing them within the field of view of the instrument and profiling them by phase shifting or vertical scanning. The x-y translation of the microscope between successive measurements from one section to the next adjacent section of the surface being profiled is carried out by overlapping such sections, so that spatial continuity is maintained between measurements. The height data generated for each section are then combined to form a larger image corresponding to the entire surface tested and discontinuities and/or errors introduced by the x-y translation process are corrected by normalizing the overlapping portions to a common reference plane.

Abstract: An optical crossed grating is used to calibrate a conventional autocollimator operated with a single-frequency light source. Since a collimated monochromatic beam is diffracted at a number of well known angles after being reflected from the grating, an array of spots is formed on the detector surface that makes it possible to calibrate the autocollimator in a single operation. Because the angle of the diffracted light is determined only by the spacing in the grid, the calibration accuracy is insensitive to temperature variations and to the position of the grid on the sample stage. The calibration scaling values are calculated simply by measuring the spot spacings on the detector surface in relation to the diffraction angles corresponding to the grid spacing.

Abstract: A method of combining height profiles of adjacent sections of a test surface to produce a composite profile of the surface consists of taking successive measurements of adjacent sections of the surface of the test sample by sequentially placing them within the field of view of the instrument and profiling them by phase shifting or vertical scanning. The x-y translation of the microscope between successive measurements from one section to the next adjacent section of the surface being profiled is carried out by overlapping such sections, so that spatial continuity is maintained between measurements. The height data generated for each section are then combined to form a larger image corresponding to the entire surface tested and discontinuities and/or errors introduced by the x-y translation process are corrected by normalizing the overlapping portions to a common reference plane.

Abstract: Structural components are added to an interferometric objective to offset the effects of temperature variations. The components are mounted between the sleeve housing the optics of the objective and the collar housing the optics of the interferometer. Each component is coupled sequentially, such that the thermal response of the assembly is substantially the linear combination of the response of each component and is designed to cause a shift in the opposite direction to the shift produced by a temperature change in the unmodified device. The thermal characteristics and dimensions of the components are chosen empirically to provide a minimum shift between the reference mirror and focal point in the interferometric objective as a function of temperature.

Abstract: An interchangeable clamp plate is designed to receive and hold a magnetic-head suspension in a predetermined position in a test clamp of a pitch and roll measuring instrument. The clamp plate comprises a support plate for securing the swage mount of the suspension to a predetermined reference plane and a reference surface integrally formed coplanarly with the support plate in a position within the normal operating range of the optics of the instrument. Each kind of suspension being tested is mounted on a clamp plate conforming to its specific geometry that is adapted for installation in the test instrument prior to measurement. As a result of this configuration, once the instrument is calibrated with respect to the reference surface coplanar with the swage mounting surface, measurement accuracy is inherently maintained during testing.

Abstract: A pair of rigid connectors is disposed in frictional arrangement between an optical flat and its supporting cell joined by resilient connectors. The first, axial connector consists of a block anchored to the cell's inner surface and tilted by a spring so that a line contact is established between the block and the flat's peripheral surface. The second, radial connector consists of a flat clip overlapping the gap between the optical flat and the cell, so that surface contacts are established between the clip and the side surfaces of both structures. Another, retaining spring coupling the first and second connectors ensures that such surface contacts are maintained. The frictional forces resulting from these connections prevent the axial and radial movement of the flat with respect to the cell when either component is subjected to vibrations under normal operating conditions.

Abstract: A threaded connection between adjoining male/female surfaces is produced by mating a plastic insert embedded in one surface with threads machined on the other surface. The plastic insert is pressed against the machined threads and deformed to provide conforming meshing threads in the insert, thereby producing a threaded engagement between the two surfaces. Preferably, the insert is sufficiently wide to overlap multiple machined threads and yield a stable, strip-resistant engagement. By providing at least three such inserts evenly distributed around the preexisting threads, an axially stable, screwable threaded connection is produced between the two surfaces that does not require precise machining or special tooling for unconventional threads. Although the inserts are preferably used in the female surface for ease of access, they can be used advantageously in equivalent fashion in the male surface of the screwable threaded connection.

Abstract: A method of operation of a scanning mechanism that produces multiple constant-speed translations within the scanning range of operation. According to one aspect of the invention, when the instrument translates over a region where useful fringes are substantially absent, such as over the steep portion of a step discontinuity, the scanner is quickly accelerated to a higher constant speed and collection of intensity data is stopped until it reaches a new region of observable fringes. The scanner then is quickly decelerated to a slower constant speed and acquisition of intensity data resumes. According to another aspect of the invention, the position of the scanner during the nonlinear transition between regions of different constant speeds is determined by applying a transition factor based on the rate of acceleration (or deceleration) during the transition period.

Abstract: A method for correcting a height map produced by an optical height profiler while scanning a target surface. Regions of bad data are identified and erroneous height values are replaced with provisional height values based selected from neighboring valid height values. Each provisional height value is also assigned a position index corresponding to its proximity to the boundary of the region. Starting from the interior of the region, the technique then replaces each provisional height value with a corrected height value calculated by interpolation of valid height values as a function of distance from the boundary as represented by the position indices. The resulting corrected height map is suitable for on-line visual display.

Abstract: An interferometer mounting mechanism that consists of a horizontal shaft rigidly connected to the interferometer in axial alignment with the optical path of the instrument and protruding through an opening in the center of the transmission flat. A sample stage adapted to receive a computer-drive disk is attached to the distal end of the shaft, so that the stage is directly and rigidly connected to the interferometer. The sample stage consists of a hub capable of retaining a disk in precise alignment with the transmission flat by hanging its center hole on two support posts and resting the disk on three pressure tips on the hub. A system of push-pull adjustment screws is provided to set the proper tip/tilt of the disk.

Abstract: A scanning phase-shifting mechanism comprising reference optics supported by three independent supporting members disposed in fixed triangular relation in a plane substantially normal to the optical axis of the instrument. Two upper members support all of the weight of the optics and provide a preferably horizontal, first axis of rotation for adjustment of the tip of the optics in relation to the optical axis of the instrument. The lower member does not support any of the weight of the optics, providing instead only longitudinal support to cause motion during translation. In addition, in conjunction with at least one of the upper members, the lower member provides a second axis of rotation, preferably orthogonal to the first axis, for adjustment of the tilt of the optics. Each supporting member is rigidly connected to a first end of a cantilevered flexure which is anchored at the other end to a stationary support structure housing the micromotion-translation mechanism of the phase-shifting interferometer.

Abstract: A broad-bandwidth interferometric device is adapted for longitudinal insertion into a cylinder cavity to produce irradiance signals at multiple vertical-scanning positions as a function of optical path differences between a reference mirror incorporated in the probe and the cylinder-wall surface. The light-source beam is passed through an objective lens placed longitudinally in the cylinder and then divided by a beam splitter disposed in fixed relation to the cylinder wall to produce a test beam directed radially to the wall and a reference beam directed axially to a reference mirror disposed in fixed relation to the lens. During scanning, the objective lens and reference mirror are translated together, while the beam splitter remains stationary with respect to the cylinder wall, thereby varying the position of the focal point of the test beam and providing the vertical-scanning effect required to produce interference fringes and a corresponding map of the tested cylinder surface.

Abstract: A broad-bandwidth interferometric system that produces irradiance signals at multiple vertical-scanning positions as a function of optical path differences between a test and a reference surface. The effective peak of the envelope defined by the modulation component of the irradiance signal is estimated by finding the scanning position corresponding to the centroid of a function substantially equal to the square of the first-order derivative of the measured irradiance. The surface height at each pixel is determined directly from digital irradiance signals, thereby greatly reducing the data-processing steps and associated costs taught by the prior art and correspondingly simplifying the hardware requirements of the system for rapid on-line display of height measurements. The approach is free of the ambiguities inherent in multi-peak modulation functions, thereby producing surface maps with reduced artifacts.

Abstract: An improvement to phase-shifting interferometry that consists of the addition of a pupil mask with two parallel slits and a polarizer in the optical path of a conventional phase-shifting interferometer. The pupil-mask/polarizer combination is adapted to produce a linearly polarized wavefront of light reaching the sample surface at a predetermined angle of incidence, thereby producing a corresponding phase shift on reflection. The relative orientation of the mask and polarizer can be changed to take measurements with the polarizer parallel or perpendicular to the mask slits, in each case producing a phase shift on reflection related to the test sample's refractive index and extinction coefficient. Four phase-shifting measurements conducted at .pi./2 intervals for each polarization axis yield sufficient interferometric information to map n, k and the height profile of the sample surface.

Abstract: The film thickness and surface profile of a test sample consisting of optically dissimilar regions are measured by phase-shifting interferometry. Conventional phase-shifting interferometry at a given wavelength is performed to measure the step height between two regions of the surface. The theoretical measured step height as a function of the film thickness is then calculated. A set of possible solutions corresponding to the experimentally measured-height are found numerically or graphically by searching the theoretically generated function at the measured height. If more than one solution exists, the phase-shifting procedure is repeated at a different wavelength and a new theoretical measured-height as a function of the film thickness is calculated for the optical parameters of the materials at the new wavelength, yielding another set of possible solutions that correspond to the newly measured height. The number of repetitions of the procedure depends on the number of unknowns of the test sample.

Abstract: A method and apparatus for measuring an absolute profile of a flat using an interferometer system that includes an interferometer adapted to support two flats, a detection system, and a computer adapted to compute the OPD (optical path difference) between surface of the two flats, wherein a first flat A! having a first surface and a second flat B! having a second surface are supported in the interferometer, with the second surface facing the first surface. The interferometer system measures the OPDs between the first and second surfaces for each pixel. The first flat A! then is rotated by a number of predetermined angles relative to its initial position and each time the OPDs are measured. The first flat A! is rotated to its initial position or 180.degree. therefrom. A third flat C! having a third surface is substituted for the second flat. The OPDs between the first and third surfaces are measured.

Abstract: A scanning microscope wherein the probe operates at all times in alignment with the piezoelectric element providing the scanning motion. A sample is slidably connected to the piezoelectric element and the target area on the sample is positioned substantially coaxially with the probe and the scanning element prior to commencement of the scanning operation. A particular embodiment of a sample positioner is provided that eliminates any interference by the positioner with the sample during scanning.

Abstract: Interferometric apparatus that combines white-light VSI and single-wavelength PSI capabilities to improve the accuracy of height measurements in steep regions and in areas with large inter-pixel steps on the test surface. The technique consists of performing VSI measurements to obtain a relatively coarse profile of the test surface and to identify regions separated by a large step. Then PSI measurements are carried out over the test surface to obtain a relatively fine profile. Offsets between VSI and PSI measurements are calculated to correct for misalignments and phase shifts that may have occurred between the two sets of measurements. Finally, the fine PSI data are integrated to within one quarter wavelength of the coarse VSI data. The resulting quality of the height data in each of the step regions is thus improved to within the resolution of the PSI measurements.

Abstract: Fizeau interferometer that utilizes a multimode laser as a light source for testing transparent thin-plate samples. As a result of multimode linear laser operation, interference fringes are obtained only when the optical path difference between the reference surface and test surface is equal to twice a multiple of the laser's effective cavity length. By judicially selecting the multimode spectrum of operation and the effective cavity length of the laser, the interferometer may be calibrated to produce interference fringes at a workable separation between the reference and test surfaces without ghost interference fringes from the far surface of the thin-plate sample. Another embodiment of the invention alternatively utilizes two linear lasers with different effective cavity lengths to eliminate ghost interference fringes when the optical thickness of the thin-plate is equal to a multiple of one laser's effective cavity length.

Abstract: A scanning interferometer that utilizes a DC gear motor instead of a PZT translator in closed-loop configuration with an LVTD position sensor. The DC motor is connected to the scanning mechanism so that a rotational motion of the motor shaft produces a translation along the optical axis of either the sample or the objective of the interferometer. During scanning, the motor is driven by the input of a ramp signal into the system. The closed-loop configuration is such that a constant, or nearly constant voltage is applied to the DC motor to produce a constant-speed scan in response to the ramp input. Any non-linearity in the speed of motion is corrected by an adjustment to the motor voltage. At the completion of the scan, the ramp input is removed and the motor is automatically returned to the starting position to satisfy the closed-loop condition.