Patents Assigned to X-Ray Optical System, Inc.
  • Patent number: 7515684
    Abstract: A method and apparatus for analyzing fluids by means of x-ray fluorescence. The method and apparatus are applicable to any fluid, including liquids and gases, having at least one component that emits x-ray fluorescence when exposed to x-rays. The apparatus includes an x-ray source (82) including an x-ray tube (64) having improved heat dissipating properties due to the thermal coupling of the x-ray tube with a thermally-conductive, dielectric material (70, 1150). The x-ray tube also includes means for aligning (100, 2150, 2715) the x-ray tube with the x-ray source housing whereby the orientation of the x-ray beam produced by the x-ray source can be optimized, and stabilized various over operating conditions. The method and apparatus may also include an x-ray detector having a small-area, for example, a PIN-diode type semiconductor x-ray detector (120), that can provide effective x-ray detection at room temperature.
    Type: Grant
    Filed: June 1, 2004
    Date of Patent: April 7, 2009
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: David M. Gibson, John H. Burdett, Jr., Ian Radley
  • Publication number: 20080159479
    Abstract: An x-ray diffraction technique (apparatus, method and program products) for measuring crystal structure from a large sample area. The measurements are carried out using a large size collimating optic (up to 25 mm or more in diameter or corresponding cross-section) along with a 2-dimensional x-ray image detector. The unique characteristics of polycapillary collimating optics enable an efficient x-ray diffraction system (either low power or high power) to measure a large portion (or even the whole sample surface area) of the sample to obtain critical crystal structure information, such as the orientation of the whole sample, defects in the crystal, the presence of a secondary crystal, etc. Real-time, visual monitoring of the detected diffraction patterns is also provided. Turbine blade crystal structure measurement examples are disclosed.
    Type: Application
    Filed: August 10, 2007
    Publication date: July 3, 2008
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Huapeng HUANG, Walter M. Gibson
  • Patent number: 7382856
    Abstract: An x-ray source assembly and method of operation are provided having enhanced output stability. The assembly includes an anode having a source spot upon which electrons impinge and a control system for controlling position of the anode source spot relative to an output structure. The control system can maintain the anode source spot location relative to the output structure notwithstanding a change in one or more operating conditions of the x-ray source assembly. One aspect of the disclosed invention is most amenable to the analysis of sulfur in petroleum-based fuels.
    Type: Grant
    Filed: February 8, 2007
    Date of Patent: June 3, 2008
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Ian Radley, Thomas J. Bievenue, John H. Burdett, Brian W. Gallagher, Stuart M. Shakshober, Zewu Chen, Michael D. Moore
  • Publication number: 20080117511
    Abstract: A diffracting x-ray optic for accepting and redirecting x-rays. The optic includes at least two layers, the layers having a similar or differing material composition and similar or differing crystalline orientation. Each of the layers exhibits a diffractive effect, and their collective effect provides a diffractive effect on the received x-rays. In one embodiment, the layers are silicon, and are bonded together using a silicon-on-insulator bonding technique. In another embodiment, an adhesive bonding technique may be used. The optic may be a curved, monochromating optic.
    Type: Application
    Filed: November 16, 2007
    Publication date: May 22, 2008
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventor: Zewu CHEN
  • Patent number: 7298817
    Abstract: An x-ray fluorescence technique for detecting the level of arsenic in a sample of water or body fluid. Arsenic and lead are expected to fluoresce in a first energy band and lead is expected to also fluoresce separately in a second energy band. An excitation path directs x-rays toward the sample; a first detection path detects x-ray fluorescence of the first energy band from the sample; and a second detection path detects x-ray fluorescence of the second energy band from the sample. The level of arsenic can be obtained by analyzing the x-ray fluorescence from both detection paths, and using a constant which relates the level of lead in the second energy band to the level of lead in the first energy band. The excitation path and each detection path may each include a monochromating optic to transmit the desired x-ray energy band, e.g., a doubly curved optic.
    Type: Grant
    Filed: November 30, 2004
    Date of Patent: November 20, 2007
    Assignee: X-ray Optical Systems, Inc.
    Inventors: Zewu Chen, Walter M. Gibson
  • Patent number: 7277527
    Abstract: A technique is disclosed for presenting a sample to a radiation interface of an analysis engine employing x-ray, neutron ray, gamma ray or particle-beam radiation to analyze the sample. A protective barrier, transparent to the radiation, and separating the sample from the engine, is moveable relative to the radiation interface, using a barrier movement system. The barrier in one embodiment is a film movable over a cavity in which the sample placed, and moveable with a system of reels to provide and retrieve a generally continuous supply of film over the cavity. The cavity may form a portion of a sample path through which the sample is moveable. If the sample path is pressurized, the film maintains the pressure during analysis of the sample by the analysis engine.
    Type: Grant
    Filed: December 15, 2005
    Date of Patent: October 2, 2007
    Assignee: X-Ray Optical Systems, Inc.
    Inventor: Brian Gallagher
  • Patent number: 7257193
    Abstract: An x-ray source assembly includes an anode having a spot upon which electrons impinge based on power level supplied to the assembly, and an optic coupled to receive divergent x-rays generated at the spot and transmit output x-rays from the assembly. A control system is provided for maintaining intensity of the output x-rays dynamically during operation of the x-ray source assembly, notwithstanding a change in at least one operating condition of the x-ray source assembly, by changing the power level supplied to the assembly. The control system may include at least one actuator for effecting the change in the power level supplied to the assembly, by, e.g., controlling a power supply associated with the assembly. The control system may also change the temperature and/or the position of the anode to maintain the output intensity.
    Type: Grant
    Filed: February 3, 2006
    Date of Patent: August 14, 2007
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Ian Radley, Michael D. Moore, Mark Fitzgerald
  • Publication number: 20070140420
    Abstract: An x-ray source assembly and method of operation are provided having enhanced output stability. The assembly includes an anode having a source spot upon which electrons impinge and a control system for controlling position of the anode source spot relative to an output structure. The control system can maintain the anode source spot location relative to the output structure notwithstanding a change in one or more operating conditions of the x-ray source assembly. One aspect of the disclosed invention is most amenable to the analysis of sulfur in petroleum-based fuels.
    Type: Application
    Filed: February 8, 2007
    Publication date: June 21, 2007
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Ian Radley, Thomas Bievenue, John Burdett, Brian Gallagher, Stuart Shakshober, Zewu Chen, Michael Moore
  • Patent number: 7209545
    Abstract: An x-ray source assembly (2700) and method of operation are provided having enhanced output stability. The assembly includes an anode (2125) having a source spot upon which electrons (2120) impinge and a control system (2715/2720) for controlling position of the anode source spot relative to an output structure. The control system can maintain the anode source spot location relative to the output structure (2710) notwithstanding a change in one or more operating conditions of the x-ray source assembly. One aspect of the disclosed invention is most amenable to the analysis of sulfur in petroleum-based fuels.
    Type: Grant
    Filed: June 3, 2004
    Date of Patent: April 24, 2007
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Ian Radley, Thomas J. Bievenue, John H. Burdett, Jr., Brian W. Gallagher, Stuart M. Shakshober, Zewu Chen, Michael D. Moore
  • Patent number: 7206375
    Abstract: Compact, low-power-consuming systems and methods for exposing samples to high-energy radiation, for example, for exposing samples to x-rays for implementing x-ray absorption near edge analysis (XANES). The systems and methods include a low-power-consuming radiation source, such as an x-ray tube; one or more tunable crystal optics for directing and varying the energy of the radiation onto a sample under analysis; and a radiation detecting device, such as an x-ray detector, for detecting radiation emitted by the sample. The one or more tunable crystal optics may be doubly-curved crystal optics. The components of the system may be arranged in a collinear fashion. The disclosed systems and methods are particularly applicable to XANES analysis, for example, XANES analysis of the chemical state of chromium or another transition metal in biological processes.
    Type: Grant
    Filed: December 1, 2005
    Date of Patent: April 17, 2007
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, Walter Gibson
  • Patent number: 7110506
    Abstract: A method and device for cooling and electrically-insulating a high-voltage, heat-generating component, for example, an x-ray tube (1105) for analyzing fluids by means of x-ray fluorescence. The device includes an x-ray source (1100) including an x-ray tube (1105) having improved heat-dissipating properties due to the thermal coupling of the x-ray tube with a thermally-conductive, dielectric material (1150). The device may include a base assembly (1135) mounted to the component for conducting heat away from the component while electrically isolating the component. In one aspect of the invention, the base assembly includes two copper plates (1140, 1145) separated by a dielectric plate (1150). The dielectric plate minimizes or prevents the leakage of current through the base assembly (1135). One aspect of the disclosed invention is most amenable to the analysis of sulfur in petroleum-based fuels.
    Type: Grant
    Filed: June 3, 2004
    Date of Patent: September 19, 2006
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Ian Radley, Thomas J. Bievenue, John H. Burdett, Jr., Brian W. Gallagher, Stuart M. Shakshober, Zewu Chen
  • Patent number: 7104690
    Abstract: A diagnostic technique for an x-ray source. A system monitors existing conditions (e.g., tube current Y) in the source to track degradation of certain components to anticipate failure. Storage of past characteristics and reference characteristics is also provided for predicting failure and other operating conditions of the source. Communication techniques are provided for the monitoring and warning functions.
    Type: Grant
    Filed: January 25, 2005
    Date of Patent: September 12, 2006
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Ian Radley, Michael D. Moore
  • Publication number: 20060193440
    Abstract: A method and device for cooling and electrically-insulating a high-voltage, heat-generating component, for example, an x-ray tube (1105) for analyzing fluids by means of x-ray fluorescence. The device includes an x-ray source (1100) including an x-ray tube (1105) having improved heat-dissipating properties due to the thermal coupling of the x-ray tube with a thermally-conductive, dielectric material (1150). The device may include a base assembly (1135) mounted to the component for conducting heat away from the component while electrically isolating the component. In one aspect of the invention, the base assembly includes two copper plates (1140, 1145) separated by a dielectric plate (1150). The dielectric plate minimizes or prevents the leakage of current through the base assembly (1135). One aspect of the disclosed invention is most amenable to the analysis of sulfur in petroleum-based fuels.
    Type: Application
    Filed: April 14, 2006
    Publication date: August 31, 2006
    Applicant: X-Ray Optical Systems, Inc.
    Inventors: Ian Radley, Thomas Bievenue, John Burdett, Brian Gallagher, Stuart Shakshober, Zewu Chen
  • Publication number: 20060193438
    Abstract: An x-ray source assembly includes an anode having a spot upon which electrons impinge based on power level supplied to the assembly, and an optic coupled to receive divergent x-rays generated at the spot and transmit output x-rays from the assembly. A control system is provided for maintaining intensity of the output x-rays dynamically during operation of the x-ray source assembly, notwithstanding a change in at least one operating condition of the x-ray source assembly, by changing the power level supplied to the assembly. The control system may include at least one actuator for effecting the change in the power level supplied to the assembly, by, e.g., controlling a power supply associated with the assembly. The control system may also change the temperature and/or the position of the anode to maintain the output intensity.
    Type: Application
    Filed: February 3, 2006
    Publication date: August 31, 2006
    Applicant: X-Ray Optical Systems, Inc.
    Inventors: Ian Radley, Michael Moore, Mark Fitzgerald
  • Patent number: 7092843
    Abstract: A measurement and processing technique enabling x-ray analysis systems to handle dynamically changing samples and other conditions resulting in both significant and insignificant measurement changes. A stream of input values related to measured compositional information of the sample is received, and a stream of output compositional values is produced. The current output value y[n] is set as a function of the received input value x[n] if the received input value x[n] differs from x[n?1] by more than an intensity-dependent deviation limit; and alternatively the current output y[n] is set as a function of the previous output y[n?1] and the received input value x[n] if the received input value x[n] differs from x[n?1] by less than the intensity-dependent deviation limit. The intensity-dependent deviation limit is maintained as a function of the intensity of the measured compositional information.
    Type: Grant
    Filed: October 21, 2004
    Date of Patent: August 15, 2006
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Michael D. Moore, John H. Burdett, Jr., Ian Radley, Stuart M. Shakshober
  • Patent number: 7072439
    Abstract: A technique for analyzing fluids by means of x-ray fluorescence applicable to any fluid, including liquids and gases, which emit x-ray fluorescence when exposed to x-rays. The apparatus includes an x-ray source (82) including an x-ray tube (64) having improved heat dissipating properties due to a thermally-conductive, dielectric material (70, 1150). The x-ray tube also includes means for aligning (100, 2150, 2715) the tube with the source housing whereby the orientation of the x-ray beam produced by the source can be optimized, and stabilized over various operating conditions. The method and apparatus may also include an x-ray detector having a small-area, for example, a PIN-diode type semiconductor x-ray detector (120), that can provide effective x-ray detection at room temperature. One aspect of the disclosed invention is most amenable to the analysis of sulfur in petroleum-based fuels.
    Type: Grant
    Filed: June 1, 2004
    Date of Patent: July 4, 2006
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Ian Radley, Thomas J. Bievenue, John H. Burdett, Jr., Brian W. Gallagher, Stuart M. Shakshober, Zewu Chen, Michael D. Moore
  • Publication number: 20060140343
    Abstract: An x-ray diffraction technique for measuring a known characteristic of a sample of a material in an in-situ state. The technique includes using an x-ray source for emitting substantially divergent x-ray radiation—with a collimating optic disposed with respect to the fixed source for producing a substantially parallel beam of x-ray radiation by receiving and redirecting the divergent paths of the divergent x-ray radiation. A first x-ray detector collects radiation diffracted from the sample; wherein the source and detector are fixed, during operation thereof, in position relative to each other and in at least one dimension relative to the sample according to a-priori knowledge about the known characteristic of the sample. A second x-ray detector may be fixed relative to the first x-ray detector according to the a-priori knowledge about the known characteristic of the sample, especially in a phase monitoring embodiment of the present invention.
    Type: Application
    Filed: February 3, 2006
    Publication date: June 29, 2006
    Applicant: X-Ray Optical Systems, Inc.
    Inventors: David Gibson, Walter Gibson, Huapeng Huang
  • Publication number: 20060120508
    Abstract: Compact, low-power-consuming systems and methods for exposing samples to high-energy radiation, for example, for exposing samples to x-rays for implementing x-ray absorption near edge analysis (XANES). The systems and methods include a low-power-consuming radiation source, such as an x-ray tube; one or more tunable crystal optics for directing and varying the energy of the radiation onto a sample under analysis; and a radiation detecting device, such as an x-ray detector, for detecting radiation emitted by the sample. The one or more tunable crystal optics may be doubly-curved crystal optics. The components of the system may be arranged in a collinear fashion. The disclosed systems and methods are particularly applicable to XANES analysis, for example, XANES analysis of the chemical state of chromium or another transition metal in biological processes.
    Type: Application
    Filed: December 1, 2005
    Publication date: June 8, 2006
    Applicant: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, Walter Gibson
  • Publication number: 20060093086
    Abstract: A technique is disclosed for presenting a sample to a radiation interface of an analysis engine employing x-ray, neutron ray, gamma ray or particle-beam radiation to analyze the sample. A protective barrier, transparent to the radiation, and separating the sample from the engine, is moveable relative to the radiation interface, using a barrier movement system. The barrier in one embodiment is a film movable over a cavity in which the sample placed, and moveable with a system of reels to provide and retrieve a generally continuous supply of film over the cavity. The cavity may form a portion of a sample path through which the sample is moveable. If the sample path is pressurized, the film maintains the pressure during analysis of the sample by the analysis engine.
    Type: Application
    Filed: December 15, 2005
    Publication date: May 4, 2006
    Applicant: X-Ray Optical Systems, Inc.
    Inventor: Brian Gallagher
  • Patent number: 7035374
    Abstract: Devices for improving the capturing and utilization of high-energy electromagnetic radiation, for example, x-rays, gamma rays, and neutrons, for use in physical, medical, and industrial analysis and control applications are disclosed. The devices include optics having a plurality of optical crystals, for example, doubly-curved silicon or germanium crystals, arranged to optimize the capture and redirection of divergent radiation via Bragg diffraction. In one aspect, a plurality of optic crystals having varying atomic diffraction plane orientations are used to capture and focus divergent x-rays upon a target. In another aspect, a two- or three-dimensional matrix of crystals is positioned relative to an x-ray source to capture and focus divergent x-rays in three dimensions.
    Type: Grant
    Filed: February 1, 2005
    Date of Patent: April 25, 2006
    Assignee: X-Ray Optical Systems, Inc.
    Inventor: Zewu Chen